1- gel beads coated with a ruc13 coatings, magdalena parlinska, university of rzeszow, poland Weathered Rock, FEI Courtesy: Images Sperm Tails, FEI Courtesy: Images
PAN Microfibers, FEI Courtesy: Images Bacteriophage T4 Virus, FEI Courtesy: Images 2- diatom, magdalena parlinska, university of rzeszow, poland
energy filtered tem micrograph of yttria (in green) - zirconia (in red) multilayers, chanchal ghosh, igcar, kalpakkam, india Offretite Scagno, TESCAN 1- cvd grown diamond film, magdalena parlinska, university of rzeszow, poland
orchid root stained with acridine orange, s. r. senthilkumar, st. josephs college, india orchid root with mycorrhiza, s. r. senthilkumar, st. josephs college, india Powder metallurgy substrate, TESCAN
2- gel beads coated with a ruc13 coatings, magdalena parlinska, university of rzeszow, poland orchid root showing with idioblastic cells, s. r. senthilkumar, st. josephs college, india Calcium Sulfate Crystals, FEI Courtesy: Images
2- cvd grown diamond film, magdalena parlinska, university of rzeszow, poland Alveoli, FEI Courtesy: Images collagen fibers in cartilage, e. i. romijn, ntnu, trondheim



Abstract title and authors
IMC-PL-6095 Light Microscopy at the Nanoscale (PDF, HTML)
Cremer C.1,2
1Superresolution Microscopy, Institute of Molecular Biology (IMB), Mainz, Germany, 2Kirchhoff Institute of Physics (KIP), and Institute of Pharmacy&Molecular Biotechnology (IPMB) University Heidelberg, Heidelberg, Germany

IMC-PL-6096 Bioimaging at the nanoscale -- Single-molecule and super-resolution fluorescence microscopy (PDF, HTML)
Zhuang X.1
1Department of Chemistry and Chemical Biology, Department of Physics, Howard Hughes Medical Institute, Harvard University, Cambridge

IMC-PL-6097 Imaging and Spectroscopy of Individual Atoms in Nanostructured Materials (PDF, HTML)
Suenaga K.1
1National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan

IMC-PL-6098 Electron Tomography for Nanoscale Materials Science (PDF, HTML)
Midgley P.1
1Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK

IFSM-PL-1670 From Atomic Structure to Properties of Oxides: Applications of Aberration-corrected Transmission Electron Microscopy (PDF, HTML)
Jia C. L.1,2
1Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Jülich, Germany, 2International Centre for Dielectric Research, Xi'an Jiaotong University, Xi'an, China

IFSM-PL-1780 Some surprises in electron diffraction physics and imaging. (PDF, HTML)
Spence J. C.1
1Physics Department, ASU, Tempe , Az. USA. 85282, and LBNL USA.

IFSM-PL-6099 Macromolecules in Motion: Visualization by 4-Dimensional Cryo-Em (PDF, HTML)
Steven A. C.1
1Laboratory of Structural Biology Research, National Institute of Arthritis and Musculoskeletal and Skin Diseases, National Institutes of Health, Bethesda, USA

IFSM-PL-6100 From the Prague Spring to a Spring in Electron Microscopy (PDF, HTML)
Křivánek O. L.1
1Nion Co., Kirkland and Dept of Physics, ASU, Tempe, USA

IT-1-IN-2012 Advances in electron vortex experiments in the TEM (PDF, HTML)
Verbeeck J.1, Béché A.1, Clark L.1, Guzzinati G.1, Juchtmans R.1, Van Boxem R.1, Van Tendeloo G.1
1EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium

IT-1-IN-2597 Electron Optics for High-brightness High-beam-current Column Design --- extracting micro-amperes from point cathodes --- (PDF, HTML)
Fujita S.1, Takebe M.1, Wells T.2, El-Gomati M. M.3, Shimoyama H.4
1SHIMADZU Corporation, Kyoto, Japan, 2York Probe Sources Ltd., York, United Kingdom, 3University of York, York, United Kingdom, 4Meijo University, Nagoya, Japan

IT-1-O-1664 Magnetic-Field-Superimposed Cold Field Emission Gun for 1.2-MV Transmission Electron Microscope (PDF, HTML)
Kasuya K.1, Kawasaki T.1, Moriya N.1, Arai M.1, Furutsu T.1
1Central Research Laboratory, Hitachi, Ltd., Akanuma 2520, Hatoyama, Saitama, 350-0395, Japan

IT-1-O-1982 Challenges in Phase Plate Development and Applications (PDF, HTML)
Sader K.1, Buijsse B.1, van Duinen G.1, Danev R.2
1FEI, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands, 2Max Planck Institute of Biochemistry, Am Klopferspitz 18, 82152 Martinsried, Germany

IT-1-O-2071 Sculpturing the electron wave function using nanoscale phase masks (PDF, HTML)
Shiloh R.1, Lereah Y.1, Lilach Y.1, Arie A.1
1Department of Physical Electronics, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel

IT-1-O-2914 Tuning and Operation of a sub-20 meV Monochromator (PDF, HTML)
Dellby N.1, Lovejoy T. C.1, Křivánek L. O.1
1Nion Co., 1102 Eighth St., Kirkland, WA 98033, USA

IT-1-P-1486 Magnetic monopole like fields and electron vortices (PDF, HTML)
Béché A.1, Van Boxem R.1, Van Tendeloo G.1, Verbeeck J.1
1EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium

IT-1-P-1500 Measuring the Orbital Angular Momentum of Electron Vortex Beams in the TEM (PDF, HTML)
Guzzinati G.1, Clark L.1, Béché A.1, Verbeeck J.1
1EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium

IT-1-P-1541 Investigation of physical and chemical method to produce Möllenstedt electrostatic biprism for off-axis electron holography experiment (PDF, HTML)
Cours R.1, Houdellier F.1
1CEMES-CNRS, Université de Toulouse, 29 Rue Jeanne Marvig, 31055 TOULOUSE FRANCE EU

IT-1-P-1672 Development of illumination system of a 1.2 MV Field Emission Transmission Electron Microscope (PDF, HTML)
Kawasaki T.1, Kasuya K.1, Furutsu T.1, Ono S.1, Arai M.1, Moriya N.1
1Central Research Laboratory, Hitachi, Ltd., Hatoyama 2520,Saitama 350-03, Japan

IT-1-P-1693 Measurement of current density distribution in shaped e-beam writers (PDF, HTML)
Horáček M.1, Bok J.1, Kolařík V.1, Urbánek M.1, Matějka M.1, Krátký S.1
1Institute of Scientific Instruments AS CR, v.v.i., Brno, Czech Republic

IT-1-P-1958 Quantitative measurement of the OAM spectra of electron vortex beams. (PDF, HTML)
Clark L.1, Béché A.1, Guzzinati G.1, Verbeeck J.1
1EMAT, University of Antwerp, Antwerp, Belgium

IT-1-P-1961 Development of Phase Contrast Scanning Transmission Electron Microscopy (PDF, HTML)
Iijima H.1, Minoda M.2, Tamai T.2, Kondo Y.1, Hosokawa F.1
1EM Business Unit, JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan, 2Department of Applied Physics, Tokyo University of Agriculture and Technology, 2-24-16 Nakacho, Koganei, Tokyo 184-8588, Japan

IT-1-P-2090 Contrast enhancement of phase objects by using Phase Contrast Scanning Transmission Electron Microscopy (PDF, HTML)
Minoda H.1, Tamai T.1, Iijima H.2, Hosokawa F.2, Kondo Y.2
1Department of Applied Physics, Tokyo University of Agriculture and Technology, 2EM Business Unit, JEOL Ltd

IT-1-P-2198 The effect of Detector Thickness on Direct Detector Performance (PDF, HTML)
Clough R. N.1, Moldovan G.2, Kim J. S.1, Kirkland A. I.1
1Department of Materials, University of Oxford, UK, 2Oxford Instruments NanoAnalysis, High Wycombe, UK

IT-1-P-2263 Maximising Phase Contrast in Aberration-corrected STEM using Pixelated Detectors (PDF, HTML)
Yang H.1, Pennycook T. J.1,2, Nellist P. D.1,2
1University of Oxford, Department of Materials. Parks Rd, Oxford, OX1 3PH, UK, 2EPSRC SuperSTEM Facility, Daresbury Laboratory, WA4 4AD, UK

IT-1-P-2325 AC- Voltage Operated Schottky Electron Source (PDF, HTML)
Yada K.1, Saito Y.1
1Daiwa Techno Systems Co.,Ltd

IT-1-P-2346 Effects of dielectric substrate on localized surface plasmon in a silver nano-particle (PDF, HTML)
Fujiyoshi Y.1, Nemoto T.1, Kurata H.1
1Institute for Chemical Research, Kyoto University, Kyoto, Japan

IT-1-P-2410 Thermal Emission Properties of GdB6 Cathode (PDF, HTML)
Saito Y.1, Yamagishi K.1, Yada K.1
1Daiwa Techno Systems Co.,Ltd.

IT-1-P-2469 Electron differential phase microscopy with an A-B effect phase plate (PDF, HTML)
Tanji T.1, Ikeda U.2, Niimi H.2, Usukura J.1
1EcoTopia Science Institute, Nagoya University, Nagoya, Japan 1, 2Graduate School of Nagoya University, Nagoya, Japan 2

IT-1-P-2476 Effect of a phase plate on TEM imaging (PDF, HTML)
Edgcombe C. J.1
1TFM Group, Dept of Physics, University of Cambridge

IT-1-P-2510 Toward electron polarizators (PDF, HTML)
Grillo V.1,2, Karimi E.3, Balboni R.4, Gazzadi G. C.1, Frabboni S.1,5, Mafakheri E.1,5, Tang W. X.6,7, Boyd R. W.3,8
1CNR-Istituto Nanoscienze, Centro S3, Via G Campi 213/a, I-41125 Modena, Italy, 2CNR-IMEM, Parco delle Scienze 37a, I-43100 Parma, Italy. , 3Department of Physics, University of Ottawa, 150 Louis Pasteur, Ottawa, Ontario K1N 6N5, Canada, 4CNR-IMM Bologna, Via P. Gobetti 101, 40129 Bologna, Italy, 5Dipartimento FIM, Universitá di Modena e Reggio Emilia, Via G. Campi 213/a, 41125 Modena, Italy, 6College of Materials Science and Engineering, Chongqing, 400044, China, 7School of Physics, Monash University, Clayton, VIC, 3800, Australia, 8Institute of Optics, University of Rochester, Rochester, New York 14627, USA

IT-1-P-2578 Design of a monochromator for aberration-corrected low-voltage (S)TEM (PDF, HTML)
Mukai M.1, Omoto K.1, Sasaki T.1, Kohno Y.1, Morishita S.1, Kimura A.1, Ikeda A.1, Somehara K.1, Sawada H.1, Kimoto K.2, Suenaga K.3
1JEOL Ltd., Akishima, Tokyo, Japan, 2National Institute for Material Science (NIMS), Tsukuba, Ibaraki, Japan, 3National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan

IT-1-P-2604 Holographic generation of Electron quasi-Bessel beams (PDF, HTML)
Frabboni S.1,2, Grillo V.2,3, Karimi E.4, Balboni R.5, Gazzadi G. C.2, Mafakheri E.1,2, Boyd R. W.4,6
1Dipartimento FIM, Università di Modena e Reggio Emilia, Via G. Campi 213/A, 41125 Modena, Italy , 2CNR-Istituto Nanoscienze, Centro S3, Via G Campi 213/a, I-41125 Modena, Italy, 3CNR-IMEM, Parco delle Scienze 37a, I-43100 Parma, Italy. , 4Department of Physics, University of Ottawa, 150 Louis Pasteur, Ottawa, Ontario K1N 6N5, Canada, 5CNR-IMM Bologna, Via P. Gobetti 101, 40129 Bologna, Italy, 6Institute of Optics, University of Rochester, Rochester, New York 14627, USA

IT-1-P-2685 Low Voltage Mini TEM (PDF, HTML)
Coufalová E.1, Mynář M.1, Štěpán P.1, Drštička M.1, Sintorn I. M.2, 3
1DELONG INSTRUMENTS a.s., Brno, Czech Republic, 2Centre for Image Analysis, Uppsala University, Sweden, 3Vironova AB, Stockholm, Sweden

IT-1-P-2688 Energy analyzer for point electron sources (PDF, HTML)
Kolařík V.1, Coufalová E.1, Mynář M.1, Drštička M.1
1DELONG INSTRUMENTS a.s., Brno, Czech Republic

IT-1-P-2710 Spiral phase plates for electron vortices (PDF, HTML)
Béché A.1, Winkler R.2, Planck H.3, Hofer F.3, Verbeeck J.1
1EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium, 2Center for Electron Microscopy, Steyrergasse 17, 8010 Graz, Austria, 3Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria

IT-1-P-2835 Projector lens and CCD camera distortions in a Hitachi HF-3300 TEM (PDF, HTML)
Denneulin T.1, Gatel C.1, Houdellier F.1, Hÿtch M. J.1
1CEMES CNRS, 29 rue Jeanne Marvig, 31055 Toulouse, France.

IT-1-P-2975 Design and Characterization of a Single-Atom Electron Column (PDF, HTML)
Lin C. Y.1,2, Chang W. T.1, Hsu W. H.1,3, Lai W. C.1,2, Chen Y. S.1, Hwang I. S.1
1Institute of Physics, Academia Sinica, Taipei, Taiwan, 2Department of Physics, National Taiwan University, Taipei, Taiwan , 3Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan

IT-1-P-2984 Wire corrector for aberration corrected electron optics (PDF, HTML)
Nishi R.1, Ito H.2, Hoque S.2
1Osaka University, Osaka, Japan, 2Hitachi High-Technologies Corporation, Ibaraki, Japan

IT-1-P-3022 Measuring the Orbital Angular Momentum of Electron Vortex Beams by Forked Grating (PDF, HTML)
Saitoh K.1, Hasegawa Y.2, Hirakawa K.2, Tanaka N.1, Uchida M.3
1EcoTopia Science Institute, Nagoya University, 2Department of Crystalline Materials Science, Nagoya University, 3Advanced Science Research Laboratory, Saitama Institute of Technology

IT-1-P-3222 Contrast enhancement in TEM imaging by use of a central beam stop (PDF, HTML)
Zandbergen H.1, Xu Q.1
1Kavli Institute of Nanoscience, Delft University of Technology, Delft, The Netherlands

IT-1-P-6004 Determinationof geometrical form factor of emitter from Schottky plot (PDF, HTML)
Emura Y.1, Murata H.1, Rokuta E.1, Shimoyama H.1, Yasuda H.2, Haraguchi T.2
1Faculty of Science and Technology, Meijo University, 2PARAM Corporation

IT-1-P-6020 Design and realisation of variable C shaped structured illumination (PDF, HTML)
Mousley M.1, Thirunavukkarasu G.1, Babiker M.1, Yuan J.1
1Department of Physics, University of York, Heslington, York, YO10 5DD, United Kingdom

IT-2-IN-2458 Advanced scanning transmission electron microscopy with segmented annular all field detector (PDF, HTML)
Shibata N.1,2
1The University of Tokyo, 2JST-PRESTO

IT-2-IN-2576 Insights into Materials Properties with Quantitative STEM and EELS (PDF, HTML)
Botton G. A.1, Bellido E. P.1, Bugnet M.1, Dudeck K. J.1, Gauquelin N.1, Liu H.1, Prabhudev S.1, Rossouw D.1, Scullion A.1, Stambula S.1, Woo S. Y.1, Zhu G. Z.1
1Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada

IT-2-IN-2893 Extending the capabilities of high-resolution STEM:measuring depth dependent strain using optical sectioning and aberration-free phase contrast imaging of low-Z materials (PDF, HTML)
Nellist P. D.1,2, Yang H.1, Lozano J. G.1, Hirsch P. B.1, Pennycook T. J.1,2
1Department of Materials, University of Oxford, UK, 2SuperSTEM Laboratory, Daresbury, UK

IT-2-O-1555 Imaging of light elements by annular dark-field Cs-corrected STEM (PDF, HTML)
Lotnyk A.1, Poppitz D.1, Gerlach J. W.1, Rauschenbach B.1
1Leibniz Institute of Surface Modification (IOM), Leipzig, Germany

IT-2-O-1645 Atomically Resolved 3D Shape Determination of an MgO Crystal from a Single HRTEM Image (PDF, HTML)
Jia C. L.1,2,3, Mi S. B.1,4, Barthel J.3,5, Wang D.1, Dunin-Borkowski R. E.2,3, Urban K. W.2,3, Thust A.2,3
1International Center of Dielectric Research, The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China, 2Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany, 3Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany, 4Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China, 5Central Facility for Electron Microscopy, RWTH Aachen University, Ahornstr. 55, 52074 Aachen, Germany.

IT-2-O-1857 Towards a quantitative exit wave function: the influence of phonon scattering (PDF, HTML)
Liberti E.1, Kim J. S.1, Kirkland A. I.1
1Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK

IT-2-O-1921 Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus images (PDF, HTML)
Kimoto K.1, Ishizuka K.2
1National Institute for Materials Science, Tsukuba, Japan, 2HREM Research Inc., Higashimatsuyama, Japan

IT-2-O-2157 An alternative normalization method for quantitative STEM (PDF, HTML)
Martinez G. T.1, Jones L.2, Béché A.1, Verbeeck J.1, Nellist P. D.2, Van Aert S.1
1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium, 2Department of Materials, University of Oxford, Oxford, United Kingdom

IT-2-O-2221 Channeling Effects on the Accuracy of HAADF STEM Quantification of Bimetallic Catalyst Nanoparticles (PDF, HTML)
MacArthur K. E.1, Lozano-Perez S.1, Ozkaya D.2, Nellist P. D.1
1Department of Materials Science, University of Oxford, Oxford, UK , 2Johnson-Matthey Technical Centre, Reading, UK

IT-2-O-2283 Measuring surface atom structures in Pt and Au nanocatalysts with high precision STEM imaging (PDF, HTML)
Yankovich A. B.1, Berkels B.2,3, Dahmen W.2,4, Binev P.2, Sanchez S. I.5, Bradley S. A.5, Voyles P. M.1
1University of Wisconsin – Madison, USA, 2University of South Carolina, USA, 3Universität Bonn, Germany, 4RWTH Aachen, Germany, 5UOP LLC a Honeywell Company, USA

IT-2-O-2414 A Method to Analyse the Chemical Composition in (InGa)(NAs) based on Evaluation of HAADF Intensity in STEM (PDF, HTML)
Grieb T.1, Müller K.1, Mahr C.1, Cadel E.2, Beyer A.3, Talbot E.2, Schowalter M.1, Volz K.3, Rosenauer A.1
1Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany, 2Groupe de Physique des Matériaux (GPM) UMR 6634, Normandie Université, Université et INSA de Rouen–CNRS, Av. de l’Université, BP 12, 76801 Saint Etienne du Rouvray, France, 3Materials Science Center and Faculty of Physics, Philipps University Marburg, Hans-Meerwein-Straße, 35032 Marburg, Germany

IT-2-O-2538 Optimizing Phase Contrast Imaging in Aberration Corrected TEM (PDF, HTML)
Kahl F.1, Hartel P.1, Linck M.1, Müller H.1, Haider M.1
1Corrected Electron Optical Systems GmbH, Heidelberg, Germany

IT-2-O-2611 The detection of single dopant atoms by high-resolution off-axis electron holography (PDF, HTML)
Cooper D.1, Mayall B.1, McLeod R.2, Haigh S.3, Dunin-Borkowski R. E.4
1CEA-LETI, Minatec, 17 rue des Martyrs, 38054 Grenoble, Cedex 9, France, 2CEA-INAC, Minatec, 17 rue des Martyrs, 38054 Grenoble, Cedex 9, France, 3School of Materials The University of Manchester, Manchester M13 9PL, U.K., 4Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, D-52425 Jülich, Germany

IT-2-O-2644 Low-voltage and energy-filtered chromatic aberration-corrected high-resolution TEM on the PICO instrument (PDF, HTML)
Houben L.1,3, Luysberg M.1,3, Barthel J.2,3, Mayer J.2,3, Dunin-Borkowski R. E.1,3
1Peter Grünberg Institut 5, Forschungszentrum Jülich, Germany, 2Gemeinschaftslabor für Elektronenmikroskopie, RWTH Aachen, Germany, 3Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Germany

IT-2-O-2658 Atomic resolution secondary electron imaging and simulation of the SrTiO3 (001) c(6x2) surface reconstruction (PDF, HTML)
Ciston J.1, Brown H. G.2, D'Alfonso A. J.2, Koirala P.3, Lin Y.3, Ophus C. L.1, Inada H.4, Zhu Y.5, Allen L. J.2, Marks L. D.3
1National Center for Electron Microscopy, Lawrence Berkeley National Lab., Berkeley, USA, 2School of Physics, University of Melbourne, Parkville, Victoria, Australia, 3Department of Materials Science and Engineering, Northwestern University, Evanston, USA, 4Hitachi High Technologies Corporation, Ibaraki, Japan, 5Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, USA

IT-2-O-2674 Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy (PDF, HTML)
Zheng C. L.1, Zhu Y.1, Lazar S.2, Etheridge J.1
1Monash University, Victoria, Australia, 2FEI Electron Optics, Eindhoven, The Netherlands

IT-2-O-2881 Putting a New Spin on Scanning Transmission Electron Microscopy (PDF, HTML)
LeBeau J. M.1, Sang X.1, Grimley E. D.1
1North Carolina State University, Raleigh, North Carolina, USA

IT-2-O-2885 Three-dimensional location of a single dopant with atomic precision by aberration-corrected ADF STEM (PDF, HTML)
Ishikawa R.1,2, Lupini A. R.2, Findlay S. D.3, Taniguchi T.4, Pennycook S. J.5
1University of Tokyo, Japan, 2Oak Ridge National Laboratory, USA, 3Monash University, Australia, 4National Institute for Materials Science, Japan, 5The University of Tennessee, USA

IT-2-O-3220 3D strain in HAADF – STEM images (PDF, HTML)
Guerrero-Lebrero M. P.1, Bárcena-González G.1, Guerrero E.1, Liu Y.3, Kepaptsoglou D. M.4, Ramasse Q.4, Li L.3, Lazarov V. K.2, Galindo P. L.1
1Department of Computer Science and Engineering, Universidad de Cádiz, 11510 Puerto Real, Spain, 2Department of Physics, University of York, Heslington, York, United Kingdom, 3Department of Physics, University of Wisconsin, Milwaukee, WI 53211, USA, 4SuperSTEM Laboratory, STFC Daresbury Campus, Warrington, WA4 4AD, United Kingdom

IT-2-O-3292 Position resolved single electron response of the HAADF-STEM detector and improved method for intensity normalisation (PDF, HTML)
Schowalter M.1, Krause F. F.1, Grieb T.1, Mehrtens T.1, Müller K.1, Rosenauer A.1
1Institut für Festkörperphysik, Universität Bremen, Bremen, Germany

IT-2-O-3488 Linking Thickness, Channelling and Secondary X-ray signals in Atomic Resolution Scanning Transmission Electron Microscopy (PDF, HTML)
Weyland M.1, Findlay S. D.2, D'Alfonso A. J.3, Allen L. J.3
1Monash Centre for Electron Microscopy, Monash University, Melbourne 3800, Australia, 2School of Physics, Monash University, Melbourne 3800, Australia, 3School of Physics, The University of Melbourne, Melbourne 3010, Australia

IT-2-P-1522 Modification of an existing laboratory room to house a Cs corrected microscope. (PDF, HTML)
Papworth A. J.1, Nellist P. D.1
1The Department of Materials, The University of Oxford, Oxford OX1 3PH UK.

IT-2-P-1525 Cs CORRECTED ATOMIC RESOLUTION TEM IMAGES OF THE HUMAN TOOTH ENAMEL CRYSTALS (PDF, HTML)
REYES-GASGA J.1,3, TIZNADO-OROZCO G. E.2, BRÈS E. F.1
1Unité des Matériaux et Transformation (UMET). Université de Lille 1, Sciences et Technologies. Bâtiment C6. 59650 Villeneuve d’Ascq. Lille, France., 2Unidad Académica de Odontología. Universidad Autónoma de Nayarit. Edificio E7, Ciudad de la Cultura “Amado Nervo”, C.P. 63190 Tepic, Nayarit, Mexico., 3Permanet Address: Instituto de Física, UNAM. Circuito de la Investigación s/n. Cd. Universitaria, 04510 Coyoacán, Mexico D. F., México

IT-2-P-1600 Phase Contrast Transfer Function for Differential Phase Contrast in High Resolution Local Electric Field Measurements (PDF, HTML)
Majert S.1, Kohl H.1
1Physikalisches Institut und Interdisziplinäres Centrum für Elektronenmikroskopie und Mikroanalyse (ICEM), Westfälische Wilhelms-Universität Münster, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany

IT-2-P-1633 Lifetime of the aberration-corrected optical state in HRTEM (PDF, HTML)
Barthel J.1, Thust A.2
1Central Facility for Electron Microscopy, RWTH Aachen, Germany, 2Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany

IT-2-P-1677 Preparation of thin film specimen by Cryo Ion Slicer for TEM cross-section (XTEM) observation  (PDF, HTML)
Siddheswaran R.1, Medlín R.1
1New Technologies Research Centre, University of West Bohemia, Plzeň-30614, Czech Republic

IT-2-P-1739 Development of the on-line DigitalMicrograph scripts for TEM imaging using the “Virtual TEM”. (PDF, HTML)
Potapov P.1
1temDM, Dresden, Germany

IT-2-P-1751 The atomic structure of epitaxially strained LaNiO3-LaGaO3 superlattices (PDF, HTML)
Qi H. Y.1, Kinyanjui M. K.1, Biskupek J.1, Benckiser E.2, Habermeier H. U.2, Keimer B.2, Kaiser U.1
1University of Ulm, Central Facility of Electron Microscopy, Electron Microscopy Group of Materials Science, Albert Einstein Allee 11, D-89069 Ulm, Germany, 2Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70579 Stuttgart, Germany

IT-2-P-1996 Structural and spectroscopic analyses of exfoliated 2-D transition metal dichalcogenides nanosheets with special emphasis on TEM (PDF, HTML)
Pokle A. S.1, Coelho J.2, Mendoza B.2, Nicolosi V.1, 2
1School of Physics, Advance Microscopy Lab, Trinity College Dublin, Ireland, 2School of Chemistry, CRANN, Trinity College Dublin, Ireland

IT-2-P-2016 Surface Science of Metal Oxides by High-resolution TEM (PDF, HTML)
Yu R.1, Zhan W.1, Lu S. R.1, Zhu J.1
1Tsinghua University, Beijing, China

IT-2-P-2042 Contrast Investigation of Annular Bright-Field Imaging in Scanning Transmission Electron Microscopy of LiFePO4 (PDF, HTML)
Zhou D.1, Sigle W.1, Müller K.2, Rosenauer A.2, Zhu C.3, Kelsch M.1, Maier J.3, van Aken P. A.1
1Max Planck Institute for Intelligent Systems, Stuttgart Center for Electron Microscopy, Heisenbergstraße 3, 70569 Stuttgart, Germany, 2Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, D-28359 Bremen, Germany, 3Max Planck Institute for Solid State Research, Heisenbergstraße 1, 70569 Stuttgart, Germany

IT-2-P-2046 HAADF STEM characterization of BST-MgO interface structure (PDF, HTML)
Kuskova A. N.1, Zhigalina O. M.1, Khmelenin D. N.1
1Shubnikov Institute of Crystallography, Russian Academy of Sciences

IT-2-P-2162 A channelling based approach for scattering cross sections of mixed columns in HAADF STEM images (PDF, HTML)
van den Bos K.1, Van Aert S.1
1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium

IT-2-P-2255 Probability of error for counting the number of atoms from high resolution HAADF STEM images (PDF, HTML)
De Backer A.1, De wael A.1, Van Aert S.1
1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium

IT-2-P-2256 STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures (PDF, HTML)
Yang H.1, Lozano J. G.1, Pennycook T. J.1,2, Hirsch P. B.1, Nellist P. D.1,2
1University of Oxford, Department of Materials, Oxford, UK, 2EPSRC SuperSTEM Facility, Daresbury Laboratory, Warrington, UK

IT-2-P-2265 Adding the Third Dimension to Atomic Resolution Spectrum Imaging (PDF, HTML)
Pennycook T. J.1,2, Lewys J.1, Cabero M.3, Ribera-Calzada A.3, Leon C.3, Varela M.4,3, Santamaria J.3, Nellist P. D.1,2
1Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK , 2SuperSTEM Laboratory, STFC Daresbury, Keckwick Lane, Warrington WA4 4AD, UK, 3Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain , 4Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

IT-2-P-2307 Observing depth dependent strain via optical sectioning in the STEM (PDF, HTML)
Lozano J. G.1, Yang H.1, Guerrero-Lebrero M. P.2, Yasuhara A.3, Okunishi E.3, Zhang S.4, Humphreys C. J.4, Galindo P. L.2, Hirsch P. B.1, Nellist P. D.1
1Department of Materials, University of Oxford, Oxford (UK), 2Departamento de Lenguajes y Sistemas Informaticos, CASEM, Universidad de Cadiz, Puerto Real (Cadiz), Spain, 3JEOL Ltd., Tokio (Japan), 4Department of Materials Science and Metallurgy, University of Cambridge, Cambridge (UK)

IT-2-P-2322 Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods (PDF, HTML)
Krause F. F.1, Müller K.1, Zillmann D.1, Jansen J.2, Schowalter M.1, Rosenauer A.1
1Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany, 2National Centre for HREM, Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands

IT-2-P-2407 Studying ω to α Phase Transformation in Ti-15Mo alloy by Combination of Aberration-corrected Scanning Transmission Electron Microscopy and Ab-initio Calculations (PDF, HTML)
Sung Jin Kang 1 Sung-Hwan Kim 1 Heung Nam Han 1 Min-Ho Park 2 Cheol-Woong Yang 2 Hu-Chul Lee 3 Yoon-Uk Heo 3 Miyoung Kim 1
Department of Materials Science & Engineering, Seoul National University, South. Korea 1 Department of Materials Science & Engineering, Sungkyunkwan University, South Korea 2 High Temperature Energy Materials Research Center, Korea Institute of Science and Technology, South Korea 3

IT-2-P-2425 Sensitive X-ray analysis system on an automated aberration correction FE-STEM (PDF, HTML)
Inada H.1, Hirayama Y.1, Tamura K.1, Terauchi D.1, Namekawa R.1, Shichiji T.1, Sato T.1, Suzuki Y.1, Konno M.1, Nakamura K.1, Hashimoto T.1
1Science & Medical Systems Design Div. Hitachi High-Technologies Corp.

IT-2-P-2453 3D-structural elucidation of highly ordered mesoporous TiO2 thin film by the method of electron crystallography (PDF, HTML)
Xu B. B.1,2, Feng Z. D.1, Zhou H.1, Wang C.1
1College of Materials, Xiamen University, Xiamen, China, 2Center of Instrumental Analysis, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, China

IT-2-P-2571 Optimization of imaging conditions for atomic resolution in Titan TEM to minimize radiation damage and to study low angle boundaries in graphene-like materials (PDF, HTML)
Lopatin S.1, Chuvilin A.2
1FEI Company, Eindhoven, Netherlands, 2CIC nanoGUNE, Donostia - San Sebastian, Spain

IT-2-P-2594 Aberration correction through auto-iteration system utilizing diffractogram analysis by profile fitting technique (PDF, HTML)
Morishita S.1,3, Nakamichi T.1, Takano A.1, Satoh K.1, Hosokawa F.1, Suenaga K.2,3, Sawada H.1,3
1JEOL Ltd., 2National Institute of Advanced Industrial Science and Technology, 3Research acceleration program, Japan Science and Technology Agency

IT-2-P-2830 Quantitative Low-dose HRTEM Imaging and Analysis of Radiation-sensitive Materials (PDF, HTML)
Huang C.1, Borisenko K. B.1, Kim J. S.1, Berkels B.2, Kirkland A. I.1
1University of Oxford, 2RWTH Aachen University

IT-2-P-2922 Real Space Characterization of the Finite Shape of the STEM Probe (PDF, HTML)
Grimley E. D.1, Sang X.1, LeBeau J. M.1
1North Carolina State University, Department of Materials Science and Engineering, Raleigh, North Carolina, United States

IT-2-P-2932 Complementary Nature of Microscopy Techniques for Understanding Materials Phenomena (PDF, HTML)
Ghosh C.1, Basu J.1, Divakar R.1, Mohandas E.1
1Materials Synthesis and Structural Characterisation Division, Physical Metallurgy Group, Metallurgy and Materials Group, Indira Gandhi Centre for Atomic Research, Kalpakkam-603102, Tamil Nadu, India

IT-2-P-2949 Development of highly stabilized water chiller for atomic resolution microscope (PDF, HTML)
Hamochi M.1, Ishii T.1, Chisaka S.1, Okunishi E.1, Sawada H.1, Wakui S.2
1JEOL ltd., 2Tokyo University of Agriculture and Technology

IT-2-P-3171 Quantitative study of defocus-dependent annular bright field images (PDF, HTML)
Lee S.1,2, Oshima Y.2,3, Takayanagi K.1,2
1Tokyo Institute of Technology, Tokyo, Japan, 2JST-CREST, Tokyo, Japan, 3Osaka University, Ibaraki, Japan

IT-2-P-3187 Quantitative analysis of CeO2 and Gd-doped CeO2 nanocrystals by HRTEM focal series restoration (PDF, HTML)
Stroppa D. G.1 2, Dalmaschio C. J.3, Thust A.2, Lentzen M.2, Barthel J.2 4, Houben L.2
1International Iberian Nanotechnology Laboratory (INL), Braga, Portugal, 2Forschungszentrum Jülich, Jülich, Germany, 3Federal University of Espírito Santo, São Mateus, Brazil, 4Rheinisch-Westfälische Technische Hochschule Aachen (RWTH), Aachen, Germany

IT-2-P-3197 Temperature dependence of Z-contrast in InGaN (PDF, HTML)
Mehrtens T.1, Schowalter M.1, Tytko D.2, Choi P. P.2, Raabe D.2, Hoffmann L.3, Jönen H.3, Rossow U.3, Hangleiter A.3, Rosenauer A.1
1Institute of Solid State Physics, University of Bremen, Bremen, Germany, 2Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany, 3Institute of Applied Physics, TU Braunschweig, Braunschweig, Germany

IT-2-P-3202 Sub-angstrom resolution realized with super high-resolution aberration corrected STEM at 300 kV (PDF, HTML)
Sawada H.1, Okunishi E.1, Shimura N.1, Satoh K.1, Hosokawa F.1, Kaneyama T.1
1JEOL Ltd.

IT-2-P-3462 The mini-TEM: highquality imaging and analysis of biological specimen (PDF, HTML)
Sintorn I.1,2, Kylberg G.2, Nordström R.2, Uppström M.2, Danielsson K.2, Fulin J.2, Åkesson J.2, Coufalova E.3, Drsticka M.3, Kolarik V.3, Stepan P.3
1Centre for Image Analysis, Uppsala University, Sweden, 2Vironova AB, Gävlegatan 22, Solna, Sweden, 3Delong Instruments, Brno, Czech Republic

IT-2-P-5735 Quantitative measurement of electron magnetic circular dichroism on polycrystalline iron film (PDF, HTML)
Muto S.1, Rusz J.2, Tatsumi K.1, Adam R.3, Arai S.1, Kocevski V.2, Oppeneer P. M.2, Bürgler D. E.3, Schneider C. M.3
1Nagoya University, Nagoya, Japan, 2Uppsala University, Uppsala, Sweden, 3Peter Grünberg Institute, Jülich, Germany

IT-2-P-5974 High quality FIB lamella preparation for wide area atomic resolution TEM investigations (PDF, HTML)
Straubinger R.1, Beyer A.1, Gries K. I.1, Schneider C.2, Rohnke M.2, Mogwitz B.2, Janek J.2, Volz K.1
1Material Sciences Center and Faculty of Physics, Philipps-Universität Marburg, Germany, 2Physikalisch-Chemisches Institut, Justus-Liebig-Universität Gießen, Germany

IT-2-P-6055 Visualizing and correcting dynamic specimen processes in TEM using a large-format Direct Detection Device (PDF, HTML)
Bammes B. E.1, Spilman M.1, Chen D. H.1, Jin L.1, Bilhorn R. B.1
1Direct Electron, San Diego, CA

IT-3-IN-1768 Superresolution Light Microscopy of nuclear Genome Organization (PDF, HTML)
Cremer C.1,2,3
1Institute of Molecular Biology (IMB), D-55128 Mainz/Germany, 2Institute for Pharmacy and Molecular Biotechnology (IPMB), University Heidelberg, D-69120 Heidelberg/Germany, 3Kirchhoff-Institute for Physics (KIP), University Heidelberg, D-69120 Heidelberg/Germany

IT-3-IN-2856 Smart NanoBioImaging: multimodal correlative nanoscopy. (PDF, HTML)
Diaspro A.1, 2, 3
1Department of Nanophysics, Istituto Italiano di Tecnologia, Genoa, Italy, 2Department of Physics, University of Genoa, Genoa, Italy, 3Nikon Imaging Center, NIC@IIT, Genoa, Italy

IT-3-O-1457 Imaging of cleared biological samples with the Ultramicroscope (PDF, HTML)
Dodt H. U.1, Becker K.1, Hahn C.1, Saghafi S.1
11Vienna University of Technology, Chair of Bioelectronics, 1040 Vienna, Austria

IT-3-O-1814 Large parallelization of STED nanoscopy using optical lattices (PDF, HTML)
Yang B.1,2, Przybilla F.1,2, Mestre M.1,2, Trebbia J. B.1,2, Lounis B.1,2
1Univ Bordeaux, LP2N, F-33405 Talence, France , 2Institut d’Optique & CNRS, LP2N, F-33405 Talence, France

IT-3-O-2173 Effects of optical aberrations in single molecule and super resolution imaging (PDF, HTML)
Coles B. C.1, Schwartz N.2, Rolfe D. J.1, Guastamacchia M.1,3, Lo Schiavo V.1, Martin-Fernandez M. L.1, Webb S. E.1
1Science & Technology Facilities Council, Rutherford Appleton Laboratory, Didcot, UK, 2Science and Technology Facilities Council, Astronomy Technology Centre, Edinburgh, UK, 3Heriot-Watt University, Edinburgh, UK

IT-3-O-2789 Identify and Localise: Algorithms for Single Molecule Localisation Microscopy (PDF, HTML)
Best G.1 2 5, Prakash K.3 4 5, Hagmann M.1 2, Cremer C.1 3 4, Birk U.1 4
1Kirchhoff-Institute for Physics (KIP), University of Heidelberg, Heidelberg, Germany, 2University Hospital Heidelberg, University of Heidelberg, Heidelberg, Germany, 3Institute for Pharmacy and Molecular Biotechnology (IPMB), University of Heidelberg, Heidelberg, Germany, 4Institute of Molecular Biology (IMB), Mainz, Germany, 5equal contribution

IT-3-P-2060 Sub resolution spectral discrimination of Lipufuscin-granules inside human RPE cells (PDF, HTML)
Schock F.1,2, Best G.1,2, Celik N.2, Heintzmann R.4,5, Sel S.2, Birk U.3,6, Dithmar S.2, Cremer C.1,3,6
1Kirchhoff Institute for Physics, University of Heidelberg, Im Neuenheimer Feld 227, 69120 Heidelberg, Germany, 2Department of Ophthalmology, Universityhospital of Heidelberg, Im Neuenheimer Feld 400, 69120 Heidelberg, Germany, 3Institute of Molecular Biology, Ackermannweg 4, 55128 Mainz, Germany, 4Institute for Physical Chemistry, University of Jena, Lessingstr. 10, 07743 Jena, Germany, 5Institute of Photonic Technology, Albert-Einstein-Straße 9, 07745 Jena, Germany, 6Department of Physics, University of Mainz, Staudingerweg 7, 55128 Mainz, Germany

IT-3-P-2190 Super-resolution imaging of 3D-cultured cells by SAX microscopy (PDF, HTML)
Yonemaru Y.1, Yamanaka M.1, Uegaki K.1, Smith N. I.1, Kawata S.1, Fujita K.1
1Osaka University, Osaka, Japan

IT-3-P-2200 Structured Illumination Microscopy With Multifrequency Patterns and LED Light Sources (PDF, HTML)
Švindrych Z.1, Křížek P.1, Ovesný M.1, Borkovec J.1, Smirnov E.1, Raska I.1, Hagen G. M.1
1First Faculty of Medicine, Charles University in Prague

IT-3-P-2211 Flexible Structured Illumination Microscope with a Programmable Illumination Array (PDF, HTML)
Švindrych Z.1, Křížek P.1, Ovesný M.1, Borkovec J.1, Raška I.1, Hagen G. M.1
1First Faculty of Medicine, Charles University in Prague

IT-3-P-3025 Measurement and simulation of PSF (PDF, HTML)
Nahlik T.1, Stys D.1
1University of South Bohemia in Ceske Budejovice, Faculty of Fisheries and Protection of Waters, Institute of Complex Systems, Nové Hrady, Czech Republic

IT-3-P-3035 Drift Correction Strategies for Single Molecule Localisation Microscopy (PDF, HTML)
Hagmann M.1 2 6, Prakash K.3 4 6, Best G.1 2, Kaufmann R.5, Birk U.1 4, Cremer C.1 3 4
1Kirchhoff­-Institute for Physics (KIP), University of Heidelberg, Heidelberg, Germany, 2University Hospital Heidelberg, University of Heidelberg, Heidelberg, Germany, 3Institute for Pharmacy and Molecular Biotechnology (IPMB), University of Heidelberg, Heidelberg, Germany, 4Institute of Molecular Biology (IMB), Mainz, Germany, 5Division of Structural Biology, Wellcome Trust Centre for Human Genetics, University of Oxford, Oxford, UK, 6equal contributions

IT-3-P-5736 Three-Dimensional Surface Modelling Of Cellular Structures And Intracellular Proteins Expression In Urinary Bladder Cancer Cells. (PDF, HTML)
ELKABLAWY M. A.2
1Pathology Department, Faculty of Medicine, Menoufyia University, Egypt; , 2Pathology Department, Faculty of Medicine, Taibah University, Almadinah Almonourah, Saudi Arabia.

IT-3-P-5751 Light induced in situ observation technology in EM (PDF, HTML)
Huang M. R.1, Lin C. L.1, Chen K. F.1, Liu S. Y.1, Haung T. W.1, Tseng F. G.1, Chen F. R.1
1Engineering and System Science Department/National Tsing Hua University, Hsinchu, Taiwan

IT-3-P-5777 ThunderSTORM: a comprehensive ImageJ plugin for PALM and STORM data analysis and super-resolution imaging (PDF, HTML)
Křížek P.1, Ovesný M.1, Borkovec J.1, Švindrych Z.1, Hagen G. M.1
1Institute of Cellular Biology and Pathology, First Faculty of Medicine, Charles University in Prague

IT-3-P-5941 Development of the pump-probe nanoscopy architecture. (PDF, HTML)
Korobchevskaya K.1, Bianchini P.1, Scotto M.1, Sheppard C.1, Diaspro A.1
1Nanophysics, Istituto Italiano di Tecnologia, 16136 Genova, Italy

IT-3-P-5986 Inherently coaligned dual color STED microscopy (PDF, HTML)
Göttfert F.1, D'Este E.1, Lukinavičius G.2, Hell S. W.1
1Max-Planck-Institute for Biophysical Chemistry, Göttingen, 2Ecole Polytechnique Fédérale de Lausanne, Lausanne

IT-4-IN-1844 Ultra-low-energy STEM in SEM (PDF, HTML)
Frank L.1, Nebesářová J.2, Müllerová I.1
1Institute of Scientific Instruments, Brno, Czech Republic, 2Biology Centre, České Budějovice, Czech Republic

IT-4-IN-5709 A review of SE and BSE imaging in SEM and Variable Pressure SEM (PDF, HTML)
Griffin B. J.1, Joy D. C.2, Michael J. R.3, Gauvin R.4
1Centres for Forensic Science, and for Microscopy, Characterisation and Analysis, The University of Western Australia, Perth, Australia , 2Centre for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, USA, 3Sandia National Laboratories, PO Box 5800, Albuquerque, USA, 4Department of Materials Engineering, McGill University, Montreal, Quebec, Canada

IT-4-O-1411 Influence of the work-function changes on the contrast of images in SEM. (PDF, HTML)
Cazaux J.1, Sato K.2, Kuwano M.3, Ikatura N.4
1Physics Department, Faculty of Sciences, BP 1039, 51687 Reims Cedex 2, France, 2. JFE Steel Corp., 1 Kawasaki-cho, Chuo-ku Chiba Japan, 3MJIIT, Universiti Teknologi Malaysia, Jalan Semarak, 54100 Kuala Lumpur, Malaysi, 4Kyushu-University, Kasuga, Fukuoka 816-8580, Japan

IT-4-O-1437 Advancements in Integrated Micro-XRF in the SEM (PDF, HTML)
Witherspoon K. C.1, Cross B. J.2, Lamb R. D.1, Sjoman P. O.1, Hellested M. D.1
1IXRF Systems, Inc., 3019 Alvin De Vane Blvd, Suite 130, Austin, Texas, 78741, USA, 2CrossRoads Scientific, P.O. Box 1823, El Granada, CA 94018

IT-4-O-1674 Innovation possibilities of scintillation electron detector for SEM (PDF, HTML)
Schauer P.1, Bok J.1
1Institute of Scientific Instruments of the AS CR, v.v.i., Brno, Czech Republic

IT-4-O-1791 Quantitative interpretation for angle selective backscattering image of iron oxide on steel (PDF, HTML)
Aoyama T.1, Nagoshi M.2, Sato K.2
1JFE Steel Corporation, Fukuyama, Japan, 2JFE Steel Corporation, Chiba, Japan

IT-4-P-1423 Development of high-efficiency DF-STEM detector (PDF, HTML)
Kaneko T.1, Saitow A.1, Fujino T.1, Okunishi E.1, Sawada H.1
1JEOL Ltd. 1-2 Musashino 3-Chome, Akishima, Tokyo 196-8558, Japan

IT-4-P-1456 Photonic Crystal Structure of Butterfly Wing Scales Exhibiting Selective Wavelength Iridescence (PDF, HTML)
Matějková-Plšková J.1, Mika F.1, Jiwajinda S.2, Dechkrong P.2, Svidenská S.3, Shiojiri M.4
1Institute of Scientific Instruments of the ASCR, v.v.i., Královopolská 147, Brno 612 64, Czech Republic, 2Bioresources and Biodiversity Section, Central Laboratory and Greenhouse Complex, Kasetsart University, Kamphaengsaen Campus, Nakhonpathom 73140, Thailand, 3Institute of Cellular Biology and Pathology, First Faculty of Medicine, Charles University in Prague, Albertov 4, 12801 Praha 2, Czech Republic, 4Professor Emeritus of Kyoto Institute of Technology, 1-297 Wakiyama, Kyoto 618-0091, Japan.

IT-4-P-1467 Energy Low Loss Backscattered Electrons Imaging in Material Characterization and Analysis (PDF, HTML)
Liu X.1
1Carl Zeiss Microscopy GmbH

IT-4-P-1503 Using an EBSD Detector as a Microstructural Imaging Device (PDF, HTML)
Wright S. I.1, Nowell M. M.1, de Kloe R.3, Camus P. P.2
1EDAX, Draper, Utah, United States, 2EDAX, Mahwah, New Jersey, United States, 3EDAX, Tilburg, The Netherlands

IT-4-P-1551 A simple way to obtain BSE image in STEM (PDF, HTML)
Tsuruta H.1, Tanaka S.2, Tanji T.2, Morita C.3
1Department of Electronics, Nagoya University, 2EcoTopia Science Institute, Nagoya University, 3Meijo University

IT-4-P-1565 Imaging of nanoparticles in cells with backscattered electrons in a scanning electron microscope (PDF, HTML)
Müller E.1, Seiter J.1, Blank H.1, Gehrke H.2, Marko D.2, Gerthsen D.1
1Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany, 2Department of Food Chemistry and Toxicology, University of Vienna, Vienna, Austria

IT-4-P-1607 Application for Low Energy STEM with the In-lens Cold FE-SEM (PDF, HTML)
Sunaoshi T.1, Orai Y.1, Ito H.1, Okada S.1, Ogashiwa T.1, Konno M.1
1Hitachi High-Technologies Corporation, Ibaraki, Japan

IT-4-P-1688 High Sensitivity and Minimum Acquisition Time with the Annular EDX Pole Piece Silicon Drift Detector “Rococo2” (PDF, HTML)
Liebel A.1, Eckhardt R.1, Bornschlegl M.1, Bechteler A.1, Niculae A.1, Soltau H.1
1PNDetector GmbH, Munich, Germany

IT-4-P-1795 SEM images using an energy/angle selective electron detector. (PDF, HTML)
Otsuka T.1, Nakamura M.1, Yamashita K.1, Hara M.1, Timischl F.2, Honda K.1, Kudo M.2, Kitamura S.1
1JEOL Ltd., Tokyo, Japan, 2JEOL Technics Ltd., Tokyo, Japan

IT-4-P-1825 The study of extreme low landing voltage scanning electron microscopy (PDF, HTML)
Sakuda Y.1, Asahina S.1, Kazumori H.1, Kawauchi K.1, Nokuo T.1, Charles F.2
1JEOL.ltd, 3-1-2 Musashino, Akisima, Tokyo 196-8558 JAPAN, 2JEOL SAS, Espace Claude Monet-1, allee de Giverny, Croissy-Sur-Seine 78290 FRANCE

IT-4-P-1829 Determination of the second critical energy of primary electrons in relation to dielectric thickness and angle of incidence (PDF, HTML)
Evstaf'eva E. N.1, Rau E. I.1, 2, Tatarintsev A. A.2
1Faculty of Physics, M. V. Lomonosov Moscow State University , 2Institute of microelectronics technology and high purity materials RAS

IT-4-P-1852 New possibilities of SEM for two-channel detection of energetically filtered secondary and backscattered electrons (PDF, HTML)
Rau E. I.1, Kupreenko S. U.1, Tatarintsev A. A.1, Zaitsev S. V.1
1Faculty of Physics , M. V. Lomonosov Moscow State University

IT-4-P-1865 Low-Damage SEM Imaging of Organosilicate Glass Thin Films in Semiconductor Industry (PDF, HTML)
Garitagoitia Cid A.1,2,3, Muehle U.2, Rosenkranz R.2, Zschech E.1,2,3
1Technische Universität Dresden, Dresden, Germany , 2Fraunhofer Institute for Ceramic Technologies and Systems IKTS, Dresden, Germany, 3Dresden Center for Nanoanalysis (DCN), Dresden, Germany

IT-4-P-1912 Ionic Liquid Preparation for SEM Observation of Minute Crustacean (PDF, HTML)
Shiono M.1, Sakaue M.1, Konomi M.1, Tomizawa J.2, Nakazawa E.1, Kawai K.3, Kuwabata S.4
1Tokyo Solution Lab., Hitachi High-Technologies Corp., Kawasaki, Kanagawa, Japan, 2Hitachi High-Technologies Corp.,hitachinaka, Ibaraki, Japan , 3Miyoshi Oil & Fat CO.,LTD. Katsushika, Tokyo, Japan , 4Graduate School of Engineering, Osaka University, Yamadaoka, Suita, Osaka, Japan

IT-4-P-1917 New Preparation Method using Ionic Liquid for Fast and Reliable SEM Observation of Biological Specimens (PDF, HTML)
Sakaue M.1, Shiono M.1, Tomizawa J.2, Nakazawa E.1, Kawai K.3, Kuwabata S.4
1Tokyo Solution Lab., Hitachi High-Technologies Corp., Kawasaki, Kanagawa, Japan , 2Hitachi High-Technologies Corp., Hitachinaka, Ibaraki, Japan, 3Miyoshi Oil & Fat CO., LTD., Tokyo, Japan, 4Graduate School of Engineering, Osaka University, Osaka, Japan

IT-4-P-2152 Purification of FEBID gold nanostructures using oxygen plasma (PDF, HTML)
Shawrav M. M.1, Wanzenboeck H. D.1, Belić D.1, Gavagnin M.1, Wachter S.1, Bertagnolli E.1
1Institute of Solid State Electronics, Vienna University of Technology

IT-4-P-2277 Physical background of multiple detection possibilities of the Hitachi SU8030 SEM (PDF, HTML)
Gernert U.1, Berger D.1
1Technical University Berlin, Center for Electron Microscopy (ZELMI), Straße des 17. Juni 135, 10623 Berlin, Germany

IT-4-P-2405 Application of Multi-Tilt Specimen Stage for Advanced Electron Channeling Contrast Technique (PDF, HTML)
Dluhoš J.1, Sedláček L.1, Ižák T.1, Hrnčíř T.1, Jiruše J.1
1TESCAN Brno, s.r.o., Brno, Czech Republic

IT-4-P-2413 Hair Cuticular Characteristics: Potential of Animal Identification in Primates Order (PDF, HTML)
HING L. H.1, TEO H. C.1, FOONG M. J.1, HUKIL S.1, SAHALAN A. Z.1, WAN NUR SYAWANI W.1, KASWANDI M. A.2, NORMALAWATI S.3
1School of Diagnostic & Applied Health Sciences, Faculty of Health Sciences, Universiti Kebangsaan Malaysia, 2Institute of Medical Science Technology, Universiti Kuala Lumpur, Taman Kajang Sentral, 43000 Kajang, Selangor., 3Electron Microscope Unit, Faculty of Science & Technology, Universiti Kebangsaan Malaysiaa

IT-4-P-2468 Recent achievements of elemental analysis with low acceleration voltage FE-SEM (PDF, HTML)
Kikuchi N.1, Morita H.2, Ikarashi M.2, Kawauchi K.1, Nokuo T.1, Charles F.3
1JEOL Ltd., 3-1-2 Musashino, Akisima, Tokyo 196-8558 Japan, 2Oxford Instruments KK, IS Building, 3-32-42 Higashi-Shinagawa, Shinagawa-Ku, Tokyo 140-0002 Japan, 3JEOL SAS, Espace Claude Monet-1, allee de Giverny, Croissy-Sur-Seine 78290 France

IT-4-P-2553 Nanostructure Imaging with Topographic and Compositional Contrasts in a Cold-Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration (PDF, HTML)
Gauvin R.1, Brodusch N.1, Demers H.1, Woo P.2
1Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, 2Hitachi High-Technologies Canada Inc., Toronto, Canada

IT-4-P-2654 POROSITY DETERMINATION ON IRON ORE PELLETS USING OPTICAL MICROSCOPE AND ELECTRON MICROSCOPE (PDF, HTML)
Graça L. M.1, Lagoeiro L. E.2, Vicente T. M.3
1Geology Department, School of Mines, Federal University of Ouro Preto, 2Geology Department, School of Mines, Federal University of Ouro Preto, 3Mining Department, School of Mines, Federal University of Ouro Preto.

IT-4-P-2700 Volume reconstruction of biological samples by alternate physical and virtual slicing (PDF, HTML)
Hovorka M.1, Boughorbel F.2, Potocek P.2, Cernohorsky P.1, van den Boogaard R.2, Hekking L.2, Korkmaz E.2, Langhorst M.2, Lich B.2
1FEI, Podnikatelska 6, 635 00 Brno, Czech Republic, 2FEI, Achtseweg Noord 5, 5651 GG Eindhoven, Netherlands

IT-4-P-2707 Low-Voltage Imaging of Non-Conducting Samples (PDF, HTML)
Beránek J.1, Havelka M.1, Jiruše J.1
1TESCAN Brno, s.r.o., Libušina třída 1, Brno, Czech Republic

IT-4-P-2766 A novel SEM triple in-lens detection system (PDF, HTML)
Wall D. C.1, Vystavel T.2, Tuma L.2, Skalicky J.2, Sasam F.1, Wandrol P.2
1FEI Company, Eindhoven, The Netherlands, 2FEI Company, Brno, Czech Republic

IT-4-P-2793 Monte Carlo simulations of electron trajectories for the study of betavoltaic battery configurations (PDF, HTML)
Napchan E.1
1DLM Enterprises, London NW6 1QH, UK

IT-4-P-2865 Estimation of the resolution in 2D Wet-STEM and Wet-STEM tomography by Monte Carlo simulations (PDF, HTML)
Xiao J.1, Perret A.1, Foray G.1, Masenelli-Varlot K.1
1Université de Lyon, INSA-Lyon, Villeurbanne, France

IT-4-P-3005 Microstructural characterization of metallic materials using advanced SEM techniques (PDF, HTML)
Piňos J.1, Konvalina I.1, Kasl J.2, Jandová D.2, Mikmeková Š.1
11. Institute of Scientific Instruments of the ASCR, v.v.i., Czech Republic, 22. VZU Plzen- research and Testing Institute Plzen, Czech Republic

IT-4-P-3064 An approach to study antigenotoxicity assay in plants using Confocal Laser Scannig Microscopy and Scanning Electron Microscopy. (PDF, HTML)
Walia A.1, Sharma M.2, Kumar K.1, Bhardwaj R.2, Thukral A. K.2
1Centre for Emerging Life Sciences, Guru Nanak Dev University, Amritsar, Punjab, India, 2Department of Botanical & Environmental Sciences, Guru Nanak Dev University, Amritsar, Punjab, India

IT-4-P-3088 STEM in SEM imaging of gold nanoparticles in tissular ecotoxicity experiments (PDF, HTML)
García-Negrete C. A.1, Jiménez de Haro M. C.1, Blasco J.2, Soto M.3, Fernández A.1
1Materials Science Institute of Seville (CSIC - Univ. Seville), Seville, Spain, 2Institute of Marine Sciences of Andalusia (ICMAN-CSIC), Puerto Real (Cadiz), Spain, 3Zoology and Cell Biology Dept., University of the Basque Country, Leioa (Bizkaia), Spain

IT-4-P-3090 Low-voltage STEM tomography: an alternative for soft polymers and hydrated samples (PDF, HTML)
Masenelli-Varlot K.1, Roiban L.1, Malchère A.1, Dhungana D. S.1, Xiao J.1, Jomaa M. H.1, 2, Ferreira J.1, Cavaillé J. Y.1, Seveyrat L.2, Lebrun L.2
1Université de Lyon, INSA-Lyon, CNRS, MATEIS, 7 avenue J. Capelle, 69621 Villeurbanne cedex, France., 2Université de Lyon, INSA-Lyon, LGEF, 8 rue de la physique, 69621 Villeurbanne cedex, France.

IT-4-P-3106 SEM observation of several biological samples using a hydrophilic asymmetrical tetraammonium-type room temperature ionic liquid as a visualizing agent (PDF, HTML)
ABE S.1, KAWAI K.2, YOSHIDA Y.1
1Graduate School of Dental Medicine, Hokkaido University, Sapporo, Japan, 2Miyoshi Oil & Fat Co., Ltd., Tokyo, Japan

IT-4-P-3134 Topotactic transformations of Goethite to Hematite during low metamorphic conditions (PDF, HTML)
Souza D. S.1, Lagoeiro L. E.1, Barbosa P. F.2
1Federal University of Ouro Preto,Departament of Geology,Minas Gerais, Brazil, 2Federal University of Minas Gerais, Microscopy Center,Minas Gerais,Brazil

IT-4-P-3145 Application of EBSD technique to analyze the microstructure and texture in Peridotites from Archipelago of São Pedro and São Paulo (PDF, HTML)
Pinto S. O.1, Lagoeiro L. E.1, Barbosa P. F.2, Simões L. A.3
1Federal University of Ouro Preto, 2Federal University of Minas Gerais, 3State University of Rio Claro

IT-4-P-3156 Microflow and Thermal Control System Design for Wet Cell in the Scanning Electron Microscope (PDF, HTML)
Lee H. H.1, Lee C. Y.1, Chiang C. L.1, Tsai K. C.1, Lin W. T.1, Wang H. W.1, Fang J. M.2, Huang T. W.3, Liu S. Y.3, Tsai C. Y.3, Chen F. R.3
1Center for Measurement Standards, Industrial Technology Research Institute, Taiwan R.O.C., 2Taiwan Electron Microscope Instrument Corporation, Taiwan R.O.C., 3Engineering and System Science Department, National Tsing Hua University, Taiwan R.O.C.

IT-4-P-3166 Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope (PDF, HTML)
Mitsche S.1, Poelt P.1
1Graz University of Technology, Institute for Electron Microscopy and Nanoanalysis, Steyrergasse 17, 8010 Graz, Austria

IT-4-P-3232 PERFORMANCE OF YAG:Ce SCINTILLATORS FOR LOW-ENERGY ELECTRON DETECTORS IN S(T)EM (PDF, HTML)
Lalinsky O.1, Bok J.1, Schauer P.1, Frank L.1
1Institute of Scientific Instruments of the ASCR, Brno, Czech Republic

IT-4-P-3358 Characterization of β-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques (PDF, HTML)
Ligas A.1, Hida S.2, Matsuda K.3, Mikmeková Š.1
1Institute of Scientific Instruments of the ASCR, v.v.i., Czech Republic, 2Graduate School for Science & Engineering for Education, University of Toyama, Japan, 3Graduate School for Science & Engineering for Research, University of Toyama, Japan

IT-4-P-3491 Application of Ultra Low Voltage Secondary and Backscatter Imaging in FE-SEM for Imaging of Nanomaterials (PDF, HTML)
Erdman N.1, Robertson V.1, Shibata M.1
1JEOL USA Inc

IT-4-P-5734 Palynomorphology of Dianthus petraeus (Caryophyllaceae) (PDF, HTML)
Mačukanović-Jocić M.1, Jarić S.2
1Faculty of Agriculture, University of Belgrade, 11080 Belgrade-Zemun, Serbia, 2Department of Ecology, Institute for Biological Research ‘Siniša Stanković’, University of Belgrade, 11060 Belgrade, Serbia

IT-4-P-5765 E-BEAM CROSSLINKING AND THERMAL DEGRADATION OF HYDROGEL UNDER ELECTRON MICROSCOPE (PDF, HTML)
Wong Y. H.1, Kuo C. H.1, Huang T. W.1, Liu S. Y.1, Hsieh H. Y.23, Chen F. R.1, Tseng F. G.14
1Department of Engineering and System Science, National Tsing Hua University, TAIWAN, 2Department of Mechanical Engineering, National Taiwan University, TAIWAN, 3Institute of NanoEngineering and MicroSystems, National Tsing Hua University, TAIWAN, 4Division of Mechanics, Research Center for Applied Science, Academia Sinica, TAIWAN

IT-4-P-5785 Time-Resolved Electron Beam Induced Current (TREBIC) Method for Spatiotemporal Analysis of GaN HFETs Structures. (PDF, HTML)
Šatka A.1, Priesol J.1, Donoval D.1, Uherek F.1
1Institute of Electronics and Photonics, Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia, 2International Laser Centre, Ilkovicova 3 841 04 Bratislava 4 Slovak Republic

IT-4-P-5814 Development of "Adaptive SEM" Technology for in situ Genome/Proteome Expression Analysis in Single Cell Level (PDF, HTML)
Kim H.1, Terazono H.1,2, Takei H.1,3, Yasuda K.1,2
1Kanagawa Academy of Science and Technology, Kanagawa, Japan, 2Institute of Biomaterials and Bioengineering, Tokyo Medical and Dental University, Tokyo, Japan, 3Department of Life Sciences, Faculty of Life Sciences, Toyo University, Gunma, Japan

IT-4-P-5889 Microflow and Thermal Control System Design for Wet Cell in the Scanning Electron Microscope (PDF, HTML)
Lee H. H.1, Lee C. Y.1, Chiang C. L.1, Tsai K. C.1, Lin W. T.1, Wang H. W.1, Fang J. M.2, Huang T. W.3, Liu S. Y.3, Tsai C. Y.3, Chen F. R.3
1Center for Measurement Standards, Industrial Technology Research Institute, Taiwan R.O.C., 2Taiwan Electron Microscope Instrument Corporation, Taiwan R.O.C., 3Engineering and System Science Department, National Tsing Hua University, Taiwan R.O.C.

IT-4-P-5937 New scintillation low-energy BSE detector (PDF, HTML)
Kološová J.1, Beránek J.1, Jiruše J.1, Horodyský P.2
1TESCAN Brno, s.r.o., Brno, Czech Republic , 2CRYTUR, spol. s r.o., Turnov, Czech Republic

IT-4-P-5966 Effect of hydroquinone treatment on OTO en bloc stained biological specimens. (PDF, HTML)
Togo A.1, Higashi R.1, Ohta K.2, Nakamura K.2
1Kurume University School of Medicine EM LAB, 2Kurume University School of Medicine Department of Anatomy

IT-4-P-6025 Two customized low-cost systems for STEM in SEM microscopy (PDF, HTML)
Caciagli A.1,2, Tessarolo F.1,3, Piccoli F.2,4, Caola I.2,4, Nollo G.1,3, Caciagli P.4
11) Department of Industrial Engineering, University of Trento, via delle Regole 101, 38123 Mattarello Trento, Italy , 22) Section of Electron Microscopy, Azienda Provinciale per i Servizi Sanitari di Trento, via Degasperi 79, 38123 Trento, Italy, 33) Healthcare Research and Innovation Program, Bruno Kessler Foundation, Via Sommarive 18, 38123 Povo Trento, Italy , 44) Department of Medicine Laboratory, Azienda Provinciale per i Servizi Sanitari di Trento, via Degasperi 79, 38123 Trento, Italy

IT-4-P-6037 BASE – a web based, open source solution for microscope reservation and accounting (PDF, HTML)
Iwan H.1, Timmermann J.1, Ritter M.1
1Hamburg University of Technology

IT-4-P-6044 Energy filtered imaging in a scanning electron microscope (PDF, HTML)
Boese M.1
1ZEISS Microscopy, Oberkochen, Germany

IT-5-IN-1534 Can orbitals be mapped in the TEM? (PDF, HTML)
Löffler S.1,2, Bugnet M.3, Gauquelin N.3, Hambach R.4, Lazar S.3,5, Pardini L.6, Draxl C.6, Kaiser U.4, Botton G. A.3, Schattschneider P.1,2
1Institute of Solid State Physics, Vienna University of Technology, Austria, 2University Service Centre for Transmission Electron Microscopy, Vienna University of Technology, Austria, 3Canadian Centre for Electron Microscopy, McMaster University, Canada, 4Electron Microscopy Group of Materials Science, Ulm University, Germany, 5FEI Electron Optics, Eindhoven, Netherlands, 6Department of Physics, Humboldt University Berlin, Germany

IT-5-IN-1656 Single atom imaging and spectroscopy with aberration-corrected STEM (PDF, HTML)
Zhou W.1, Lupini A. R.1, Kapetanakis M. D.2,1, Lee J.3, Oxley M. P.2,1, Prange M. P.2,1, Pantelides S. T.2,1, Idrobo J. C.3, Pennycook S. J.4
1Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA, 2Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235, USA, 3Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA, 4Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA

IT-5-IN-5756 Advancing the spectroscopic frontiers of STEM (PDF, HTML)
Stephan O.1, Arenal R.2, Bocher L.1, Bourrellier R.1, Colliex C.1, Gloter A.1, Kociak M.1, Losquin A.1, March K.1, Marinova M.1,3, Tararan A.1, Tencé M.1, Tizei L.1,4, Zobelli A.1
1LPS, UMR8502 CNRS, Université Paris-Sud, Orsay, France, 2LMA, INA, Universidad de Zaragoza, Zaragoza, Spain, 3UMET, Université Lille1, Villeneuve d'Ascq, France, 4AIST, Tsukuba, Japan

IT-5-O-1510 Quantitative electron magnetic circular dichroic signals acquired by 1000 kV (S)TEM-EELS (PDF, HTML)
Tatsumi K.1, Kudo T.2, Muto S.1, Rusz J.3
1EcoTopcia Science Institute, Nagoya University, Nagoya 464-8603, Japan, 2Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan, 3Department of Physics and Astronomy, Uppsala University, Box 516, SE-75120 Uppsala, Sweden

IT-5-O-1642 Surface-plasmon-polariton coupling between adjacent submicron slits in a Au-film investigated by STEM-EELS (PDF, HTML)
Fritz S.1, Walther R.1, Schneider R.1, Gerthsen D.1, Matyssek C.2, Busch K.2,3, Maniv T.4, Cohen H.5
1Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), Karlsruhe, Germany, 2Humboldt-Universität zu Berlin, Institut für Physik, AG Theoretische Optik & Photonik, Berlin, Germany, 3Max-Born-Institut, Berlin, Germany, 4Schulich Faculty of Chemistry, Technion – Israel Institute of Technology, Haifa, Israel, 5Department of Chemical Research Support, Weizmann Institute of Science, Rehovot, Israel

IT-5-O-1653 New EM signals made accessible by sub-20 meV resolution EELS (PDF, HTML)
Křivánek O. L.1, Lovejoy T. C.1, Aoki T.2, Crozier P. A.2, Rez P.3, Egerton R. F.4, Dellby N.1
1Nion Co., 1102 Eight St, Kirkland, WA 98033, USA, 2Center for Solid State Science, Arizona State University, Tempe, AZ 85287, USA, 3Department of Physics, Arizona State University, Tempe, AZ 85287, USA, 4Department of Physics, University of Alberta, Edmonton T6G 2E1, Canada

IT-5-O-1665 Atom-by-atom chemical imaging of topological insulator nanostructures by ChemiSTEM (PDF, HTML)
Jiang Y.1, Wang Y.1, Zhang Z.1
1Center of Electron Microscopy and State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou, China

IT-5-O-1718   Towards Quantitative EDX Results in 3 Dimensions. (PDF, HTML)
Goris B.1, Freitag B.2, Zanaga D.1, Bladt E.1, Altantzis T.1, Sudfeld D.2, Bals S.1
1EMAT, University of Antwerp, Antwerp, Belgium , 2FEI Company, P.O. Box 80066, KA 5600 Eindhoven, The Netherlands

IT-5-O-1775 Study of layer by layer graphitization of 4H-SiC, through atomic-EELS at low energy (PDF, HTML)
Nicotra G.1, Deretzis I.1, Ramasse Q.2, Longo P.3, Scuderi M.1, Twesten R. D.3, La Magna A.1, Giannazzo F.1, Spinella C.1
1CNR-IMM, Strada VIII, 5, 95121 Catania, Italy, 2SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury WA4 4AD, United Kingdom, 3Gatan, Inc., 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA

IT-5-O-1847 Atomic resolution mapping of localized excitations using STEM-EELS spectroscopy (PDF, HTML)
Gauquelin N.1, Egoavil R.1, Martinez G. T.1, Van Aert S.1, Van Tendeloo G.1, Verbeeck J.1
1EMAT,University of Antwerp, B2020 Antwerp, Belgium

IT-5-O-1860 Nanocharacterisation of vanadium and niobium carbide and carbonitrides precipitates in austenite high manganese steels with DualEELS and HAADF techniques (PDF, HTML)
Bobynko J.1, MacLaren I.1, Craven A. J.1, McGrouther D.1, Paul G.2
1Kelvin Nanocharacterisation Centre, SUPA School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK, 2ThyssenKrupp Steel Europe AG, Research and Development, FuE-E Modelling and Simulation, Kaiser-Wilhelm-Straße 100, 47166 Duisburg, Germany

IT-5-O-1900 Calculation and Measurements of XEDS Collection Solid Angle in the AEM (PDF, HTML)
Zaluzec N. J.1
1Electron Microscopy Center, Argonne National Laboratory, Argonne IL, USA

IT-5-O-1937 In situ observation of symmetry and bond length induced ELNES changes of the CaCO3 to CaO phase transformation by in-column energy-filtered low-kV TEM (PDF, HTML)
Golla-Schindler U.1, Klingl T.1, Kinyanju M. K.1, Benner G.2, Orchowski A.2, Kaiser U.1
1Group of Electron Microscopy of Material Science,Ulm , Germany, 2 Carl Zeiss Microscopy GmbH, Oberkochen, Germany

IT-5-O-2005 Electron energy losses and cathodoluminescence from complex plasmonic nanostructures : spectra, maps and CL radiation patterns from a generalized field propagator (PDF, HTML)
Arbouet A.1, Mlayah A.1, Girard C.1, Colas des Francs G.2
1CEMES-CNRS, Université de Toulouse, 29 Rue Jeanne Marvig, 31055 TOULOUSE FRANCE EU, 2Laboratoire Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, Université de Bourgogne, 9 Avenue Savary, BP 47870, 21078 Dijon Cedex, France

IT-5-O-2070 Electron impact investigation of void plasmon ring resonators (PDF, HTML)
Talebi N.1, Ögüt B.1, Sigle W.1, Vogelgesang R.2, van Aken P. A.1
1Max Planck Institute for Intelligent Systems, Heisenbergstr. 3, 70569 Stuttgart, Germany, 2University of Oldenburg, Oldenburg, Ammerländer Heerstr. 114-118, 26129, Germany

IT-5-O-2097 Characterization of hybrid plasmonic waveguide by dispersion measurement (PDF, HTML)
Saito H.1, Kurata H.1
1Institute for Chemical Research, Kyoto University

IT-5-O-2167 Electro-optical characterization of single InGaN/GaN core-shell LEDs inside an SEM (PDF, HTML)
Ledig J.1, Scholz G.1, Popp M.1, Steib F.1, Fahl A.1, Wang X.1, Hartmann J.1, Mandl M.1,2, Schimpke T.1,2, Strassburg M.2, Wehmann H. H.1, Waag A.1
1Institut für Halbleitertechnik, Technische Universität Braunschweig, Hans-Sommer-Str. 66, 38106 Braunschweig, Germany, 2OSRAM Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

IT-5-O-2181 Probing Near Fields of Nanoparticle Surface Plasmons with Electron Energy Loss Spectroscopy (PDF, HTML)
Collins S. M.1, Nicoletti O.1, Ostasevicius T.1, Rossouw D.2, Duchamp M.3, Botton G. A.2, Midgley P. A.1
1Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK, 2Department of Materials Science and Engineering, McMaster University, Hamilton, Canada, 3Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, Jülich, Germany

IT-5-O-2490 Single Eu atom M shell spectroscopy and X-ray fluorescence yield (PDF, HTML)
G Tizei L. H.1, Nakanishi R.2, Kitaura R.2, Shinohara H.2, Suenaga K.1
1Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan, 2Department of Chemistry, Nagoya University, Nagoya 468-8602, Japan

IT-5-O-2552 Imaging and X-Ray Microanalysis at the Nanoscale with a Cold-Field Emission Scanning Electron Microscope (PDF, HTML)
Gauvin R.1, Brodusch N.1, Demers H.1, Woo P.2
1Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, 2Hitachi High-Technologies Canada Inc., Toronto, Canada

IT-5-O-2673 Probing the electronic structure of functional oxides with high energy resolution EELS (PDF, HTML)
Bugnet M.1, Rossouw D.1,2, Liu H.1, Radtke G.3, Botton G. A.1
1Materials Science and Engineering, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4L7, Canada, 2Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, United-Kingdom., 3IMPMC-CNRS, UMR 7590, Université Pierre et Marie Curie-Paris 6, Campus Jussieu, 4 place Jussieu, F-75252 Paris Cedex 05, France

IT-5-O-2679 Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS (PDF, HTML)
Crozier P. A.1, Zhu J.1, Aoki T.2, Rez P.3, Bowman W. J.1, Carpenter R. W.2, Krivanek O. L.4, Dellby N.4, Lovejoy T. C.4, Egerton R. F.5
1School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287, USA , 2LeRoy Erying Center for Solid State Science, Arizona State University, Tempe, AZ 85287, USA , 3Department of Physics, ASU, Tempe, AZ 85287, USA, 4Nion Co., 1102 8th St, Kirkland, WA 98033, USA, 5Department of Physics, University of Alberta, Edmonton T6G 2E1, Canada

IT-5-O-2752 FIB-SEM Instrument with Integrated Raman Spectroscopy, Scanning Probe Microscopy and Secondary Ion Mass Spectroscopy (PDF, HTML)
Jiruše J.1, Haničinec M.1, Havelka M.1, Hollricher O.2, Schaff O.3, Oestlund F.4, Whitby J.5, Michler J.5
1TESCAN Brno, s.r.o, Brno, Czech Republic , 2WITec GmbH, Ulm, Germany, 3SPECS Surface Nano Analysis GmbH, Berlin, Germany, 4TOFWERK AG, Thun, Switzerland, 5EMPA - Materials Science & Technology, Thun, Switzerland

IT-5-O-2917 Full Optical Properties of Carbonaceous Aerosols by Very High Energy Resolution Electron Energy-loss Spectroscopy (PDF, HTML)
Zhu J.1, 2, Crozier P. A.1, Aoki T.2, Anderson J. R.1
1School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA, 2LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe, AZ, USA

IT-5-O-2999 Direct observations of local electronic states in a quasicrystal by STEM-EELS (PDF, HTML)
Seki T.1, Abe E.1
1University of Tokyo, Tokyo, Japan

IT-5-O-3107 Luminescence of structural defects in opto-electronic materials studied by CL-STEM (PDF, HTML)
Perillat-Merceroz G.1, Alexander D. T.2, Zamani R. R.3, Arbiol J.3, Stadelmann P.2, Grandjean N.1, Hébert C.2
1Laboratory of Advanced Semiconductors for Photonics and Electronics (LASPE), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland, 2Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland, 3Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Barcelona, CAT, Spain

IT-5-O-3165 3D EDX in SEM and TEM: common problems and common solutions (PDF, HTML)
Burdet P.1, Croxall S. A.1, de la Peña F.1, Rossouw D.1, Midgley P. A.1
1Department of Materials Science & Metallurgy, University of Cambridge, Cambridge, UK

IT-5-O-3209 Oxygen Vacancies at Grain Boundaries in Doubly-Doped Ceria Determined using EELS (PDF, HTML)
Bowman W. J.1, Zhu J.1, Hussaini Z.1, Crozier A. P.1
1Arizona State University

IT-5-O-3427 Elastic scattering of atomic-size electron probes carrying orbital angular momentum in aberration-corrected scanning transmission electron microscopy (PDF, HTML)
Idrobo J. C.1
1Oak Ridge National Laboratory

IT-5-P-1533 Characterization of EDS Systems with respect to the Geometrical Collection Efficiency (PDF, HTML)
Terborg R.1, Hodoroaba V. D.2, Falke M.1, Käppel A.1
1Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany, 2BAM Federal Institute for Materials Research and Testing, 12200 Berlin, Germany

IT-5-P-1543 Optimizing spatial and energy resolution in the TEM at low dose - Lateral Resolved EELS of organic bulk heterojunctions (PDF, HTML)
Kast A. K.1,2, Oster M.1, Pfannmöller M.1,3, Benner G.4, Kowalsky W.2,5, Schröder R. R.1,2,6
1CryoEM, CellNetworks, Universitätsklinikum Heidelberg, Germany, 2InnovationLab GmbH, Heidelberg, Germany, 3EMAT, Antwerp, Belgium, 4Carl Zeiss Microscopy GmbH, Oberkochen, Germany, 5Institut für Hochfrequenztechnik, TU Braunschweig, Germany, 6Center for Advanced Materials, Universität Heidelberg, Germany

IT-5-P-1605 Comparisons on Energy and Wavelength Dispersive X-Ray Spectrometry Microanalytical Results: First Approach Based on Iron Ore Sinter Phases (PDF, HTML)
Magalhaes M. S.1,2, Figueiredo e Silva R. C.1,3, Balzuweit K.1,4, Moreira B. B.1, Garcia L. R.5, Persiano A. C.4,5
1Center of Microscopy – Federal University of Minas Gerais (UFMG), 2Consulting & Research , 3Institute of Geosciences - UFMG, 4Department of Physics - UFMG, 5Microanalyses Laboratory of Department of Physics – UFMG

IT-5-P-1618 Magnified pseudo atomic column elemental maps realized by STEM moiré method (PDF, HTML)
Okunishi E.1, Kondo Y.1
1EM Business Unit, JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan.

IT-5-P-1630 How to Avoid Unexpected Artifacts from Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets (PDF, HTML)
Ishizuka K.1, Watanabe M.2
1HREM Research Inc., Higashimatsuyama, Japan, 2Dept of Materials Science and Engineering, Lehigh University, Bethlehem, USA

IT-5-P-1706 Formation of oxidatively stable M@Fe3O4 and MPt@Fe3O4 (M = Fe, Co) core@shell nanoparticles using a simple and versatile synthetic procedure (PDF, HTML)
Knappett B. R.1, Gontard L. C.2, Ringe E.1, Tait E. W.1, Fernandéz A.2, Wheatley A. E.1
1University of Cambridge, 2Instituto de Ciencia de Materiales de Sevilla

IT-5-P-1713 Detection and quantification of phosphorus dopants in germanium by energy dispersive spectrometry using an annular detector with large solid angle (PDF, HTML)
Robin E.1, Mollard N.1, Guilloy K.1, Pauc N.1
1CEA-INAC, Grenoble, France

IT-5-P-1781 Effect of the asymmetry of dynamical electron diffraction on intensity of acquired EMCD signals (PDF, HTML)
Song D. S.1, Wang Z. Q.1, Zhu J.1
1National Center for Electron Microscopy in Beijing, School of Material Science & Engineering, Tsinghua University, Beijing 100084, China

IT-5-P-1792 Spatial and Temporal Coherences in Spin-Polarized Transmission Electron Microscopy (PDF, HTML)
Kuwahara M.1, Kusunoki S.1, Nambo Y.1, Saitoh K.2, Ujihara T.1, Asano H.1, Takeda Y.3, Tanaka N.2
1Graduate school of Engineering, Nagoya University Nagoya, 464-8603, Japan, 2EcoTopia Science Institute, Nagoya University, Nagoya 464-8603, Japan, 3Nagoya Industrial Science Research Institute, Nagoya 464-0819, Japan

IT-5-P-1793 Measurement of liquid vibrational spectra using monochromated STEM-EELS (PDF, HTML)
Miyata T.1,2, Fukuyama M.1,3, Hibara A.3, Ikuhara Y.2,4, Okunishi E.5, Mukai M.5, Mizoguchi T.1
1Institute of Industrial Science, the University of Tokyo, Tokyo, Japan, 2School of Engineering, the University of Tokyo, Tokyo, Japan, 3School of Science, Tokyo Institute of Technology, Tokyo, Japan, 4Japan Fine Ceramics Center, Aichi, Japan, 5JEOL Ltd., Tokyo, Japan

IT-5-P-1811 Features and Applications of an Analysis System using Double Silicon Drift-type Detectors for Transmission Electron Microscopy (PDF, HTML)
Ohnishi I.1, Kawai S.1, Ishikawa T.1, Yagi K.1, Iwama T.1, Miyatake K.1, Iwasawa Y.1, Matsushita M.1, Kaneyama T.1, Kondo Y.1
1JEOL Ltd., Tokyo, Japan

IT-5-P-1826 Orientational dependence of EMCD signals of hcp Co with strong magnetocrsytalline anisotropy (PDF, HTML)
Kudo T.1, Tatsumi K.2, Leifer K.3, Rusz J.4, Muto S.2
1Graduate School of engineering, Nagoya University, 2Eco Topia Science Institute, Nagoya University, 3Department of Engineering Science, Uppsala University, 4Department of Physics and Astronomy, Uppsala University

IT-5-P-1842 Advanced SEM/EDS analysis using an Annular Silicon Drift Detector (SDD): Applications in Nano, Life, Earth and Planetary Sciences below Micrometer Scale (PDF, HTML)
Salge T.1, Terborg R.1, Ball A. D.2, Broad G. R.2, Kearsley A. T.2, Jones C. G.2, Smith C.2, Rades S.3, Hodoroaba V. D.3
1Bruker Nano GmbH, Berlin, Germany, 2Natural History Museum, London, United Kingdom, 3BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, Berlin, Germany

IT-5-P-1944 Planer defect structure analysis based on electron channeling phenomena (PDF, HTML)
Ichikawa T.1, Ohtsuka M.1, Muto S.2
1Nagoya University, Nagoya, Japan, 2EcoTopia Science Institute, Nagoya, Japan

IT-5-P-1976 EELS of Si-nanocrystals by hyperspectral segmentation and multivariate factorization. (PDF, HTML)
Eljarrat A.1, López-Conesa L.1, López-Vidrier J.1, Hernández S.1, Estradé S.1, 2, Magén C.3,4, Garrido B.1, Peiró F.1
1MIND-IN2UB, Departament d'Electrònica, Universitat de Barcelona, c/ Martí i Franqués 1, 08028 Barcelona, Spain., 2TEM-MAT, Centres Científics i Tecnològics (CCiT), Universitat de Barcelona, Solís Sabarís 1, Barcelona, Spain., 3LMA-INA, Departamento de Física de la Materia Condensada, Universidad de Zaragoza, 50018 Zaragoza, Spain., 4Fundación ARAID, 50018 Zaragoza, Spain.

IT-5-P-1978 Plasmon and dielectric function mapping of multiple InGaN QW sample by HAADF-EELS. (PDF, HTML)
Eljarrat A.1, López-Conesa L.1, Magén C.2,3, García-Lepetit N.4, Gačević Ž.4, Calleja E.4, Estradé S.1,2, Peiró F.1
1LENS-MIND-IN2UB, Departament d'Electrònica, Universitat de Barcelona, c/ Martí i Franqués 1, 08028 Barcelona, Spain., 2LMA-INA, Departamento de Física de la Materia Condensada, Universidad de Zaragoza, 50018 Zaragoza, Spain., 3Fundación ARAID, 50018 Zaragoza, Spain., 4TEM-MAT, Centres Científics i Tecnològics (CCiT), Universitat de Barcelona, Solís Sabarís 1, Barcelona, Spain., 5ISOM, Universidad Politécnica de Madrid, Ciudad Universitaria s/n, 28040 Madrid, Spain

IT-5-P-1986 Advantages of FEG-EPMA for Microphase Analysis in Nuclear Materials (PDF, HTML)
BRACKX E.1, NONNET H.2, HOMBOURGER C.3, ALLEGRI P.1, DUGNE O.1
11 CEA, DEN, DTEC, SGCS, LMAC, Marcoule, 30207 Bagnols sur Cèze, France, 22 CEA, MAR, DTCD, SECM, LDMC, Marcoule, 30207 Bagnols sur Cèze, France, 33 CAMECA, 29 Quai des Grésillons, 92622 Gennevilliers, France

IT-5-P-1995 EDS Element Analysis with High Count Rates (PDF, HTML)
Eggert F.1
1EDAX Inc., AMETEK Materials Analysis Division, Mahwah NJ, USA

IT-5-P-2062 Nanoscale Luminescence Mapping of InGaN/GaN Multiple Quantum Dot Doped Nanowire LEDs with Scanning Transmission Electron Microscopy (PDF, HTML)
Woo S. Y.1, Kociak M.2, Nguyen H. P.3, Mi Z.3, Botton G. A.1
1Department of Materials Science & Engineering, Brockhouse Institute for Materials Research, and Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada, 2Laboratoire de Physique des Solides, Université Paris-Sud XI, Orsay, France, 3Department of Electrical & Computer Engineering, McGill University, Montreal, QC, Canada

IT-5-P-2077 Application of Energy Filtering in STEM (EFSTEM) mode for Mapping of Elements and Chemical Bindings (PDF, HTML)
Muehle U.1, Gluch J.1,2, Zschech E.1,3
1Fraunhofer Institute for Ceramic Technologies and Systems - Materials Diagnostics (IKTS-MD), Maria-Reiche-Str. 2, 01109 Dresden, Germany, 2Institute for Materials Science, TU Dresden, 01062 Dresden, Germany, 3Dresden Center for Nanoanalysis (DCN), TU Dresden, 01062 Dresden, Germany

IT-5-P-2130 Plasmon Mapping in Au@Ag Nanocube and their assemblies (PDF, HTML)
Goris B.1, Guzzinati G.1, Fernández-López C.2, Pérez-Juste J.2, Liz-Marzán L. M.2,3,4, Trügler A.5, Hohenester U.5, Verbeeck J.1, Bals S.1, Van Tendeloo G.1
1EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium, 2Departamento de Química Física, Universidade de Vigo, 36310 Vigo, Spain, 3BioNanoPlasmonics Laboratory, CIC biomaGUNE, Paseo de Miramón 182, 20009 Donostia , San Sebastián, Spain, 4Ikerbasque, Basque Foundation for Science, 48011 Bilbao, Spain, 5Institut für Physik, Karl-Franzens-Universität Graz, Universitätsplatz 5, 8010 Graz, Austria

IT-5-P-2151 Non-stoichiometry and order-disorder in the SbxV1-xO2 (0<x<0.5) solid solution (PDF, HTML)
Landa-Cánovas A. R.1, Vilanova-Martínez P.1, Agulló-Rueda F.1, Hernández-Velasco J.1
1Instituto de Ciencia de Materiales de Madrid, ICMM-CSIC. Sor Juana Inés de la Cruz, 3; 28049 Madrid, Spain

IT-5-P-2159 Developments in FESTEM & EDS for the Characterisation of Dopant Distributions within Advanced Semiconductors (PDF, HTML)
Dijkstra H.1, Thompson K.1, Stephens C. J.1
1ThermoFisher Scientific

IT-5-P-2163 An ELNES study of anisotropic materials using variable beam energies (PDF, HTML)
Stöger-Pollach M.1, Hetaba W.1, Rodemeier R.2
1USTEM, TU Vienna, Vienna, Austria, 2GATAN GmbH, München, Germany

IT-5-P-2169 QW emission shift along single InGaN/GaN core-shell LEDs evaluated by monochromatic cathodoluminescence image series (PDF, HTML)
Ledig J.1, Fahl A.1, Popp M.1, Scholz G.1, Steib F.1, Wang X.1, Hartmann J.1, Mandl M.1,2, Schimpke T.1,2, Strassburg M.2, Wehmann H. H.1, Waag A.1
1Institut für Halbleitertechnik, Technische Universität Braunschweig, Hans-Sommer-Str. 66, 38106 Braunschweig, Germany, 2OSRAM Opto Semiconductors GmbH, Leibnizstr. 4, 93055 Regensburg, Germany

IT-5-P-2232 Distinguishing overlapping EMCD signals on oxidized metals in the TEM (PDF, HTML)
Thersleff T.1, Rusz J.2, Rubino S.5, Hjörvarsson B.2, Ito Y.3, Zaluzec N. J.4, Leifer K.1
1Department of Engineering Sciences, Uppsala University, Uppsala, Sweden, 2Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden, 3Department of Physics, Northern Illinois University, DeKalb, IL, USA, 4Electron Microscopy Center, Argonne National Laboratory, Argonne, IL, USA, 5Department of Physics, University of Oslo, Oslo, Norway

IT-5-P-2235 The Use ofVery Large Area Detectors for fast Light Element Mapping and Data Acquisition in STEM (PDF, HTML)
Rowlands N.1, Phillips P.2, Bhadare S.3, Klie R.2, Nicholls A.2
1Oxford Instruments NanoAnalysis, Concord, USA, 2University of Illinois, Chicago, USA, 3Oxford Instruments NanoAnalysis, High Wycombe, UK

IT-5-P-2281 Spatially resolved EELS with an in-column Omega filter - characterization of energy filter aberrations and their correction by image processing (PDF, HTML)
Entrup M.1, Kohl H.1
1Physikalisches Institut und Interdisziplinäres Centrum für Elektronenmikroskopie und Mikroanalyse (ICEM), WWU Münster, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany

IT-5-P-2311 Characterising severe plastic deformation: a quantitative assessment of TEM imaging using transmission Kikuchi diffraction in the SEM (PDF, HTML)
Trimby P. W.1, Xia J. H.2, Sha G.2, Schmidt N. H.3, Sitzman S.3, Tort M.4, Xia K.4, Ringer S. P.1,2
1The Australian Centre for Microscopy & Microanalysis, The University of Sydney, NSW 2006, Australia , 2School of Aerospace, Mechanical & Mechatronic Engineering, ARC Centre of Excellence for Design in Light Metals, The University of Sydney, NSW 2006, Australia, 3Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, Bucks, HP12 3SE, United Kingdom , 4Department of Mechanical Engineering, The University of Melbourne, VIC 3010, Australia

IT-5-P-2324 Band gap measurements of ultra thin buried films using conical darkfield EFTEM and low voltage EFTEM (PDF, HTML)
Stöger-Pollach M.1, Biedermann K.2, Beyer V.2
1USTEM, TU Vienna, Vienna Austria, 2Fraunhofer IPMS-CNT, Dresden, Germany

IT-5-P-2335 WDX-measurement of Ta-, W- and Re-concentration profiles in a Nickel/Superalloy diffusion couple using Lβ-X-ray-lines (PDF, HTML)
Nissen J.1, Berger D.1, Epishin A.2, Link T.2
1Technical University Berlin, Center for Electron Microscopy (ZELMI), Straße des 17. Juni 135, 10623 Berlin, Germany, 2Technical University Berlin, Institute of Material Science, Ernst-Reuter- Platz 1, 10587 Berlin, Germany

IT-5-P-2350 Momentum-resolved electron energy-loss spectroscopy of MoS2 and graphene heterostructures (PDF, HTML)
Mohn M.1, Hambach R.1, Wachsmuth P.1, Benner G.2, Kaiser U.1
1Electron Microscopy Group of Materials Science, Ulm University, Ulm, Germany, 2Carl Zeiss Microscopy GmbH, Oberkochen, Germany

IT-5-P-2395 Toward X-ray Quantitative Microanalysis Maps with an Annular Silicon Drift Detector (PDF, HTML)
Demers H.1, Brodusch N.1, Woo P.2, Gauvin R.1
1Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada., 2Hitachi High-Technologies Canada Inc., Toronto, Canada.

IT-5-P-2428 Obtaining an accurate quantification of light elements by EDX: K-factors vs. Zeta-factors (PDF, HTML)
Lopez-Haro M.1,3, Bayle-Guillemaud P.1, Mollard N.1, Saint-Antonin F.2, van Vilsteren C.3, Freitag B.3, Robin E.1
1CEA, INAC/UJF-Grenoble 1, UMR-E, SP2M, LEMMA, Minatec, 38054 Grenoble Cedex 9, France, 2CEA, LITE-DTNM, L2N, 38054 Grenoble Cedex 9, France, 3FEI Company, P.O. Box 80066, KA 5600 Eindhoven, The Netherlands.

IT-5-P-2431 Experimental detection of the Čerenkov limit in Si, GaAs and GaP (PDF, HTML)
Horák M.1, Stöger-Pollach M.2
1Institute of Physical Engineering, Brno University of Technology, Brno, Czech Republic, 2USTEM, TU Vienna, Vienna, Austria

IT-5-P-2448 A simple EDXperformance test for transmission electron microscopy (PDF, HTML)
Van Cappellen E.1, Porcu M.2, Delille D.2, Sudfeld D.2
1FEI Company, Hillsboro, USA, 2FEI Company, Acht, The Netherlands

IT-5-P-2506 Dynamic, Analytical EDX studies of B/Ni composite nanowires with MEMS heating holder (PDF, HTML)
Sudfeld D.1, Lourie O.1, Mele L.1, Dona P.1, Konings S.1, Delille D.1, Van Cappellen E.2, Barton B.1, Jinschek J. R.1, Freitag B.1
1FEI Electron Optics B. V., 5651 GG Eindhoven, The Netherlands, 2FEI Company, 5350 NE Dawson Creek Drive, Hillsboro, OR 97124, USA

IT-5-P-2551 Quantitative X-Ray Microanalysis in the Scanning and Transmission Electron Microscopes with the Generalized f-Ratio Method (PDF, HTML)
Demers H.1, Brodusch N.1, Trudeau M.2, Gauvin R.1
1Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, 2Materials Science, Hydro-Québec Research Institute, Varennes, Québec, Canada

IT-5-P-2570 Orbital ordering of A-site ordered SmBaMn2O6 studied by inelastic scattering accampanied by Mn-L shell excitation (PDF, HTML)
Saitoh K.1, Toake Y.2, Tanaka N.1, Takenaka K.3
1EcoTopia Science Institute, Nagoya University, 2Department of Crystalline Materials Science, Nagoya University, 3Department of Applied Physics, Nagoya University

IT-5-P-2665 Electron energy-loss mapping of a perovskite-based solar cell (PDF, HTML)
Divitini G.1, Peng X.1, de la Peña F.1, Saliba M.2, Snaith H. J.2, Ducati C.1
1University of Cambridge, 2University of Oxford

IT-5-P-2705 Simultaneous panchromatic and color live cathodoluminescence imaging (PDF, HTML)
Kološová J.1, Jiruše J.1
1TESCAN Brno, s.r.o., Brno, Czech Republic

IT-5-P-2719 Development of an Analytical TEM with a Transition-Edge Sensor type Microcalorimeter EDS detector (PDF, HTML)
Hara T.1, Tanaka K.2, Maehata K.3, Mitsuda K.4, Yamasaki Y. Y.4, Yamanaka Y.5
1National Institute for Materials Science, Tsukuba, Ibaraki, Japan, 2Hitachi High-tech Science, Corp., Hitachi High-Tech Science, Corp., Oyama-cho, Shizuoka, Japan, 3Kyushu University, Fukuoka, Fukuoka, Japan, 4Japan Aerospace Exploration Agency, Sagamihara, Kanagawa, Japan, 5Taiyo Nippon Sanso Corp., Tsukuba, Ibaraki, Japan

IT-5-P-2735 Quantitative Position-Averaged Core-Loss Scattering in STEM (PDF, HTML)
Zhu Y.1, Dwyer C.2
1Monash Centre for Electron Microscopy (MCEM) and Department of Materials Engineering, Monash University, VIC 3800, Australia, 2Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, and Peter Grunberg Institute, Forschungszentrum Julich, D-52425 Julich, Germany

IT-5-P-2785 Implementation of the Zeta-factor method for quantitative EDS (PDF, HTML)
Falke M.1, Kaeppel A.1, Nemeth I.1, Terborg R.1
1Bruker Nano GmbH, Berlin, Germany

IT-5-P-2909 Advantages of Combining EDS and Energy Filtered STEM Diffraction at Atomic Level (PDF, HTML)
Longo P.1, Aitouchen A.1, Rice P.2, Topuria T.2, Twesten R. D.1
1Gatan Inc., Pleasanton CA, USA, 2IBM Research Division, San Jose CA, USA

IT-5-P-2927 Evaluation of valence state in manganese oxide by transition edge x-ray sensor. (PDF, HTML)
Tanaka K.1,5, Ohgaki M.2,5, Miyayama M.3,5, Matsumura S.4
1Hitachi High-Tech Science Corporation, Shizuoka, Japan, 2Hitachi High-Tech Science Corporation, Tokyo, Japan, 3The University of Tokyo, Tokyo, Japan, 4Kyushu-University, Fukuoka, Japan, 5Japan Science and Technology Agency, CREST, Tokyo, Japan

IT-5-P-2960 Advanced EELS Spectrum Imaging of RRAM Devices: Chemical State and Three-Dimensional Element Mapping (PDF, HTML)
Chang M. T.1, Lo S. C.2, Hsieh C. Y.3
1Dept. of Electron Microscopy Development and Application, Material and Chemical Research Laboratories, Industrial Technology Research Institute (ITRI)

IT-5-P-2963 TEM-EELS/SXES studies on electronic structures of p-type CaB6 (PDF, HTML)
Terauchi M.1, Saito T.1, Sato Y.1, Inayoshi K.2, Takeda M.2
1IMRAM, Tohoku University, Sendai, Japan., 2Nagaoka University of Technology, Nagaoka, Japan

IT-5-P-2969 Valence Electron States of Carbon Materials studied by TEM-SXES (PDF, HTML)
Terauchi M.1
1IMRAM, Tohoku University, Sendai, Japan.

IT-5-P-2998 STEM EELS Analysis of 2D Layered Inorganic Materials at Atomic Resolution (PDF, HTML)
Nerl H. C.1, McGuire E. K.1, Backes C.2, Seral-Ascaso A.2, Ramasse Q.3, Houben L.4, Nicolosi V.1
1Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and Advanced Materials and Bio-Engineering Research (AMBER), Trinity College, Dublin, D2 Dublin, Ireland. , 2School of Physics, Trinity College, Dublin, D2 Dublin, Ireland. , 3SuperSTEM Laboratory, STFC Daresbury, United Kingdom., 4Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, Jülich, Germany., 5Advanced Materials and Bio-Engineering Research (AMBER), Trinity College, Dublin, D2 Dublin, Ireland.

IT-5-P-3086 On the usability of electron vortices as probes for atomic resolution EMCD experiments (PDF, HTML)
Pohl D.1, Schneider S.1, 2, Rusz J.3, Schultz L.1,2, Rellinghaus B.1
1IFW Dresden, P.O. Box 270116, D-01171 Dresden, Germany, 2TU Dresden, Institute for Solid State Physics, D-01062 Dresden, Germany, 3Uppsala University, Department of Physics and Astronomy, SE-752 37 Uppsala, Sweden

IT-5-P-3124 Core/shell structure in magnetic nanoparticles from HRTEM and EELS (PDF, HTML)
Bertoni G.1,2, López-Ortega A.3, Lottini E.3, Sangregorio C.3,4, Turner S.5, de Julián Fernández C.1,3, Salviati G.1
1CNR-IMEM, Parco Area delle Scienze 37/A, 43124 Parma, Italy, 2Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy, 3INSTM and Dipartimento di Chimica , 4CNR-ICCOM and INSTM Via Madonna del Piano 10, Sesto Fiorentino 50019 Firenze, Italy, 5EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium

IT-5-P-3210 Mapping SPR of Au metallic nano-objects with complex morphologies and environments (PDF, HTML)
Florea I.1,2, Arenal R.3,4, Tréguer-Delapierre M.5, Ihiawakrim D.1, Hirlimann C.1, Ersen O.1
1IPCMS,CNRS/UdS, 23 rue du Lœss, 67034, Strasbourg Cedex , 2LPICM,Ecole Polytechnique, Route de Saclay, 91128 Palaiseau Cedex, France, 3Fundacion ARAID, 50018 Zaragoza, Spain. , 4LMA, INA, Universidad de Zaragoza, 50018 Zaragoza, Spain., 5ICMCB, CNRS, Bordeaux University, 87 av. Dr. A. Schweitzer, Pessac F-33608, France

IT-5-P-3251 Parallel acquisition Auger electron spectroscopy (PDF, HTML)
Walker C. G.1, Zha X.2, El-Gomati M. M.1
11-Department of Electronics, University of York, Heslington, York, YO10 5DD., 2York Probe Sources Ltd, York, YO10 5DD

IT-5-P-3289 Ultra-Fast, High-Resolution Silicon Drift Detectors for Accurate EDS Microanalysis in Electron Microscopes (PDF, HTML)
Niculae A.1, Bornschlegl M.1, Eckhardt R.1, Herrmann J.1, Jeschke S.1, Krenz G.1, Liebel A.1, Lutz G.2, Soltau H.1, Strüder L.2
1PNDetector GmbH, 2PNSensor GmbH

IT-5-P-3319 Improvement of EFTEM acquisition and data processing using prior knowledge of camera DQE (PDF, HTML)
Lucas G.1, Hébert C.1
1Interdisciplinary Center for Electron Microscopy (CIME), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland

IT-5-P-3376 Comparison of the silicon/phosphorus ratio in natural and synthetic nagelschmidtite for possible use as standard for microanalysis based on X-ray lines of Si and P (PDF, HTML)
Walther T.1
1University of Sheffield

IT-5-P-3430 The “equivalent sphere” approach to fitting surface plasmon energy loss spectra (PDF, HTML)
Ostasevicius T.1, de la Peña F.1, Collins S. M.1, Ducati C.1, Midgley P. A.1
1Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK

IT-5-P-3513 Fabrication of High Energy Resolution Silicon Drift Detector for Energy Dispersive X-ray Spectrometer (PDF, HTML)
Hsu C. C.1, Tseng F. G.1, Chen F. R.1, Lee C. H.1, Chuang Y. J.2
1Department of Engineering and System Science, National Tsing Hua University, Hsinchu, Taiwan, 2Department of Biomedical Engineering, Ming Chuan University, Taipei, Taiwan

IT-5-P-5719 Major update of the EELS database: eelsdb.eu (PDF, HTML)
Lajaunie L.1, Ewels P.2, Sikora T.3, Serin V.4
1Institut des Matériaux Jean Rouxel, (IMN) – Université de Nantes, CNRS, 2 rue de la Houssinère - BP 32229, 44322 Nantes Cedex 3, France, 2Babraham Institute, Cambridge, UK, 3SAVANTIC AB, Rosenlundsgatan 50, 118 63 Stockholm, Sweden, 4CEMES, Université Toulouse 29 rue Jeanne Marvig BP 94347 31055 Toulouse, France

IT-5-P-5813 Spectrum-based phase mapping of apatite and zoned monazite grains using principal component analysis (PDF, HTML)
Seddio S. M.1
1Thermo Fisher Scientific, Madison, WI, USA.

IT-5-P-5816 Overcoming Quantitative Challenges Presented By X-Ray Line Interferences in EDS and WDS. (PDF, HTML)
Seddio S. M.1
1Thermo Fisher Scientific

IT-5-P-5821 Quantitative measurement of site-specific spin and orbital magnetic moments by electron energy-loss chiral magnetic dichroism (PDF, HTML)
Xiaoyan Zhong 1, Ziqiang Wang 1, Jing Zhu 1, Rong Yu 1, Zhiying Cheng 1
Beijing National Center for Electron Microscopy, School of Materials Science and Engineering, The State Key Laboratory of New Ceramics and Fine Processing, Laboratory of Advanced Materials (MOE), Tsinghua University, Beijing 100084, People’s Republic of China 1

IT-5-P-5868 Trends in X-ray Nano-Analysis by TEM/STEM (PDF, HTML)
von Harrach H. S.1
1SvH Microscopy, East Sussex, UK

IT-5-P-5871 Single atom Electron Energy Loss Spectroscopy at Low Primary Electron Energy in the Electron Microscope (PDF, HTML)
G Tizei L. H.1, Iizumi Y.1, Okazaki T.1, Nakanishi R.2, Kitaura R.2, Shinohara H.2, Suenaga K.1
1Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan, 2Department of Chemistry, Nagoya University, Nagoya 468-8602, Japan

IT-5-P-5918 Identifying suboxide grains at the metal-oxide interface of a corroded Zr-1.0Nb alloy using (S)TEM, transmission-EBSD and EELS (PDF, HTML)
Hu J.1, Garner A.2, Ni N.3, Gholinia A.2, Nicholls R.1, Lozano-Perez S.1, Frankel P.1, Preuss M.2, Grovenor C.1
1Department of Materials, Oxford University, Parks Road, Oxford, UK, 2Materials Performance Centre, School of Materials, University of Manchester, Manchester, UK, 3Department of Materials, Imperial College London , Royal School of Mines, London, UK

IT-5-P-5962 Quantitative electron probe microanalysis of Ga-doped BiFeO3 and (Ca,Zr)-doped BaTiO3 thin films (PDF, HTML)
LONGUET J. L.1, JABER N.2, DAUMONT C.2, WOLFMANN J.2, NEGULESCU B.2, RUYTER A.2, FEUILLARD G.2, BAVENCOFFE M.2, FORTINEAU J.2, SAUVAGE T.3, COURTOIS B.3, BOUYANIFIF H.4, AUTRET-LAMBERT C.2, GERVAIS F.2
1CEA, DAM, Le Ripault, BP16, F-37260 Monts, France, 2Laboratoire GREMAN, UMR7347 CNRS Université François Rabelais, faculté de sciences et techniques 37200 Tours, France, 3Laboratoire CEMHTI, UPR3079 CNRS, Site Cyclotron 45071 Orléans cedex 2, France, 4Laboratoire LPMC, Université Jules Vernes Picardie - Amiens, France

IT-5-P-5964 On application of the Multivariate Statistical Analysis in spectrum-imaging (PDF, HTML)
Potapov P.1
1temDM, Dresden, Germany

IT-5-P-5988 Distributions of cations and inversion parameter in nonstoichiometric magnesium aluminate spinel characterized by electron energy-loss spectroscopy (PDF, HTML)
Halabi M.1,2, Ezersky V.2, Kohn A.1,2, Hayun S.1,2
1Department of Materials Engineering, Ben-Gurion University of the Negev, 2Ilse Katz Institute for Nanoscale Science and Technology, Ben-Gurion University of the Negev

IT-5-P-6028 Addressing challenges in Electron Energy Loss Spectroscopy on individual atoms (PDF, HTML)
March K.1, Brun N.1, Gloter A.1, Tencé M.1, Mory C.1, Stéphan O.1, Colliex C.1
1Laboratoire de Physique des Solides Université Paris-Sud - CNRS UMR-8502, Orsay, France

IT-6-IN-1652 Advances in Atomic Resolution-Environmental (Scanning) Transmission Electron Microscopy (PDF, HTML)
Gai P. L.1,2, Yoshida K.3, Lari L.1, Ward M. R.1, Martin T.1, Boyes E. D.1,4
1The York Nanocentre and Department of Physics, University of York, UK, 2Department of Chemistry, University of York , York, UK , 3Institute for Advanced Research, Nagoya University, Japan and York Nanocentre, University of York, 4Department of Electronics, University of York, UK

IT-6-IN-2314 Atomic structure and reactivity in catalysis studied by electron microscopy (PDF, HTML)
Helveg S.1
1Haldor Topsøe A/S, Nymøllevej 55, DK-2800 Kgs. Lyngby, Denmark

IT-6-O-1684 in situ Nanoscale Hyperspectral XEDS Elemental Mapping in Liquids (PDF, HTML)
Lewis E. A.1, Haigh S. J.1, Kulzick M. A.2, Burke M. G.1, Zaluzec N. J.1,3
1Materials Performance Centre and Electron Microscopy Centre, School of Materials, University of Manchester, Manchester, U.K., 2BP Corporate Research Center, Naperville, Illinois, USA., 3Electron Microscopy Center, Argonne National Laboratory, Argonne, IL 60439 USA.

IT-6-O-2397 Raman Spectroscopy coupled with environmental scanning transmission electron microscope (PDF, HTML)
Picher M.1,2, Lin P. A.1,2, Blakenship S.1, Winterstein J.1, Sharma R.span>1
11Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203, 22Institute for Research in Electronics and Applied Physics, University of Maryland, College park, MD 20740

IT-6-O-2933 Operando TEM of CO Oxidation Catalyst by Quantification of Gaseous Reaction Products (PDF, HTML)
Miller B. K.1, Crozier P. A.1
1Arizona State University, Tempe AZ, USA

IT-6-O-3407 Correlative Electron Microscopy and Photon Science Characterization of Working Catalysts (PDF, HTML)
Stach E. A.1, Li Y.2, Zhao S.3, Zakharov D.1, Nuzzo R.3, Frenkel A.2
1Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11733 , 2Department of Physics, Yeshiva University, New York, NY 10016, 3Department of Chemistry, University of Illinois, Urbana-Champaign, Champaign, IL, 61801

IT-6-P-1552 In situ and related TEM techniques for the characterization of chemically synthesized nanomaterials (PDF, HTML)
Kamino T.1,2, Shimizu T.2, Yaguchi T.3
1Yamanashi University, Kofu, Japan , 2Japan Automobile Research Institute, Ibaraki, Japan, 3Hitachi High-Technologies, Ibaraki, Japan

IT-6-P-1598 Quasi in situ TEM characterization of Ni reduction in regenerated Ni/alumina catalysts (PDF, HTML)
GAY A. S.1, DUBREUIL A. C.1, BROURI D.2, MASSIANI P.2
1IFP Energies Nouvelles - Rond point de l'échangeur de Solaize - BP 3 - 69360 Solaize (France), 2Laboratoire de Réactivité de Surface, CNRS-UMR 7197, UPMC - Site d’Ivry, 3 rue Galilée - 94200 Ivry-sur-Seine (France)

IT-6-P-1815 Development of a TEM specimen holder system for catalytic materials (PDF, HTML)
Hashimoto A.1, Takeguchi M.1
1National Institute for Materials Science, Tsukuba, Japan

IT-6-P-1924 Dynamic Observation of Gold Particles in Water by Environmental-cell TEM (PDF, HTML)
Kawasaki T.1, 2, 4, Imaeda N.1, Murase H.1, Yamasaki K.3, Matsutani T.3, Tanji T.1, 4
1Nagoya University, Nagoya, Japan, 2Japan Fine Ceramics Center, Nagoya, Japan, 3Kinki University, Osaka, Japan, 4Global Research Center for Environment and Energy based on Nanomaterials Science, Japan

IT-6-P-1943 The Study of Ice Impurities Using the Environmental Scanning Electron Microscopy at Higher Pressures and Temperatures. (PDF, HTML)
Neděla V.1, Runštuk J.1, Klán P.2, Heger D.2
1Institute of Scientific Instruments of ASCR, Královopolská 147, 61264 Brno, Czech Republic, 2Department of Chemistry, Faculty of Science, Masaryk University, Kamenice 5, 62500 Brno, Czech Republic

IT-6-P-1959 The Atmospheric Scanning Electron Microscope (ASEM) Observes Axonal Segmentation and Platelet Generation in Solution. (PDF, HTML)
Kinoshita T.1, Motohashi H.2, Hirano K.1, Maruyama Y.3, Kawata M.3, Ebihara T.3, Sato M.3, Nishiyama H.4, Suga M.4, Yamamoto M.5, Nishihara S.1, Sato C.3
1Faculty of Engineering, Soka University, Tokyo, Japan, 2Institute of Development, Aging and Cancer, Tohoku University, Sendai, Japan, 3National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan, 4JEOL Ltd., Tokyo, Japan, 5Tohoku University Graduate School of Medicine, Sendai, Japan

IT-6-P-1960 Time-resolved Observations of Single Protein's Motions Using Diffracted Electron Tracking (DET) with Wet Cell SEM (PDF, HTML)
Ishikawa A.1, Ogawa N.1,2, Hirohata Y.1, Yohda M.2, Sekiguchi H.3, Sasaki Y. C.4
1Nihon University, Tokyo, JAPAN, 2Tokyo University of Agriculture and Technology, Tokyo, JAPAN, 3SPring-8/JASRI, Hyogo, JAPAN, 4The University of Tokyo, Chiba, JAPAN

IT-6-P-1968 Investigation of hexagon shape nanoparticle growth mechanism using in-situ liquid Cell TEM (PDF, HTML)
Ahn T.1, Kim Y.1, Hong P.1, Nam K.1, Kim Y.1
1Department of materials science and engineering, Seoul National University, Korea

IT-6-P-2009 Development and application of environmental high voltage electron microscope (PDF, HTML)
Wakasugi T.1, Isobe S.2, Wang Y.2, Hashimoto N.1, Ohnuki S.1
1Graduate School of Engineering, Hokkaido University, 2Creative Research Institution, Hokkaido University

IT-6-P-2220 TEM Imaging of CO Oxidation Catalyst of Gold Nanoparticle on TiO2 in CO and O2 Environments (PDF, HTML)
Tanaka T.1, 3, Yamamoto N.2, 3, Takayanagi K.2, 3
1Meijo University, 2Tokyo Institute of Technology, 3JST, CREST

IT-6-P-2380 Controlled environment specimen transfer for investigation of catalysts by ETEM (PDF, HTML)
Damsgaard C. D.1,2, Zandbergen H.3, Hansen T. W.1, Chorkendorff I.2, Wagner J. B.1
1DTU Cen, Lyngby, Denmark, 2DTU CINF, Lyngby, Denmark, 3Kavli, TU Delft, Delft, The Netherlands

IT-6-P-2451 Aberration-Corrected, Environmental TEM Studies on Carbon Nanotube Oxidation and the Influence of the Imaging Electron Beam (PDF, HTML)
Koh A. L.1, Gidcumb E.2, Zhou O.2, 3, Sinclair R.1, 4
1Stanford Nanocharacterization Laboratory, Stanford University, Stanford, California 94305, USA, 2Department of Applied Physical Sciences, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599, USA, 3Department of Physics and Astronomy, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599, USA, 4Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, USA

IT-6-P-2499 Carbon gasification by silver nanoparticles followed in situ at atomic resolution under oxygen partial pressure in an Environmental TEM (ETEM) (PDF, HTML)
EPICIER T.1,2, CADETE SANTOS AIRES F. J.2, AOUINE M.2, LANGLOIS C.1, BLANCHARD N.3
1University of Lyon, MATEIS, umr CNRS 5510, INSA de Lyon/Université Lyon I, 69621 Villeurbanne, FRANCE, 2University of Lyon, IRCELYON, umr CNRS 5256, Université Lyon I, 69626 Villeurbanne, FRANCE, 3University of Lyon, ILM, umr CNRS 5306, Université Lyon I, 69622 Villeurbanne, FRANCE

IT-6-P-2722 Development Aberration Corrected Wet-ETEM System and Its Application to Pt/Carbon Fuel Cell Catalysts in Moisturized Gases Environments (PDF, HTML)
Yoshida K.1,2, Zhang X.2, Hiroyama T.2, Boyes E. D.3,4, Gai P. L.3,4
1Institute for advanced Research, Nagoya University, Japan, 2Nanostructures Research Laboratory, Japan Fine Ceramics Center, Japan, 3The York Nanocentre, University of York, UK, 4Department of Physics, Electronics and Chemistry, University of York, UK

IT-6-P-2774 Experimental evaluation of Environmental Scanning Electron Microscopes at high chamber pressure [200 - 4000 Pascal] (PDF, HTML)
Rattenberger J.1, Fitzek H.1,2, Schroettner H.1,2, Wagner J.1, Hofer F.1,2
1Graz Centre for Electron Microscopy (ZFE), Steyrergasse 17, 8010 Graz, Austria, 2Institute for Electron Microscopy and Nanoanalysis (FELMI), Steyrergasse 17, 8010 Graz, Austria, Graz University of Technology (TU Graz)

IT-6-P-3009 Multi-slice simulations for in-situ HRTEM studies of nanostructured magnesium hydride at elevated hydrogen pressures of 1 bar (PDF, HTML)
Surrey A.1,2, Schultz L.1,2, Rellinghaus B.1
1IFW Dresden, Dresden, Germany, 2TU Dresden, Institut für Festkörperphysik, Dresden, Germany

IT-6-P-3318 Understanding catalytic properties of nanoalloys by using aberration corrected electron microscopy in gaseous environment (PDF, HTML)
Ricolleau C.1, Nelayah J.1, Nguyen N.1, Prunier H.1, Wang G.1, Piccolo L.2, Alloyeau D.1
1Laboratoire Matériaux et Phénomènes Quantiques, CNRS-UMR 7162, Université Paris Diderot-Paris 7, Case 7021, 75205 Paris Cedex 13, France, 2Institut de Recherche sur la Catalyse et l’Environnement de Lyon, Université Lyon 1 – CNRS, Lyon, France

IT-6-P-5740 Cultivation and Observation of HeLa Cells in the Microfluidic Environmental Electron Microscopy (PDF, HTML)
Huang Y. C.1, Ma T. W.1, Huang T. W.1, Liu S. Y.1, Chen F. R.1, Tseng F. G.1, Chuang Y. J.2
1Department of Engineering and System Science, National Tsing Hua University, Taiwan, 2Department of BioMedical Engineering, Ming Chuan University, Taiwan

IT-6-P-5803 ETEM observation of degradation of platinum and platinum-cobalt alloy nanoparticle electrocatalysts on carbon black (PDF, HTML)
Nagashima S.1, 6, Kang Y.2, 3, Yoshida K.2, 4, Hiroyama T.2, 4, Liu K.2, 4, Ikai T.5, Kato H.5, Nagami T.5, Kishita K.6, Yoshida S.1
1Materials Research and Development Lab., Japan Fine Ceramics Center, Atsuta-ku, Nagoya, 456-8587, Japan, 2Nanostructures Research Lab., Japan Fine Ceramics Center, Atsuta-ku, Nagoya, 456-8587, Japan, 3Dept. of Frontier Materials, Nagoya Institute of Technology, Showa-ku, Nagoya, 466-8555, Japan, 4Institute for Advanced Research, Nagoya University, Chikusa-ku, Nagoya, 464-8603, Japan, 5Catalyst Design Dept., Material Design Div., Toyota Motor Corporation, Toyota-cho, Toyota, Aichi, 471-8572, Japan, 6Material Analysis Dept., Material Development Div., Toyota Motor Corporation, Toyota-cho, Toyota, Aichi, 471-8572, Japan

IT-7-IN-2863 The opportunities and challenges of liquid cell electron microscopy (PDF, HTML)
Ross F. M.1
1IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, USA

IT-7-IN-6082 Connectivity between imaging tools under controlled conditions: learning’s from 20 years experience with a variable cryo transfer system for the future (PDF, HTML)
Wepf R.1
1ScopeM/EMEZ, ETH Zürich, Zürich, Switzerland

IT-7-O-1567 In situ Scanning Transmission Electron Microscopy study of CuO reduction (PDF, HTML)
Martin T. E.1, Lari L.1, Gai P. L.2, Boyes E. D.3
1The York Nanocentre and Department of Physics, University of York, UK, 2The York Nanocentre and Departments of Chemistry and Physics, University of York, UK, 3The York Nanocentre and Departments of Physics and Electronics, University of York, UK

IT-7-O-1894 In-situ (S)TEM redesigned: Concept and electron-holographic performance (PDF, HTML)
Börrnert F.1,3, Riedel T.2, Müller H.2, Linck M.2, Büchner B.1,3, Lichte H.1
1Technische Universität Dresden, Germany, 2CEOS GmbH, Heidelberg, Germany, 3IFW Dresden, Germany

IT-7-O-1998 In situ STEM studies of reversible electromigration in thin palladium–platinum nanobridges (PDF, HTML)
Kozlova T.1, Rudneva M.1, Zandbergen H.1
1Kavli Institute of Nanoscience, Delft University of Technology, Delft, The Netherlands

IT-7-O-2696 The Effect of Electron Beam on Aqueous Solution Composition during Liquid Cell Microscopy (PDF, HTML)
Schneider N. M.1, Norton M. M.1, Mendel B. J.1, Grogan J. M.1, Ross F. M.2, Bau H. H.1
1Department of Mechanical Engineering and Applied Mechanics, University of Pennsylvania, Philadelphia, PA 19104, USA, 2IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, USA

IT-7-O-2818 Cold-field emission and charge measurements of a carbon cone nanotip studied by in situ electron holography (PDF, HTML)
de Knoop L.1, Gatel C.1, Houdellier F.1, Masseboeuf A.1, Monthioux M.1, Snoeck E.1, Hÿtch M. J.1
1CEMES-CNRS, Toulouse, France

IT-7-O-2861 A cryo high-vacuum shuttle for correlative cryogenic investigations (PDF, HTML)
Tacke S.1, Krzyzanek V.2, Reichelt R.1,3, Klingauf J.1
1Institute of Medical Physics and Biophysics, Muenster, Germany, 2Institute of Scientific Instruments of the ASCR, Brno, Czech Republic, 3Rudolf Reichelt initiated the project but unfortunately he passed away too early to see the results

IT-7-O-2947 In Situ Analytical Electron Microscopy: Imaging and Analysis of Steel in Liquid Water (PDF, HTML)
Schilling S.1, Janssen A.1, Burke M. G.1, Zhong X. L.1, Haigh S. J.1, Kulzick M. A.2, Zaluzec N. J.3
1Materials Performance Centre, The University of Manchester, Manchester UK 1, 2BP Corporate Research Center, Naperville, IL USA 2, 3Electron Microscopy Center, Argonne National Laboratory, Argonne, IL USA 3

IT-7-O-2952 In situ TEM observation of electrochemical deposition process (PDF, HTML)
Oshima Y.1,2, Tsuda T.3, Kuwabata S.3, Yasuda H.1, Takayanagi K.2,4
1Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Osaka, Japan, 2JST–CREST, Japan, 3Department of Applied Chemistry, Osaka University, Osaka, Japan, 4Department of Condensed Matter Physics, Tokyo Institute of Technology, Japan

IT-7-O-3046 MAGNETIZATION REVERSAL PROCESS OF MAGNETIC SUPERDOMAIN STRUCTURES IN COBALT ANTIDOT ARRAYS (PDF, HTML)
Rodríguez L. A.1,2, Magén C.1, Snoeck E.2, Gatel C.2, Castán-Guerrero C.3, Sesé J.1, García L. M.3, Herrero-Albillos J.4, Bartolomé J.3, Bartolomé F.3, Ibarra M. R.1
1LMA-INA, Universidad de Zaragoza, Zaragoza, Spain, 2CEMES-CNRS, Toulouse, France, 3ICMA, Universidad de Zaragoza-CSIC, Zaragoza, Spain, 4Centro Universitario de la Defensa, Zaragoza, Spain

IT-7-O-3113 In-situ biasing and switching of electronic devices into a TEM. (PDF, HTML)
Mongillo M.1, Garbin D.1, Navarro G.1, Vianello E.1, Coue M.1, Mayall B.1, Cooper D.1
1CEA-LETI Minatec, 17 rue des Martyrs 38054 Grenoble, FRANCE

IT-7-O-3133 In-situ Nano-compression tests on Shape Memory Alloys (PDF, HTML)
San Juan J.1, Gómez-Cortés J. F.1, López G. A.2, Hernández J.3, Molina S.3, Nó M. L.2
1Dpt Física de la Materia Condensada, Univ. del País Vasco, Bilbao, Spain, 2Dpt Física Aplicada II, Univ. del País Vasco, Bilbao,Spain, 3Dpt Ciencia de los Materiales, Univ. de Cádiz, Puerto Real, Cádiz, Spain

IT-7-O-3169 Temperature-induced sphere-to-tetrapod transformation of CdSe nanocrystals investigated by in-situ transmission electron microscopy (PDF, HTML)
van Huis M. A.1,2, Fan Z.3, Li W. F.1, Yalcin A. O.2, Tichelaar F. D.2, Talgorn E.4, Houtepen A. J.4, van Blaaderen A.1, Vlugt T. J.3, Zandbergen H. W.2
1Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 5, 3584 CC Utrecht, The Netherlands, 2Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands, 3Process and Energy Laboratory, Delft University of Technology, Leeghwaterstraat 39, 2628 CB Delft, The Netherlands, 4Department of Chemical Engineering, Delft University of Technology, Julianalaan 136, 2628 BL Delft, The Netherlands

IT-7-P-1394 An in-situ transmission electron microscopy study on room temperature ductility of TiAl alloys with fully lamellar microstructure (PDF, HTML)
Kim S.1, Na Y.1, Yeom J.1, Kim S.1
1Light Metal Division, Korea Institute of Materials Science, Changwon 642-831, South Korea

IT-7-P-1582 Simultaneous in situ SEM/STEM observation of catalyst reaction under an air atmosphere using a Cold-FE environmental TEM (PDF, HTML)
Sato T.1, Matsumoto H.1, Nagaoki I.2, Yaguchi T.2
1Application Development Department, Hitachi High-Technologies Corporation, 2Advanced Microscope System Design Department, Hitachi High-Technologies Corporation

IT-7-P-1610 Observation method of cross-sectioned cells by cryo-scanning electron microscopy (PDF, HTML)
Nishino Y.1, Ito Y.1, 2, Miyazawa A.1
1Graduate School of Life Science, University of Hyogo, 2Leica Microsystems K. K.

IT-7-P-1655 Characterization of Melting and Crystallization Behavior in the Au-Ge Eutectic System Using Au-catalyzed Ge Nanowires (PDF, HTML)
Marshall A. F.1, Thombare S. V.1, Chan G.1, McIntyre P. C.1
1Stanford Nanocharacterization Facility and Materials Science and Engineering Department, Stanford University, Stanford, CA

IT-7-P-1721 Maestro: a Matlab-based centralized computer control system for an electron microscopy laboratory (PDF, HTML)
Bergen M.1, Dalili N.1, Malac M.1,2, Hoyle D.3, Chen J.1, Taniguchi Y.4, Yotsuji T.4, Yaguchi T.4, Hayashida M.5, Howe J.3, Kupsta M.1
1National Institute for Nanotechnology, Edmonton, Canada, 2Univ. of Alberta, Edmonton, Canada, 3Hitachi High Tech Canada, Toronto, Canada, 4Hitachi High Tech, Naka, Japan, 5AIST, Tsukuba, Japan

IT-7-P-1812 Dislocation mediated creep/relaxation in nanocrystalline palladium thin films revealed by on-chip high resolution TEM in-situ testing (PDF, HTML)
Amin-Ahmadi B.1, Colla M. S.2, Idrissi H.1,2, Malet L.3, Godet S.3, Raskin J. P.2, Pardoen T.2, Schryvers D.1
1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium, 2Université catholique de Louvain, Institute of Mechanics, Materials and Civil Engineering, Louvain-la-Neuve, Belgium, 3Université Libre de Bruxelles, Matters and Materials Department, Belgium

IT-7-P-1868 In situ mechanical testing in the transmission electron microscope and finite element method simulations on nanoscaled amorphous silica spheres – Densification, hardening and improved intrinsic properties on nanoscale (PDF, HTML)
Mačković M.1, Niekiel F.1, Spiecker E.1
1Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg, Cauerstr. 6, 91058 Erlangen, Germany

IT-7-P-1941 Deformation modes of Au nanowires revealed by mechanical testing in TEM (PDF, HTML)
Lee S.1, Im J.1, Bitzek E.2, Kiener D.3, Oh S.1
1POSTECH, Pohang, Republic of Korea, 2Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany, 3Montanuniversität Leoben, Leoben, Austria

IT-7-P-1969 Observation of Strain Aging Behavior in Strain Based Line Pipe Steels using in-situ Heating and Straining TEM stage (PDF, HTML)
Hong S.1, Ahn T.1, Kim S.1, Ro Y.2, Lee C.2, Kim Y.1
1Seoul National University, Seoul, Republic of Korea, 2Technical Research Laboratory, POSCO, Pohang, Republic of Korea

IT-7-P-2081 In Situ 3D Studies of the Chlamydomonas Chloroplast Using Cryo-Focused Ion Beam Milling and Cryo-Electron Tomography (PDF, HTML)
Schaffer M.1, Engel B. D.1, Cuellar L. K.1, Villa E.1, Plitzko J. M.1, Baumeister W.1
1Department of Molecular Structural Biology, Max Planck Institute of Biochemistry, Martinsried, Germany

IT-7-P-2095 In-situ Lorentz microscopy of high Bs and low core-loss Fe85Si2B8P4Cu1 nanocrystalline alloys (PDF, HTML)
Akase Z.1,2, Shindo D.1,2, Sharma P.3, Makino A.3
1Institute of Multidisciplinary Research for Advanced Materials, Tohoku University. , Sendai, Japan, 2Center for Emergent Matter Science, RIKEN, Wako, Japan, 3Institute for Materials Research, Tohoku University, Sendai, Japan

IT-7-P-2143 Observing impregnation dynamics at the liquid-solid interface using scanning electron microscopy: Charged-controlled SAPO-34 zeolite particle dispersion on SiC substrates (PDF, HTML)
Tran C. M.1, Fordsmand H.1, Appel C. C.1
1Haldor Topsøe A/S, Nymøllevej 55, DK-2800 Kgs. Lyngby, Denmark

IT-7-P-2418 EBSD Measurements of the Twinning Process in an Mg-4wt%Li-Alloy with an in-situ Tensile / Compression Module in the SEM DSM 982 (PDF, HTML)
Fahrenson C.1, Driehorst I.1, Lentz M.2, Camin B.2, Berger D.1
1Technical University Berlin, Center for Electron Microscopy (ZELMI), Straße des 17. Juni 135, 10623 Berlin, Germany, 2Technical University Berlin, Chair Metallic Materials, Ernst-Reuter-Platz 1, 10587 Berlin, Germany

IT-7-P-2483 High resolution cryo-CLEM: from cryo-light microscopy to cryo-TEM, through cryo-milling (PDF, HTML)
de Marco A.1, Mayer T.1, Mahamid J.2, Arnold J.2, Plitzko J.2
1FEI Company, Munich, Germany, 2Max Plank Institute of Biochemistry, Munich, Germany

IT-7-P-2779 In-situ TEM studies of the electromigration process in a single InAs nanowire (PDF, HTML)
Neklyudova M.1, Zandbergen H. W.1
1Kavli Institute of Nanoscience, Delft University of Technology, Delft, The Netherlands

IT-7-P-2824 Understanding mechanisms of assisted sintering through dedicated in situ TEM experiments (PDF, HTML)
van Benthem K.1
1University of California, Davis 1

IT-7-P-2853 Correlating internal structure and mechanical properties of amorphous silica and gold micro-/nanoparticles using in situ mechanical testing in the scanning and transmission electron microscope (PDF, HTML)
Herre P.1, Paul J.1, Romeis S.1, Niekiel F.2, Mačković M.2, Spiecker E.2, Peukert W.1
1Institute of Particle Technology (LFG), University of Erlangen-Nuremberg, Erlangen, Germany, 2Center for Nanoanalysis and Electron Microscopy (CENEM), University of Erlangen-Nuremberg, Erlangen, Germany

IT-7-P-2870 Revealing dislocation activities and deformation behavior in Nb2AlC using in situ nanoindentation in the transmission electron microscope (PDF, HTML)
Schrenker N.1, Kabiri Y.1, Mueller J.1, Mackovic M.1, Spiecker E.1
1Center for Nanoanalysis and Electron Microscopy (CENEM),Erlangen, Germany

IT-7-P-2887 In situ reduction of graphene oxide by Joule heating with TEM-STM system (PDF, HTML)
Martín G.1, Claramunt S.1, Varea A.1, Yedra L.1,2, Rebled J. M.1,3, Sánchez-Hidalgo R.4, López-Díaz D.4, Velázquez M. M.4, Cirera A.1, Peiró F.1, Estradé S.1,2, Cornet A.1
1MIND/IN2UB, Departament d’Electrònica, Universitat de Barcelona, Marti i Franqués 1, 08028 Barcelona, Spain, 2CCiT, Scientific and Technological Centers, Universitat de Barcelona, C/Lluís Solé i Sabaris 1, 08028 Barcelona, Spain, 3Institut de Ciència de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain, 4Departamento de Química Física, Facultad de Ciencias Químicas. Universidad de Salamanca, E37008 Salamanca, Spain

IT-7-P-2942 Deformation Behavior of Silica Microparticles under Electron Beam Irradiation (PDF, HTML)
Stauffer D.1, Bhowmick S.1, Major R.1, Asif S.1, Warren O.1
1Hysitron, Inc.

IT-7-P-2970 Light Irradiation of ETEM Samples for In-Situ Studies of Photocatalysts (PDF, HTML)
Miller B. K.1, Crozier P. A.1, Zhang L.1
1Arizona State University, Tempe AZ, USA

IT-7-P-3015 In situ applications of quantitative magnetic TEM imaging in magnetic nanostructures (PDF, HTML)
Rodríguez L. A.1, Magén C.1, Snoeck E.2, Gatel C.2, Marín L.1, Serrano-Ramón L.1, Prieto J. L.5, Muñoz M.5, Ortolani L.6, Algarabel P. A.3, Morellón L.1, de Teresa J. M.3, Ibarra M. R.1
1LMA-INA, Universidad de Zaragoza, Zaragoza, Spain, 2CEMES-CNRS, Toulouse, France , 3ICMA, Universidad de Zaragoza-CSIC, Zaragoza, Spain, 4ISOM, Universidad Politécnica de Madrid, Madrid, Spain, 5IMM, CNM-CSIC, Madrid, Spain, 6IMM, CNR Bologna, Italy

IT-7-P-3047 Reversible In-Situ TEM Electrochemical studies of Fluoride Ion Battery (PDF, HTML)
Chakravadhanula K. V.1, Fawey M. H.2, Kübel C.1,2,3, Scherer T.2,3, Rongeat C.2, Munnangi A. R.1,2, Fichtner M.1,2, Hahn H.1,2
1Helmholtz Institute Ulm for Electrochemical Energy Storage (HIU), Albert-Einstein-Allee 11, 89081 Ulm, Germany, 2Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, 3Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany

IT-7-P-3115 In-situ heating using MEMS devices on FIB/SEM systems (PDF, HTML)
Novák L.1, Vystavěl T.1, Faber P.2, Mele L.2, Šesták J.1
1FEI Company, Podnikatelská 6, 612 00 Brno, Czech Republic, 2FEI Company, Achtseweg Noord 5, 5600 KA Eindhoven, The Netherlands

IT-7-P-3273 Atomic Level In-situ Characterization of NiO-TiO2 Photocatalysts under Light Irradiation in Water Vapor (PDF, HTML)
Zhang L.1, Crozier P. A.1
1Arizona State University, Tempe, USA

IT-7-P-3335 Mems-based heaters for ultrahigh temperature in situ TEM studies (PDF, HTML)
Erdamar A. K.1, Zandbergen H. W.1
1Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands

IT-7-P-3342 Applying of 6-carboxyfluorescein (6-FAM) to cytogenetics (PDF, HTML)
Galkina S.1, Saifitdinova A.1, Bogomaz D.1, Radaev A.1, Gaginskaya E.1
1Saint-Petersburg State University, Saint-Petersburg, Russia

IT-7-P-3408 In situ TEM deformation of a bulk metallic glass with a K2-IS detector (PDF, HTML)
Gammer C.1, Rentenberger C.2, Karnthaler H. P.2, Czarnik C.3, Beitlschmidt D.4, Pauly S.4, Eckert J.4, Minor A. M.1
1National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, USA, 2Physics of Nanostructured Materials, University of Vienna, Vienna, Austria, 3Gatan, Inc., Pleasanton, USA, 4IFW Dresden, Dresden, Germany

IT-7-P-3442 Direct evidence for orbital angular momentum transfer from electron vortex beam (PDF, HTML)
Thirunavukkarasu G.1, Yuan J.1, McKenna K.1, Babiker M.1
1Department of Physics, University of York, Heslington, York, YO10 5DD, United Kingdom.

IT-7-P-5752 Development of In-Situ Wet-Cell Electron Microscope Holder for Oxygen Nano-bubbles by Platinum (PDF, HTML)
Zheng H. T.1, Liu S. Y.1, Tsai C. T.2, Haung T. W.1, Tseng F. G.1, Chen F. R.1
1Engineering and System Science Department/National Tsing Hua University, Hsinchu, Taiwan, 2Dept. of Material Science and Engineering, National Chung Hsing University, Tai-Chung, Taiwan

IT-7-P-5919 Real-time observation of in-situ cation exchange in CdSe-PbSe nanodumbbells during epitaxial solid-solid-vapor growth (PDF, HTML)
Yalcin A. O.1, Goris B.2, Bals S.2, Van Tendeloo G.2, Casavola M.3, Vanmaekelbergh D.3, Tichelaar F. D.1, Zandbergen H. W.1, van Huis M. A.3
1Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands, 2Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium, 3Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 5, 3584 CC Utrecht, The Netherlands

IT-7-P-6054 In-situ observation of gold nanorod self-assembly (PDF, HTML)
Novotný F.1, Wandrol P.2, Proška J.1, Šlouf M.3
1FNSPE, Czech Technical University, Břehová 7, 115 19 Prague, Czech Republic, 2FEI, Podnikatelská 6, 612 00, Brno, Czech Republic, 3Institute of Macromolecular Chemistry, Academy of Sciences of the Czech Republic, Prague, Czech Republic

IT-8-IN-1690 Imaging surface plasmon polaritons by fs-transmission electron microscopy (PDF, HTML)
Carbone F.1
1LUMES, ICMP, SB, Ecole Polytechnique Fédérale de Lausanne

IT-8-IN-5754 Time-Resolved Imaging of Surface Plasmon Polaritons by Photoemission Microscopy: The Next Generation (PDF, HTML)
Meyer zu Heringdorf F. J.1
1Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen, 47048 Duisburg, Germany

IT-8-O-1703 Electron Pulse Properties and PINEM Aberrations in Ultrafast Transmission Electron Microscopy (PDF, HTML)
Flannigan D. J.1, Plemmons D.1
1Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USA

IT-8-O-1901 Diffract-before-destroy with electrons? (PDF, HTML)
Egerton R. F.1, Li R. K.2, Zhu Y.3
1Physics Department, University of Alberta, Edmonton, Canada T6G 2E1, 2Department of Physics & Astronomy, UCLA, Los Angeles, California, USA, 3Center for Functional Nanomaterials, Brookhaven Nat. Lab., Upton, NY11973, USA

IT-8-O-2020 Resolving Landau State Dynamics with Electron Vortex Beams (PDF, HTML)
Schachinger T.1, Schattschneider P.1,2, Löffler S.1,2, Stöger-Pollach M.2, Steiger-Thirsfeld A.2, Bliokh K. Y.3, Nori F.4,5
1Institute of Solid State Physics, TU Vienna, Vienna, Austria, 2USTEM, TU Vienna, Vienna, Austria, 3iTHES Research Group, RIKEN, Wako-shi, Japan, 4Center for Emergent Matter Science, RIKEN, Wako-shi, Japan, 5Physics Department, University of Michigan, Michigan, USA

IT-8-O-3019 High Throughput Imaging in a Multibeam SEM (PDF, HTML)
Ren Y.1, Hagen C. W.1, Kruit P.1
1Delft University of Technology, Delft, the Netherlands

IT-8-P-1428 Analysis of image distortion on projection electron microscope image (PDF, HTML)
Iida S.1, Hirano R.1, Amano T.1, Terasawa T.1, Watanabe H.1, Murakami T.2
1EUVL Infrastructure Development Center, Inc.(EIDEC), Tsukuba, Japan, 2EBARA CORPORATION, Fujisawa, Japan

IT-8-P-1696 New Operation Modes with the direct detecting pnCCD-camera in Transmission Electron Microscopy (PDF, HTML)
Simson M.1, Hartmann R.2, Huth M.2, Ihle S.2, Müller K.3, Rosenauer A.3, Ryll H.2, Schmidt J.2, Soltau H.1, Strüder L.2
1PNDetector GmbH, Emil-Nolde-Str. 10, 81735 Munich, Germany, 2PNSensor GmbH, Römerstr. 28, 80803 Munich, Germany, 3Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany

IT-8-P-1895 Design of the novel flange-on high lateral and energy resolution ultrashort electron pulse compression system for ultrafast microscopy (PDF, HTML)
Grzelakowski K. P.1
1OPTICON Nanotechnology

IT-8-P-2148 Sub-picosencond electron beam and femtosecond optical pump system in spin-polarized TEM (PDF, HTML)
Kuwahara M.1, Nambo Y.1, Saitoh K.2, Ujihara T.1, Asano H.1, Takeda Y.3, Tanaka N.2
1Graduate School of Engineering, Nagoya University Nagoya, 464-8603, Japan, 2EcoTopia Science Institute, Nagoya University, Nagoya 464-8603, Japan, 3Nagoya Industrial Science Research Institute, Nagoya 464-0819, Japan

IT-8-P-2668 Ultrafast measurement in spin- polarized pulse TEM (PDF, HTML)
Nambo Y.1, Kuwahara M.1, Kusunoki S.1, Sameshima K.1, Saitoh K.1,2, Ujihara T.1, Asano H.1, Takeda Y.3,4, Tanaka N.1,2
1Graduate school of Engineering, Nagoya University, Nagoya, 464-8603, Japan, 2EcoTopia Science Institute, Nagoya University, Nagoya, 464-8603, Japan, 3Nagoya Industrial Science Research Institute, Nagoya, 464-0819, Japan, 4Aichi Synchrotron Radiation Center, Aichi Science and Technology Foundation, Seto, 489-0965, Japan

IT-8-P-2678 Implementing in situ experiments in liquids in the(scanning) transmission electron microscope and dynamic TEM (PDF, HTML)
Abellan P.1, Woehl T. J.2, Russell G. T.1, Schroeder W. A.3, Evans J. E.1, Browning N. D.1
1Pacific Northwest National Laboratory, Richland, USA, 2U.S. DOE Ames Laboratory, Ames, USA, 3University of Illinois at Chicago, Chicago, USA

IT-8-P-3023 SPIM-Fluid: High-throughput platform based on Light-Sheet Microscopy (PDF, HTML)
Gualda E. J.1, Pereira H.2,3, Pinto C.2,3, Simaõ D.2,3, Brito C.2,3
1Instituto Gulbenkian de Ciências, Portugal, 2Instituto de Biologia Experimental e Tecnológica, Portugal, 3Instituto de Tecnologia Química e Biológica, Universidade Nova de Lisboa, Portugal

IT-8-P-3340 In-Situ Lorentz Microscopy with Femtosecond Optical Illumination (PDF, HTML)
Gatzmann J.1, Eggebrecht T.2, Feist A.1, Zbarsky V.2, Münzenberg M.2, Ropers C.1, Schäfer S.1
1IV. Physical Institute, Georg-August-University, 37077 Göttingen, Germany, 2I. Physical Institute, Georg-August-University, 37077 Göttingen, Germany

IT-8-P-6038 Towards RF photo injector based dynamic transmission electron microscopy with REGAE (PDF, HTML)
Manz S.1, Casandruc A.1, Keskin S.1, Zhang D. F.1, Bayesteh S.2, Hirscht J.1, Felber M.2, Gehrke T.4, Loch R. A.1, Marx A.1, Delsim-Hashemi H.2, Schlarb H.2, Hoffmann M.2, Hada M.1, Epp S. W.2, Floettmann K.1, Miller R. J.1,3,4
1Max Planck Institute for the Structure and Dynamics of Matter, Hamburg, Germany, 2DESY, Hamburg, Germany, 3University of Toronto, Toronto, Canada, 4University of Hamburg, Hamburg, Germany

IT-8-P-6048 Ultrafast transmission electron microscopy with nanoscopic electron sources (PDF, HTML)
Feist A.1, Bormann R.1, Schauss J.1, Gatzmann J. G.1, Rubiano da Silva N.1, Strauch S.1, Schäfer S.1, Ropers C.1
1IV. Physical Institute, Göttingen, Germany

IT-9-IN-1862 Multiple-scattering assisted electron crystallography (PDF, HTML)
Koch C. T.1
1Institute for Experimental Physics, Ulm University, Ulm, Germany

IT-9-IN-2477 Application of 3D EBSD: Growth of tin whiskers and hillocks (PDF, HTML)
Michael J. R.1, Susan D. F.1, Rye M. J.1
1Materials Science Center, Sandia National Laboratories, Albuquerque, NM USA

IT-9-O-1603 Split-Illumination Convergent Beam Electron Diffraction (SICBED) of Strained Crystals (PDF, HTML)
Houdellier F.1, Arbouet A.1, Hÿtch M. J.1, Snoeck E.1
1CEMES-CNRS, Université de Toulouse, 29 Rue Jeanne Marvig, 31055 TOULOUSE FRANCE EU

IT-9-O-2129 Mapping distortion and strain with EBSD in Cu single crystals (PDF, HTML)
Kalácska S.1, Groma I.1, Ispánovity P. D.1
1Eötvös Loránd University, Budapest, Hungary

IT-9-O-2147 Using electron vortex beams to distinguish enantiomorphic space groups (PDF, HTML)
Juchtmans R.1, Verbeeck J.1
1University of Antwerp, Antwerp, Belgium

IT-9-O-2387 Retrieving nanoscale third-dimension information directly from TEM data using stacked-Bloch-wave simulations and artificial neural network tools (PDF, HTML)
Pennington R. S.1, Van den Broek W.1, Koch C. T.1
1Institute for Experimental Physics, Albert-Einstein-Allee 11, Ulm University, 89081 Ulm, Germany

IT-9-O-2763 Measuring strain with high precision and high spatial resolution using precession and convergent beam electron diffraction (PDF, HTML)
Rouviere J.1, Martin Y.1, Beche A.2, Cooper D.3, Bernier N.3, Vigouroux M.3, Zuo J.4
1CEA, INAC/SP2M UJF-Grenoble Minatec campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France, 2FEI Electron Optics, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands, 3CEA, LETI, Minatec campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France, 4Univ Illinois, Dept Mat Sci & Engn, 1304 W Green St, Urbana, IL 61801 USA

IT-9-O-2773 Combining real space and reciprocal space tomography in the TEM (PDF, HTML)
Eggeman A. S.1, Krakow R.2, Midgley P. A.3
1Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, CB3 0FS, UK

IT-9-O-2884 Orientation measurements in TEM foils using transmission EBSD (PDF, HTML)
de Kloe R.1, Nowell M. M.2, Suzuki S.3, Wright S. I.2
1EDAX, Ringbaan Noord 103, 5046 AA Tilburg, The Netherlands, 2EDAX, 392 E. 12300 S., Suite H, Draper, UT 840201, USA, 3TSL Solutions KK, #SIC2-401, 5-4-30, Nishihashimoto, Midori-Ku, Kanagawa, Sagamihara 252-0131, Japan.

IT-9-O-2923 Study of nanoscale local structures of ferroelectric barium titanate using convergent-beam electron diffraction (PDF, HTML)
Tsuda K.1, Sano R.1, Yasuhara A.2, Tanaka M.1
1Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan, 2JEOL Ltd., Tokyo, Japan

IT-9-O-2948 Direct determination of atomic structures from the observation of phase (PDF, HTML)
Etheridge J.1,2, Nakashima P. N.2, Moodie A. F.1
1Monash Centre for Electron Microscopy, Monash University, VIC 3800, Australia, 2Department of Materials Engineering, Monash University, VIC 3800, Australia

IT-9-O-3034 3D Electron Diffraction Tomography without limits: structure analysis of a hyper-complex approximant to icosahedral quasicrystal (PDF, HTML)
Oleynikov P.1, Ma Y. H.1, Fujita N.2, Garcia-Garcia J.3, Yoon K. B.4, Tsai A. P.2, Terasaki O.1,5
1Materials and Environmental Chemistry, Stockholm University, Stockholm, Sweden, 2IMRAM, Tohoku University, Sendai, Japan, 3Facultad CC. Químicas, Universidad Complutense de Madrid, Madrid, Spain, 4Department of Chemistry, Sogang University, Seoul, Republic of Korea, 5Graduate School of EEWS, KAIST, Daejeong, Republic of Korea

IT-9-O-3230 Transmission Kikuchi Diffraction (TKD) in SEM (PDF, HTML)
Palasse L.1
1Bruker Nano GmbH, Berlin, Germany

IT-9-O-3245 Pushing the boundaries of symmetry determination with ‘digital’ electron diffraction (PDF, HTML)
Beanland R.1, Woodward D. I.1, Evans K.1, Römer R.1, Smith K.1, Thomas P. A.1
11Department of Physics, University of Warwick, Coventry, CV4 7AL, UK

IT-9-P-1450 Sr25Fe30O77 : A complex layered and modulated structure solved by electron diffraction (PDF, HTML)
Lepoittevin C.1
1Institut Néel, CNRS et Université Joseph Fourier, Grenoble, France.

IT-9-P-1516 Substrate threading dislocations imaged by weak beam dark field TEM on samples with GaN nano-LEDs (PDF, HTML)
Lenrick F.1, Bi Z.2, Ohlsson J.3, Ek M.1, Hetherington C.1, Samuelson L.2, Wallenberg L. R.1
1Centre for Analysis and Synthesis/nCHREM, Lund University, Box 124, S-221 00 Lund, Sweden, 2Solid State Lighting Center, Lund University, Box 118, S-221 00 Lund, Sweden, 3QuNano AB, Ideon Science Park, Sheelevägen 17 , S-223 70 Lund, Sweden

IT-9-P-1526 PRECESSED NANO-ELECTRON DIFFRACTION PATTERNS OF THE HUMAN TOOTH ENAMEL CRYSTALS (PDF, HTML)
REYES-GASGA J.1,2, ADDAD A.1, BRÈS E. F.1
1Unité des Matériaux et Transformation (UMET). Université de Lille 1, Sciences et Technologies. Bâtiment C6. 59650 Villeneuve d’Ascq. Lille, France., 2Permanet Address: Instituto de Física, UNAM. Circuito de la Investigación s/n. Cd. Universitaria, 04510 Coyoacán, Mexico D. F., México

IT-9-P-1563 Nano-beam Diffraction of Pt/Al2O3 and Pd/Al2O3 Catalysts (PDF, HTML)
Ward M. R.1, Boyes E. D.1,2, Gai P. L.1,3
1Department of Physics, University of York and the York Nanocentre, UK, 2Department of Electronics, University of York and the York Nanocentre, UK, 3Department of Chemistry, University of York and the York Nanocentre, UK

IT-9-P-1573 Charge Density Determination for Transition Metals and Intermetallics by Convergent Beam Electron Diffraction and Density Functional Theory Validation (PDF, HTML)
Sang X.1, Kulovits A. K.1, Wang G.1, Wiezorek J. M.1
1Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, 15261, USA

IT-9-P-1631 Axial transmission electron diffraction in a scanning electron microscope (PDF, HTML)
Volkenandt T.1, Müller E.1, Gerthsen D.1
1Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany

IT-9-P-1694 Strain mapping at the nanoscale using precession electron diffraction in a non-corrected Transmission Electron Microscope (PDF, HTML)
Vigouroux M. P.1, Delaye V.1, Lafond D.1, Bernier N.1, Rouvière J. L.2, Chenevier B.3, Bertin F.1
1CEA, LETI, MINATEC Campus, 17 rue des martyrs, 38054 GRENOBLE Cedex 9, France, 2CEA, INAC, MINATEC Campus, 17 rue des martyrs, 38054 GRENOBLE Cedex 9, France, 3LMGP, CNRS, 3, parvis Louis Néel, 38016 GRENOBLE Cedex 1, France

IT-9-P-2034 Imaging of grain boundaries in polycrystalline samples by HRTEM (PDF, HTML)
Kiss Á. K.1, 2, Pécz B.1, Rauch E. F.3, Nicolopoulos S.4, Lábár J. L.1
1Institute for Technical Physics and Materials Science, Research Centre for Natural Sciences of the Hungarian Academy of Sciences (MTA TTK MFA), Budapest, Hungary, 2University of Pannonia, Doctoral School of Molecular-and Nanotechnologies, Veszprém, Hungary, 3SIMaP, Grenoble INP/CNRS, France, 4NanoMEGAS Sprl, Brussels, Belgium

IT-9-P-2120 Statistical evaluation of 3D planes in polycrystalline materials from 2D Electron Backscatter Diffraction (EBSD) maps (PDF, HTML)
Jäger A.1, Klinger M.1, Tesař K.1, Malachov M.1
1Institute of Physics AS CR, Na Slovance 2, Prague, Czech Republic

IT-9-P-2149 Precession Electron Diffraction Tomography study of new materials derived from Aurivillius phases. (PDF, HTML)
Mouillard-Stéciuk G.1, Boullay P.1, Barrier N.1, Pautrat A.1
1Laboratoire CRISMAT, UMR CNRS 6508, ENSICAEN, 6 Bd Maréchal Juin, F-14050 Caen Cedex 4, France

IT-9-P-2158 Multiple scattering in amorphous structures (PDF, HTML)
Mu X.1, Koch C. T.2, Sigle W.1, Neelamraju S.3, van Aken P. A.1
1Max Planck Institute for Intelligent Systems, Stuttgart, Germany, 2Institute for Experimental Physics, Ulm University, Ulm, Germany, 3Max Planck Institute for Solid State Research, Stuttgart, Germany

IT-9-P-2328 ACOM-TEM analysis of mineral particles ultrastructural organization in bone tissue (PDF, HTML)
Verezhak M.1, Rauch E. R.2, Gourrier A.1 3
1Laboratory of Interdisciplinary Physics, Université Grenoble Alpes / CNRS, Saint Martin d’Hères, France, 2SIMaP laboratory, Université Grenoble Alpes / CNRS, Saint Martin d’Hères, France , 3European Synchrotron Radiation Facility, Grenoble, France

IT-9-P-2385 Investigation of dislocation structures by cross-correlation based EBSD mapping and TEM imaging (PDF, HTML)
Kalácska S.1, Groma I.1, Ispánovity P. D.1
1Eötvös Loránd University

IT-9-P-2459 EBSD sample preparation: high energy Ar ion milling (PDF, HTML)
Kalácska S.1, Baris A.1, Varga G.1, Radi Z.2, Lendvai A.2, Dankházi Z.1, Havancsák K.1
1Eötvös Loránd University, 2Technoorg Linda Ltd.

IT-9-P-2531 Determination of dislocation density by electron backscattering diffraction and X-ray line profile analysis in ferrous lath martensite (PDF, HTML)
Berecz T.1, Csóré A.1, Jenei P.2, Gubicza J.2, Szabó P. J.1
1Department of Material Science and Engineering, Budapest University of Technology and Economics, Budapest, Hungary, 2Department of Materials Physics, Eötvös Lóránd University, Budapest, Hungary

IT-9-P-2605 Quantitative local structure analysis of nanocrystalline FeAl by electron diffraction (PDF, HTML)
Rentenberger C.1, Gammer C.2, Karnthaler H. P.1
1University of Vienna, Physics of Nanostructured Materials, Vienna, Austria, 2National Center for Electron Microscopy, LBNL, Berkeley, California, USA

IT-9-P-2650 Fluctuation electron microscopy of an amorphous-crystalline composite material (PDF, HTML)
Ebner C.1, Gammer C.2, Karnthaler H. P.1, Rentenberger C.1
1University of Vienna, Physics of Nanostructured Materials, Vienna, Austria, 2National Center for Electron Microscopy, LBNL, Berkeley, California, USA

IT-9-P-2743 Illumination Wavefront Determination by Image and Diffraction Focal Series (PDF, HTML)
McLeod R. A.1,2, Rouviere J.2, Zuo J.1,3
1Fondation Nanosciences, Grenoble, France, 2CEA, INAC/SP2M UJF-Grenoble Minatec campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France, 3University of Illinois at Urbana-Champaign, Champaign, USA

IT-9-P-2769 Automated crystal orientation mapping in TEM for the statistical analysis of microstructure evolution in nano-grained polycrystalline thin-films (PDF, HTML)
Aebersold A. B.1, Hébert C.1, Alexander D. T.1
1Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, CH-1015, Switzerland

IT-9-P-2894 Analysis of the ordering state of pyroxenes using precession electron diffraction. (PDF, HTML)
Jacob D.1, Wouossaju S.1, Palatinus L.2
1UMET, UMR 8207 CNRS-Université Lille 1, Villeneuve d’Ascq, France, 2Institute of Physics of the Academy of Sciences of the Czech Republic, 182 21 Prague, Czech Republic

IT-9-P-2929 Application of Large-Angle Convergent-Beam Electron Diffraction to APBs Recognition (PDF, HTML)
Jezierska E.1
1Warsaw University of Technology, Faculty of Materials Science and Engineering, Woloska 141, 02-507 Warsaw, Poland

IT-9-P-2930 Quantitative CBED in a Nano-structured Material (PDF, HTML)
Nakashima P. H.1, Bourgeois L.1,2, Etheridge J.1,2
1Department of Materials Engineering, Monash University, 3800 Victoria Australia, 2Monash Centre for Electron Microscopy, Monash University, 3800 Victoria, Australia

IT-9-P-3029 Strain Analysis by Nano-Beam Electron Diffraction (SANBED) in semiconductor nanostructures (PDF, HTML)
Mahr C.1, Müller K.1, Erben D.1, Schowalter M.1, Zweck J.2, Volz K.3, Rosenauer A.1
1Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany), 2Universität Regensburg, Universitätsstraße 31, 93040 Regensburg (Germany), 3Philipps Universität Marburg, Hans-Meerwein-Straße, 35032 Marburg (Germany)

IT-9-P-3080 Aberration-compensated large-angle rocking convergent-beam electron diffraction (LARCBED) (PDF, HTML)
Koch C. T.1, Ozsoy Keskinbora C.2, Mu X.2, van Aken P. A.2, Ishizuka K.3
1Institute for Experimental Physics, Ulm University, Albert-Einstein-Allee 11, 89081 Ulm, Germany, 2Stuttgart Center for Electron Microscopy, MPI for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart, Germany, 3HREM Research Inc., 14-48 Matsukazedai, 355-0055 Higashimatsuyama, Japan

IT-9-P-3362 EBSD and EDS Characterisation of Vanadium rich β Phase Lamella in Advanced Titanium Alloys (PDF, HTML)
Stephens C. J.1
1Thermo Fisher Scientific

IT-9-P-3490 Composite crystal structures of MxCuO2 cuprates; (Mx = Li2, Ca.83, Sr.73, Ba.67, [(Sr/Ca)2Cu2O3]1/√2, Na) (PDF, HTML)
Milat O.1, Salamon K.1, Demoli N.1
1Institute of Physics, Bijenička 46, HR 1000 Zagreb, Croatia

IT-9-P-5870 Error Analysis of the Crystal Orientations and Misorientations obtained by the Classical Electron Backscatter Diffraction Method (PDF, HTML)
Ram F.1, Zaefferer S.1
1Max-Planck-Institut für Eisenforschung GmbH, Düsseldorf, Germany

IT-9-P-5883 Indexing electron diffraction patterns from randomly-oriented crystals (PDF, HTML)
Wang Y. C.1, Wan W.1, Zou X. D.1
1Stockholm University, Stockholm, Sweden

IT-9-P-5973 In situ observation of reverse transformation in steels using EBSD measurement at elevated temperature (PDF, HTML)
Masaaki Sugiyama and Akira Taniyama
Innovative Structural Materials Association (ISMA), Futtsu branch located in Nippon Steel & Sumitomo Metal Corporation

IT-10-IN-1695 Colouring atoms in 3 dimensions (PDF, HTML)
Bals S.1, Goris B.1, Altantzis T.1, Van Tendeloo G.1
1EMAT, University of Antwerp, Belgium

IT-10-IN-3013 Functional soft matter (PDF, HTML)
Friedrich H.1
1Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, Den Dolech 2, 5612AZ Eindhoven, The Netherlands

IT-10-O-1637 Combined tilt- and focal series scanning transmission electron microscopy: TFS 3D STEM (PDF, HTML)
Dahmen T.1, Baudoin J. P.2, Lupini A. R.3, Kuebel C.4, Slusallek P.1, de Jonge N.5
1German Research Center for Artificial Intelligence GmbH, Saarbrücken, Germany, 2Department of Molecular Physiology and Biophysics, Vanderbilt University School of Medicine, Nashville, TN, USA, 3Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA, 4KIT –Karlsruhe Institute for Technology, Eggenstein-Leopoldshafen, Germany, 5INM – Leibniz Institute for New Materials, Saarbrücken, Germany

IT-10-O-1863 Towards mass contrast in 3D atomic resolution tomographic reconstructions from HRTEM images with the inverse dynamical electron scattering method (PDF, HTML)
Van den Broek W.1, Koch C. T.1
1Institute for Experimental Physics, Ulm University, Albert-Einstein-Allee 11, 89081 Ulm, Germany

IT-10-O-2126 Four-dimensional simultaneous EELS & EDX tomography of an Al-Si based alloy (PDF, HTML)
Haberfehlner G.1, Albu M.1, Orthacker A.1, Kothleitner G.1
1Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology & Centre for Electron Microscopy and Nanoanalysis, Graz, Austria

IT-10-O-2253 Possibilities and limitations for atom counting using quantitative ADF STEM (PDF, HTML)
De Backer A.1, Martinez G. T.1, MacArthur K. E.2, Jones L.2, Béché A.1, Nellist P. D.2, Van Aert S.1
1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium, 2Department of Materials, University of Oxford, Oxford, United Kingdom

IT-10-O-2435 Towards 4-D EEL spectroscopic scanning confocal electron microscopy (SCEM-EELS) optical sectioning on a Cc and Cs double-corrected transmission electron microscope (PDF, HTML)
Wang P.1, Boothroyd C. B.2, Dunin-Borkowski R. E.2, Kirkland A. I.3, Nellist P. D.3
1National Laboratory of Solid State Microstructures and College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, People’s Republic of China, 2ER-C and PGI5, Forschungszentrum Jülich, D-52425 Jülich, Germany, 3Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK

IT-10-O-2543 On-axis electron tomography of needle-shaped biological samples (PDF, HTML)
Saghi Z.1, Divitini G.1, Winter B.2, Spiecker E.2, Ducati C.1, Midgley P. A.1
1(1) Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, UK, 2(2) Center for Nanoanalysis and Electron Microscopy (CENEM), Department Werkstoffwissenschaften / VII, Universität Erlangen-Nürnberg, Cauerstraße 6, 91058 Erlangen, Germany

IT-10-O-2765 A method for quantitative analysis and improvement of 3D electrostatic nanopotentials reconstructed by electron holographic tomography (PDF, HTML)
Wolf D.1, Lubk A.1, Lichte H.1
1Triebenberg Laboratory, Institute of Structure Physics, Technische Universität Dresden, Dresden, Germany

IT-10-O-2787 EELS and tomography: from EELS Spectrum Images to Spectrum Volumes. (PDF, HTML)
Yedra L.1,2, Eljarrat A.1, Rebled J. M.1,3, López-Conesa L.1, Dix N.3, Sanchez F.3, Estradé S.1,2, Peiró F.1
1Laboratory of Electron Nanoscopies (LENS)- MIND/IN2UB, Dept. d'Electrònica, Universitat de Barcelona, Barcelona, Spain, 2CCiT, Scientific and Technical Centers, Universitat de Barcelona, Barcelona, Spain, 3Institut de ciencia dels materials de Barcelona (ICMAB), Bellaterra, Spain

IT-10-O-2806 Electron cryo-tomography with a new type of phase plate (PDF, HTML)
Danev R.1, Buijsse B.2, Fukuda Y.1, Khoshouei M.1, Plitzko J.1, Baumeister W.1
1Max Planck Institute of Biochemistry, Martinsried, Germany, 2FEI, Eindhoven, The Netherlands

IT-10-O-2812 Fast tomography acquisition for in situ 3D analysis of nanomaterials under variable gas and temperature conditions in Environmental-TEM (PDF, HTML)
EPICIER T.1, 2, ROIBAN L.1, LI S.2, AOUINE M.2, SANTOS AIRES F. C.2, TUEL A.2, FARRUSSENG D.2
1MATEIS, INSA de Lyon, Université Lyon I, 69621 Villeurbanne Cedex, France, 2IRCELYON,Université Lyon I, 2, Av. A. Einstein, 69626 Villeurbanne Cedex, France

IT-10-O-2946 Advanced 3-D Reconstruction Algorithms for Electron Tomography (PDF, HTML)
Arslan I.1, Sanders T.2, Binev P.2, Roehling J. D.3, Batenburg K. J.4, Gates B. C.3, Katz A.5
1Pacific Northwest National Laboratory, Richland, WA, USA, 2University of South Carolina, Columbia, SC, USA, 3University of California-Davis, Davis, CA, USA, 4University of Antwerp, Antwerp, Belgium, and Centrum Wiskunde & Informatica, Amsterdam, The Netherlands., 5University of California–Berkeley, Berkeley, CA, USA

IT-10-O-2962 Incoherent and coherent imaging for tomography of nano particle (PDF, HTML)
Chen F. R.1, Kisielowski C.2, Tsai C. Y.1, Van Dyck D.3
11. National Tsing Hua University, Hsin-Chu, Taiwan, , 22. NCEM & JCAP Berkeley, CA, USA, , 33. University of Antwerp, Belgium

IT-10-P-1482 Accuracy and applications of electron-beam deposited nano-dot fiducial markers in electron tomography of rod-shaped specimens (PDF, HTML)
Hayashida M.1, Kumagai K.1, Malac M.2 3, Bergen M.2
1National Institute of Advanced Industrial Science and Technology (AIST), 2National Institute of Nanotechnology, 3University of Alberta

IT-10-P-1681 Quantitative 360° electron tomography analysis of mesoporous hematite nanoparticles (PDF, HTML)
Winter B.1, Butz B.1, Distaso M.2, Dudák M.3, Kočí P.3, Klupp Taylor R. N.2, Peukert W.2, Spiecker E.1
1Center for Nanoanalysis and Electron Microscopy, FAU Erlangen-Nürnberg, Cauerstraße 6, 91058 Erlangen (Germany), 2Institute of Particle Technology, FAU Erlangen-Nürnberg, Cauerstraße 4, 91058 Erlangen (Germany), 3Institute of Chemical Technology, Technická 5, CZ 16628 Prague (Czech Republic)

IT-10-P-1698 The physical properties of plastic support films for 3-D transmission electron microscopy. (PDF, HTML)
Daraspe J.1, Longo G.2, Kizilyaprak C.1, Humbel B. M.1
1University of Lausanne, Electron Microscopy Facility, Lausanne Switzerland, 2EPFL, Laboratory of Physics of Living Matter, Lausanne, Switzerland

IT-10-P-1846 A Remote Control/Observation System and an Operation Support System for the Ultrahigh Voltage Electron Tomography (PDF, HTML)
Yoshida K.1, Nishi R.1, Yasuda H.1
1Research Center for Ultra High Voltage Electron Microscopy, Osaka University

IT-10-P-1866 A memory efficient method for 3D object reconstruction with HAADF STEM depth sectioning (PDF, HTML)
Van den Broek W.1, Rosenauer A.2, Van Aert S.3, Sijbers J.4, Van Dyck D.3
1Institute for Experimental Physics, Ulm University, Albert-Einstein-Allee 11, 89081 Ulm, Germany, 2Institut für Festkörperphysik (IFP), Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany, 3Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium, 4iMinds - Vision Lab, Department of Physics, University of Antwerp, Universiteitsplein 1, 2610 Antwerp, Belgium

IT-10-P-1875 Improving Depth of Focus in STEM Tomography using Focal Series (PDF, HTML)
TREPOUT S.1, MESSAOUDI C.1, BASTIN P.2, MARCO S.1
1Institut Curie / INSERM U759, Campus Universitaire d'Orsay, Bât. 112, 91405 ORSAY cedex FRANCE, 2Institut Pasteur, CNRS URA 2581, Parasitology & Mycology Department, Institut Pasteur, 25, rue du Docteur Roux, 75015 PARIS, FRANCE

IT-10-P-1904 Electron Holographic Tomography of Electric and Magnetic Stray Fields around Nanowires (PDF, HTML)
Lubk A.1, Wolf D.1, Lichte H.1
1Triebenberg Laboratory, TU Dresden, Dresden, Germany

IT-10-P-1980 Energy dispersive X-ray (EDX) tomography of bimetallic nanoparticles (PDF, HTML)
Slater T. J.1, Macedo A. M.2, Burke M. G.1, O'Brien P.1, Camargo P. H.2, Haigh S. J.1
1The University of Manchester, Manchester, UK, 2Universidade de Sao Paulo, Sao Paulo, Brazil

IT-10-P-2061 Whole-Cell Imaging of the Budding Yeast Saccharomyces cerevisiae by High-Voltage Scanning Transmission Electron Tomography (PDF, HTML)
Murata K.1, Esaki M.2, Ogura T.2, Arai S.3, Yamamoto Y.3, Tanaka N.3
1National Institute for Physiological Sciences, Okazaki, Aichi, 444-8585, Japan, 2Institute of Molecular Embryology and Genetics, Kumamoto University, Kumamoto, 860-0811, Japan, 3Ecotopia Science Institute, Nagoya University, Nagoya, Aichi, 464-8603, Japan

IT-10-P-2098 Cryo-STEM Tomography for 3D Analysis of Cell Structure (PDF, HTML)
Aoyama K.1,2
1Application Laboratory FEI Japan, Tokyo, Japan, 2Osaka University, Osaka, Japan

IT-10-P-2123 3D electron tomography analysis of silicon nanoparticles in SiC matrices by quantitative determination of EELS plasmon intensities (PDF, HTML)
Xie L.1, Jarolimek K.2, Van Swaaij R.2, Thersleff T.1, Zeman M.2, Leifer K.1
1Uppsala University, Department of Engineering Sciences, Applied Materials Sciences, Box 534, SE-751 21 Uppsala, Sweden., 2Photovoltaic Materials and Devices, Delft University of Technology, P.O. Box 5031, 2600 GA Delft, The Netherlands.

IT-10-P-2238 EELS CS tomography of FeO-Fe3O4 core-shell nanoparticles. An approach to recover 3D oxidation state distribution. (PDF, HTML)
Torruella P.1, Arenal R.2,5, Saghi Z.3, Yedra L.1,4, Eljarrat A.1, de la Peña F.3, Midgley P. A.3, Estradé S.1,4, Peiró F.1, Estrader M.6, López-Ortega A.7, Salazar-Alvarez G.8, Nogués J.9,10,11
1LENS–MIND-IN2UB, Dept.d’Electrònica, Universitat de Barcelona, Barcelona, Spain , 2LMA, Instituto de Nanociencia de Aragon, Universidad de Zaragoza, Zaragoza, Spain, 3Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, United Kingdom, 4CCiT, Universitat de Barcelona, Barcelona, Spain, 5Fundacion ARAID, Zaragoza, Spain, 6Departament de Química Inorgànica, Universitat de Barcelona, Barcelona, Spain, 7INSTM and Dipartimento di Chimica “U. Schiff”, Università degli Studi di Firenze, Firenze, Italy, 8Department of Materials and Environmental Chemistry, Arrhenius Laboratory, Stockholm University, Stockholm, Sweden, 9Departament de Física, Universitat Autònoma de Barcelona, Bellaterra (Barcelona), Spain, 10ICN2 – Institut Catala de Nanociencia i Nanotecnologia, Campus UAB, Bellaterra (Barcelona), Spain, 11Institució Catalana de Recerca i Estudis Avançats (ICREA), Barcelona, Spain

IT-10-P-2280 Tomography in Analytical Transmission Electron Microscopy of Nanomaterials (PDF, HTML)
Orthacker A.1, Haberfehlner G.1, Tändl J.3, Poletti M. C.3, Kothleitner G.1,2
1Center for Electron Microscopy, Graz, Austria, 2Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Graz, Austria, 3Institute for Materials Science and Welding, Graz University of Technology, Graz, Austria

IT-10-P-2420 Tilt-less Electron Tomography (PDF, HTML)
Oveisi E.1, Letouzey A.2, Lucas G.1, Cantoni M.1, Schäublin R.3, Fua P.2, Hebert C.1
1Interdisciplinary Centre for Electron Microscopy, Ecole Polytechnique Fédérale de Lausanne (EPFL), Switzerland, 2Computer Vision Laboratory, Ecole Polytechnique Fédérale de Lausanne (EPFL), Switzerland, 3Centre de Recherches en Physique des Plasmas, Ecole Polytechnique Fédérale de Lausanne (EPFL), Switzerland

IT-10-P-2426 Nonlinear intensity attenuation in bright-field TEM images and its influence on tomographic reconstruction of micron-sized materials (PDF, HTML)
Yamasaki J.1, Mutoh M.1, Ohta S.2, Yuasa S.2, Arai S.1, Sasaki K.1, Tanaka N.1
1Nagoya University, Nagoya, Japan, 2JEOL Ltd., Akishima, Japan

IT-10-P-2565 Using transmission electron tomography to unravel the structure of hybrid active layers in non volatile memory elements (PDF, HTML)
Girleanu M.1,2, Nau S.3, Sax S.3, List-Kratochvil E.3,4, Soliwoda K.5, Celichowski G.5, Grobelny J.5, Brinkmann M.1, Ersen O.2
1Institut Charles Sadron, UPR-22 CNRS, 23 rue du Loess, BP 84047, 67034 Strasbourg cedex 2, France, 2Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS-UdS, 23 rue du Loess BP43, 67034 Strasbourg cedex 2, France, 3NanoTecCenter Weiz Forschungsgesellschaft mbH, Franz-Pichler-Straße 32, A-8160 Weiz, Austria, 4Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, 8010 Graz, Austria, 5Department of Materials Technology and Chemistry, Faculty of Chemistry, University of Lodz, Pomorska 163, 90-236 Lodz, Poland

IT-10-P-2603 Analysis of bainitic transformation process in Cu-Al-Mn Alloy by using an orthogonally arranged FIB-SEM for precise 3D microstructure analysis (PDF, HTML)
Motomura S.1, Hara T.2, Nishida M.3, Omori T.4, Kainuma R.5, Asahata T.6, Fujii T.7
1Interdisciplinary Graduate School of Engineering Science, Kyushu University, Kasuga, Fukuoka 8168580, Japan, 2Advanced Key Technology Division, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan, 3Faculty of Engineering Science, Department of Engineering Science for Elec-tronics and Materials, Kyushu University, Kasuga, Fukuoka 8168580, Japan, 4Department of Metallugy, Materiale Science, and Materials Processing, Grad-uate School of Engineering, Tohoku University, Aoba-yama 02, Aoba-ku, Sen-dai 9808579, Japan, 5Department of Metallugy, Materiale Science, and Materials Processing, Graduate School of Engineering, Tohoku University, Aoba-yama 02, Aoba-ku, Sen-dai 9808579, Japan, 6Hitachi High-Tech Science, Corp. 36-1 Takenoshita, Oyama-cho, Sunto-gun, Shizuoka 4101393, Japan, 7Hitachi High-Tech Science, Corp. 36-1 Takenoshita, Oyama-cho, Sunto-gun, Shizuoka 4101393, Japan

IT-10-P-2637 Combined 3D characterization of porous zeolites by STEM and FIB tomography (PDF, HTML)
Beltrán A. M.1, Przybilla T.1, Winter B.1, Knoke I.1, Machoke A.2, Schwieger W.2, Spiecker E.1
1Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science and Engineering, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstrasse 6, 91058 Erlangen, Germany, 2Lehrstuhl für Chemische Reaktionstechnik, Friedrich-Alexander-Universität Erlangen-Nürnberg, Egerlandstrasse 3, 91058 Erlangen, Germany

IT-10-P-2720 Prospects of Electron Holographic Tomography at Atomic Resolution : Linear Reconstruction of Dynamic Scattering using Simulated Tilt Series (PDF, HTML)
Krehl J.1, Lubk A.1, Lichte H.1
1TU Dresden, Dresden, Germany

IT-10-P-2985 Autofocus method with high-definition TV camera for ultrahigh voltage electron microscope tomography (PDF, HTML)
Nishi R.1, Kanaji A.1, Yoshida K.1, Kajimura N.1, Nishida T.1, Isakozawa S.2
1Osaka University, Osaka Japan, 2Hitachi High-Technologies Corporation, Ibaraki, Japan

IT-10-P-3102 Compressed-sensing EDX Tomography of Composite Nanowires (PDF, HTML)
Yeoh C. S.1, Saghi Z.1, Midgley P. A.1
1Department of Materials Science and Metallurgy, University of Cambridge, UK

IT-10-P-3208 Electron tomography in the scanning electron microscope (PDF, HTML)
Ferroni M.1, Migliori A.2, Morandi V.2, Ortolani L.2, Pezza A.2, Sberveglieri G.1
1Department of Information Engineering, University of Brescia and CNR-INO, Via Valotti 9, 25123 Brescia - Italy, 2CNR-IMM Section of Bologna, via Gobetti 101, 40129 Bologna, Italy

IT-10-P-3212 Phase Contrast Cryo-Electron Tomography with a New Phase Plate (PDF, HTML)
Khoshouei M.1, Danev R.1, Gerisch G.2, Ecke M.2, Plitzko J.1, Baumeister W.1
1Max Planck Institute of Biochemistry, Department of Molecular Structural Biology, Martinsried, 82152, Germany. , 2Max Planck Institute of Biochemistry, Department of Cell Dynamics, Martinsried, 82152, Germany.

IT-10-P-3225 Dedicated and innovative system for tomography in the Scanning Electron Microscope (PDF, HTML)
Morandi V.1, Migliori A.1, Ortolani L.1, Pezza A.1, Maccagnani P.1, Masini L.1, Ferroni M.2, Sberveglieri G.2, Rossi M.3, Vittori-Antisari M.4, Vinciguerra P.5, Pallocca G.5, Del Marro M.5
1CNR-IMM Bologna Section, Bologna, Italy, 2Dept. of Information Engineering, Brescia University, Brescia, Italy, 3Dept. of Basic and Applied Sciences for Engineering, Sapienza University, Roma, Italy, 4Unità Tecnica Tecnologie dei Materiali, ENEA Casaccia, Roma, Italy, 5Assing S.P.A., Roma, Italy

IT-10-P-3301 Improved Electron Tomography Image Reconstruction usingCompressed Sensing based Adaptive Dictionaries. (PDF, HTML)
AlAfeef A.1, Cockshott W. P.1, MacLaren I.2, McVitie S.2
1School of Computing Science, University of Glasgow, Glasgow G12 8QQ, UK, 2SUPA School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK

IT-10-P-3455 Use your smartphone to calibrate your TEM's goniometer (PDF, HTML)
Wollgarten M.1, Stapel H.1, Garcia-Moreno F.1
1Helmholtz Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, Germany

IT-10-P-5857 3D imaging of Si FinFETs by combined HAADF-STEM and EDS tomography (PDF, HTML)
Qiu Y.1, 2, Van Marcke P.1, Richard O.1, Bender H.1, Wilfried V.1, 2
1Imec, Kapeldreef 75, B-3001 Leuven, Belgium , 2Instituut Kern-en Stralings Fysika, K.U.Leuven, B-3001, Leuven, Belgium

IT-10-P-6047 Multi-Axis Electron-Holographic Tomography (PDF, HTML)
Sturm S.1, Wolf D.1, Lubk A.1, Lichte H.1
1Triebenberg Laboratory, Institute of Structure Physics, Technische Universität Dresden, Germany

IT-11-IN-1935 Atomic Resolution Electron Diffractive Imaging and 3D (PDF, HTML)
Zuo J. M.1, Lyu X. W.1, Gao W. P.1, Meng Y. F.1
1Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, 61801, USA

IT-11-IN-5757 Towards atomic resolution and three-dimensional mapping of electrostatic potentials and magnetic fields using off-axis electron holography (PDF, HTML)
Dunin-Borkowski R. E.1
1Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, D-52425 Jülich, Germany

IT-11-O-1464 Split-illumination electron holography (PDF, HTML)
Tanigaki T.1, Aizawa S.1, Park H. S.1, Matsuda T.2, Harada K.3, Murakami Y.1,4, Shindo D.1,4
1Center for Emergent Matter Science (CEMS), RIKEN, Saitama, Japan, 2Japan Science and Technology Agency, Saitama, Japan , 3Central Research Laboratory, Hitachi Ltd., Saitama, Japan, 4Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan

IT-11-O-1669 Electrostatic potential of single-layer graphene measured using electron holography and ab-initio calculations (PDF, HTML)
Chang S.1, Dwyer C.1, Nicholls R.2, Boothroyd C. B.1, Bangert U.3, Dunin-Borkowski R. E.1
1Ernst Ruska-Centrum, Forschungszentrum Juelich, Germany 1, 2Department of Materials, University of Oxford, UK 2, 3Department of Physics and Energy, University of Limerick, Ireland 3

IT-11-O-1798 Low-voltage electron diffraction microscopy of multi-layer graphene (PDF, HTML)
Kamimura O.1, Dobashi T.1, Maehara Y.2, Kitaura R.3, Shinohara H.3, Gohara K.2
1Central Research Laboratory, Hitachi, Ltd., 2Division of Applied Physics, Faculty of Engineering, Hokkaido University, 3Department of Chemistry & Institute for Advanced Research, Nagoya University

IT-11-O-1905 Electron Holographic Tomography of Mean Free Path Lengths with nm-Resolution (PDF, HTML)
Lubk A.1, Wolf D.1, Röder F.1, Lichte H.1
1Triebenberg Laboratory, TU Dresden, Dresden, Germany

IT-11-O-2018 Mapping the number of graphenes for whole micron-size flakes by mean of low voltage electron holography (PDF, HTML)
Castro C.1, Ortolani L.2, Arenal R.3,4, Monthioux M.1, Masseboeuf A.1
1CEMES, University of Toulouse, Toulouse, France, 2CNR IMM-Bologna, Bologna, Italy, 3Laboratorio de Microscopias Avanzadas, Instituto de Nanociencia de Aragon (INA), Universidad de Zaragoza, Calle Mariano Esquillor, Zaragoza, Spain, 4Fundacion ARAID, Zaragoza, Spain

IT-11-O-2326 Quantitative comparison of experimental and calculated image waves at atomic resolution (PDF, HTML)
Niermann T.1, Lehmann M.1
1Institut für Optik und Atomare Physik, Technische Universität Berlin, Straße des 17. Juni 135, 10623 Berlin, Germany

IT-11-O-2383 Coherent imaging beyond detector area and Abbe limit, towards atomic resolution (PDF, HTML)
Latychevskaia T.1, Fink H-W1
1Physics Institute, University of Zurich, Winterthurerstrasse 190, 8057 Zurich, Switzerland

IT-11-O-2391 Electron exit wave reconstruction in Gaussian basis: from high resolution image to diffraction pattern (PDF, HTML)
Borisenko K. B.1, Allen C. S.1, Warner J. H.1, Kirkland A. I.1
1Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK

IT-11-O-2513 Observation of electric field using electron diffractive imaging (PDF, HTML)
Yamasaki J.1, Ohta K.1, Sasaki H.2, Tanaka N.1
1Nagoya University, Nagoya, Japan, 2Furukawa Electric Co., Ltd., Yokohama, Japan

IT-11-O-2667 Caustics and diffraction from two oppositely biased metallic tips imaged in the coherent transmission electron microscope (PDF, HTML)
Tavabi A. H.1, Migunov V.1, Dunin-Borkowski R. E.1, Pozzi G.2
1Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungzentrum Jülich, Jülich, Germany , 2Department of Physics and Astronomy, University of Bologna, Viale B. Pichat 6/2, 40127 Bologna, Italy

IT-11-O-2781 Towards electron holography of 3D magnetization distributions in nanoscale materials using a model-based iterative reconstruction technique (PDF, HTML)
Caron J.1, Ungermann J.2, Dunin-Borkowski R. E.1, Riese M.2
1Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Research Centre Jülich GmbH, Jülich, Germany, 2Institute of Energy and Climate Research – Stratosphere (IEK-7), Research Centre Jülich GmbH, Jülich, Germany

IT-11-O-3089 Electrical charge quantification by electron holography (PDF, HTML)
Gatel C.1, Lubk A.2, Pozzi G.3, De Knoop L.1, Snoeck E.1, Hytch M. J.1
1CEMES-CNRS and Université de Toulouse, 29 rue Jeanne Marvig, 31055 Toulouse, France, 2Institute of Structure Physics, Technische Universität Dresden, Mommsenstr. 9, 01069 Dresden, Germany, 3Department of Physics and Astronomy, University of Bologna, Viale Berti Pichat 6/2, 40127, Bologna, Italy

IT-11-P-1472 Restoration of Singularities in Reconstructed Phase of Crystal Image in Electron Holography (PDF, HTML)
Li W.1,3, Tanji T.2,3
1Graduate School of Engineering, Nagoya University, Nagoya, Japan, 2EcoTopia Science Institute, Nagoya University, Nagoya, Japan, 3Global Research Center for Environment and Energy Based on Nanomaterials Science, Nagoya, Japan

IT-11-P-1514 Observation of the magnetic flux and three-dimensional structure of skyrmion lattices by electron holography (PDF, HTML)
PARK H. S.1, Yu X.1, Aizawa S.1, Tanigaki T.1, Akashi T.2, Takahashi Y.2, Matsuda T.3, Kanazawa N.4, Onose Y.5, Shindo D.1, 6, Tokura Y.1, 4
1RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama, Japan, 2Central Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama, Japan, 3Japan Science and Technology Agency, Saitama, Japan , 4Department of Applied Physics and Quantum-Phase Electronics Center (QPEC), University of Tokyo, Tokyo, Japan, 5Department of Basic Science, University of Tokyo, Tokyo, Japan, 6Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan

IT-11-P-1535 Strain fields in the vicinity of SiGe nanopyramids evidenced by focus series phase retrieval imaging (PDF, HTML)
Donnadieu P.1, Neisius T.2, Liu K.3,4, Aqua J. N.4, Ronda A.3, Berbezier I.3
1SIMAP CNRS, Université de Grenoble Alpes, Domaine Universitaire BP 75 38402 Saint Martin d'Hères France, 2Université Paul Cézanne - Campus St Jérôme - 13397 Marseille France, 3IM2NP – CNRS, Université Paul Cézanne 13397 Marseille France, 4INSP - UPMC - 4 place Jussieu, 75252 Paris France

IT-11-P-1545 A thin film Zernike phase plate micro fabricated using MEMS technology. (PDF, HTML)
Konyuba Y.1, Iijima H.1, Abe Y.2, Suga M.1, Ohkura Y.1
1JEOL Ltd., 2Yamagata Research Institute of Technology

IT-11-P-1659 Factors affecting phase noise in off-axis electron holography (PDF, HTML)
Boothroyd C. B.1, Dwyer C.1, Chang S.1, Dunin-Borkowski R. E.1
1Ernst Ruska-Centrum und Peter Grünberg Institut, Forschungszentrum Jülich, D-52425 Jülich, Germany

IT-11-P-1673 Observation of Fraunhofer Diffraction Pattern with Electron Vortex Beam using Fork-Shaped Grating with Various Opening Shapes (PDF, HTML)
Harada K.1, Kohashi T.1, Iwane T.1
1Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-0395, Japan

IT-11-P-1676 Noise estimation for off-axis electron holography (PDF, HTML)
Röder F.1, Lubk A.1, Wolf D.1, Niermann T.2
1Triebenberg-Labor, Technische Universität Dresden, 01062 Dresden, Germany, 2Institut für Optik und Atomare Physik, Technische Universität Berlin, Straße des 17. Juni 135, 10623 Berlin, Germany

IT-11-P-1720 Operating principles and practical applications of hole-free phase plate imaging (PDF, HTML)
Malac M.1,2, Kawasaki M.3, Beleggia M.4, Pollard S.5, Zhu Y.5, Egerton R.2,1, Okura Y.6
1National Institute of Nanotechnology, Edmonton, Canada., 2Department of Physics, University of Alberta, Edmonton, Canada., 3JEOL USA Inc., MA 01960, USA., 4Center for Electron Nanoscopy, Technical University of Denmark, Lyngby, Denmark., 5Brookhaven National Laboratory, Upton, New York, USA., 6JEOL Ltd., Akishima, Tokyo 198-8558, Japan.

IT-11-P-1723 Direct Observation of Magnetic Domain Walls by Lens-Less Foucault Imaging (LLFI) (PDF, HTML)
Taniguchi Y.1, Matsumoto H.2, Harada K.3
1Advanced Microscope Systems Design Dept., Hitachi High-Technologies Corp., Hitachinaka, JAPAN, 2Application Development Dept., Hitachi High-Technologies Corp., Hitachinaka, JAPAN, 3Central Research Laboratory, Hitachi Ltd., Hatoyama, JAPAN

IT-11-P-1725 Twin-Foucault Imaging for Observing 180° Domains in Magnetic Materials (PDF, HTML)
Harada K.1
1Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-0395, Japan

IT-11-P-1727 Observation of Magnetic Field by Combination of Electron Tomography and Holography (PDF, HTML)
Tsuneta R.1, Ikeda M.1, Ono S.1, Yamane M.1, Sugawara A.1, Harada K.1, Koguchi M.1
1Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-0395, Japan

IT-11-P-1784 Accumulation Processing in Reconstruction for Electron Holography (PDF, HTML)
Kasai H.1, Harada K.1
1Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-0395, JAPAN

IT-11-P-1790 Phase Reconstruction in Annular Bright Field STEM (PDF, HTML)
Ishida T.1, Kawasaki T.1, Kodama T.2, Ogai K.3, Ikuta T.4, Tanji T.1
1Nagoya University, Nagoya, Japan, 2Meijo University, Nagoya, Japan, 3APCO Ltd., Hachioji, Japan, 4Osaka Electro-Communication University, Neyagawa, Japan

IT-11-P-1940 Experimental evaluation of magnetic phase reconstruction in Lorentz TEM using the ‘transport-of-intensity’ equation (PDF, HTML)
Kohn A.1, Habibi A.1
1Department of Materials Engineering and Ilse Katz Institute for Nanoscale Science and Technology, Ben-Gurion University of the Negev

IT-11-P-1945 Dopant mapping in thin FIB prepared silicon samples by off-axis electron holography (PDF, HTML)
Kohn A.1, Pantzer A.1,2, Vakahy A.2, Eliyahou Z.1, Levi G.2, Horvitz D.2
1Department of Materials Engineering and Ilse Katz Institute for Nanoscale Science and Technology, Ben-Gurion University of the Negev , 2Micron Semiconductors Israel Ltd.

IT-11-P-1954 Specimen Charging Measured by Off-axis Electron Holography (PDF, HTML)
McLeod R. A.1, Beleggia M.2,3, Malac M.4
1Fondation Nanosciences, Grenoble, France, 2Denmark Technical University, Lyngby, Denmark, 3Hemholtz-Zentrum-Berlin, Berlin, Germany, 4National Institute for Nanotechnology, Edmonton, Canada

IT-11-P-2006 Solving the transport of intensity equation using flux-preserving boundary conditions (PDF, HTML)
Parvizi A.1, Koch C. T.1
1Institute for Experimental Physics, Ulm University, Albert-Einstein-Allee 11, 89081 Ulm, Germany

IT-11-P-2111 Optimisation of spatial and phase resolution of off-axis electron holography for detection of single dopant atoms. (PDF, HTML)
Mayall B.1, McLeod R. A.2,3, Cooper D.1
1CEA-LETI, Minatec, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France, 2Fondation Nanosciences, Grenoble, France, 3CEA-INAC, Minatec, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France

IT-11-P-2202 Toward a 3D strain mapping at nanometer scale with Dark-Field Electron Holography (PDF, HTML)
Javon E.1, Gatel C.2, Hÿtch M. J.2, Bals S.1, Van Tendeloo G.1
1EMAT, University of Antwerp, Antwerp, Belgium, 2CEMES-CNRS and Université de Toulouse, Toulouse, France

IT-11-P-2409 Low-keV electron microscope based on a single-atom electron source (PDF, HTML)
Chang W. T.1, Lin C. Y.1, Hsu W. H.1, Chen Y. S.1, Hwang I. S.1
1Institute of Physics, Academia Sinica, Taipei, Taiwan, R.O.C.

IT-11-P-2437 Reconstruction of the projected crystal potential using HRTEM – prospects for materials science investigations (PDF, HTML)
Lentzen M.1, Barthel J.2
1Ernst Ruska Centre, Research Centre Jülich, Jülich, Germany, 2Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany

IT-11-P-2687 Direct Imaging of Two-Dimensional Electron Gas at Oxide Interfaces using Inline Electron Holography (PDF, HTML)
Song K.1, Ryu S.2, Lee H.2, Choi S.3, Paudel T. R.6, Koch C. T.4, Rzchowski M. S.5, Tsymbal E. Y.6, Eom C.2, Oh S.1
1POSTECH, Pohang, Republic of Korea, 2University of Wisconsin-Madison, Madison, USA, 3Korea Institute of Materials Science, Changwon, Republic of Korea, 4Ulm University, Ulm, Germany, 5University of Wisconsin-Madison, Madison, USA, 6University of Nebraska, Lincoln, USA

IT-11-P-2718 80 kV double biprism electron holography (PDF, HTML)
Genz F.1, Niermann T.1, Lehmann M.1
1Technische Universität Berlin, Institut für Optik und Atomare Physik, Straße des 17. Juni 135, 10623 Berlin, Germany

IT-11-P-2738 Nanoscale strain analysis by dark-field electron holography of shallow trench isolation structures for MOSFET technology (PDF, HTML)
Ravaux F.1, Cherkashin N.2, Lolivier J.3, Alexander D. T.1
1Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland, 2CEMES-CNRS, Toulouse, France, 3EM Microelectronic SA, Marin, Switzerland

IT-11-P-2745 Electron Holography and Electron Energy Loss Spectroscopy for Studying Electrochemical Reactions at Electrode/Electrolyte Interfaces in a Lithium-Ion Battery (PDF, HTML)
Hirayama T.1, Yamamoto K.1, Shimoyamada A.1, Yoshida R.1, Iriyama Y.2
1Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2Department of Materials, Physics and Energy Engineering, Nagoya University

IT-11-P-2987 Distribution of electric field and mechanical vibrations of CdS nanocombs during field emission (PDF, HTML)
Migunov V.1, Duchamp M.1, Liu R.3, Kamran M. A.3, Zuo B.3, Li Z.2, Farle M.2, Dunin-Borkowski R. E.1
1Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Gruenberg Institute, Forschungszentrum Juelich, Juelich, Germany, 2Faculty of Physics and Center of Nanointegration (CeNIDE), University of Duisburg-Essen, Duisburg, Germany, 3Beijing Key Lab of Nanophotonics and Ultrafine Optical Systems, School of Physics, Beijing Institute of Technology, Beijing, China

IT-11-P-3018 Experimental electron holographic tomography of magnetic vector fields in nanoscale materials (PDF, HTML)
Diehle P.1, Caron J.1, Kovacs A.1, Ungermann J.2, Kardynal B.3, Dunin-Borkowski R. E.1
1Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute 5, Forschungszentrum Jülich, Jülich, Germany, 2Institute of Energy and Climate Research, Forschungszentrum Jülich, Jülich, Germany, 3Institute of Semiconductor Nanoelectronics and Peter Grünberg Institute 9, Forschungszentrum Jülich, Jülich, Germany

IT-11-P-3140 Electron Beam induced Currents in GaN p-n Junctions (PDF, HTML)
Park J. B.1, Niermann T.1, Lehmann M.1
1Institut für Optik und Atomare Physik, Technische Universität Berlin, Straße des 17. Juni 135, D-10623 Berlin, Germany

IT-11-P-3191 Hybridization of Off-Axis and Inline High-Resolution Electron Holography (PDF, HTML)
Ozsoy Keskinbora C.1, Boothroyd C. B.2, Dunin-Borkowski R. E.2, van Aken P. A.1, Koch C. T.3
1Max Planck Institute for Intelligent Systems, Stuttgart, Germany, 2Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany, 3Institute for Experimental Physics, Ulm University, Ulm, Germany

IT-11-P-3505 Electron holography for magnetic and electric in situ imaging (PDF, HTML)
Ponce A.1, Cantu-Valle J.1, Diaz Barriga E.2, Luna C.2, Mendoza-Santoyo F.1, Jose Yacaman M.1, Eder J.1
1University of Texas at San Antonio, 2Universidad Autónoma de Nuevo León

IT-12-IN-2866 Addressing Fundamental Problems in Information technology: Opportunities for X-Ray Photoelectron Spectromicroscopy (PDF, HTML)
Schneider C. M.1,2
1Peter Gruenberg Institute PGI-6, Research Centre Juelich, D-52425 Juelich, Germany, 2Faculty of Physics and CENIDE, University Duisburg-Essen, D-47057 Duisburg, Germany

IT-12-IN-3176 Towards 1.5λ resolution with low energy electrons (PDF, HTML)
Tromp R. M.1,2
1IBM T.J. Watson Research Center, Yorktown Heights, NY, 2Kamerlingh Onnes Laboratory, Leiden University, The Netherlands

IT-12-O-1893 Secondary electron quasi-simultaneous observation of energy selective imaging and diffraction in DualEEM (PDF, HTML)
Grzelakowski K. P.1
1OPTICON Nanotechnology, Wroclaw, Poland

IT-12-O-2156 Novel development of very high brightness and highly spin-polarized electron gun with a compact 3D spin manipulator for SPLEEM (PDF, HTML)
Koshikawa T.1, Yasue T.1, Suzuki M.1, Tsuno K.1, Goto S.2, Jin X.3, Takeda Y.4
1Osaka Electro-Communication Univ. , Osaka, Japan, 2San-yu Electronic Corp. , Tokyo, Japan, 3School of Engineering, Nagoya Univ., Nagoya, Japan , 4Aichi Synchrotron Radiation Center, Seto, Japan

IT-12-O-2690 Time-of-Flight Momentum Microscopy with Imaging Spinfilter: Dirac-Type States on Clean and Oxygen-Covered W(110) and Mo(110) (PDF, HTML)
Medjanik K.1, Schönhense G.1, Chernov S.1, Schertz F.1, Nepijko S. A.1, Elmers H. J.1, Oelsner A.2, Tusche C.3, Kirschner J.3
1Institute of Physics, Johannes Gutenberg-University Mainz, Germany , 2Surface Concept GmbH Mainz, Germany, 3Max Planck Institute for Microstructure Physics, Halle, Germany

IT-12-O-2910 Shadow Dark-Field LEEM and Scanning Micro-LEED of Epitaxial Graphene on Ru(0001) and Ir(111) Surfaces (PDF, HTML)
Yu K. M.1, Man K. L.1, Altman M. S.1
1Hong Kong University of Science and Technology, Hong Kong, China

IT-12-P-3198 Detecting the topographic, chemical and magnetic contrasts with nanometer spatial resolution (PDF, HTML)
Zanin D. A.1, Erbudak M.1, De Pietro L. G.1, Cabrera H.1, Kostanyan A.1, Vindigni A.1, Pescia D.1, Ramsperger U.1
1Laboratory for Solid State Physics, ETH Zürich, Switzerland

IT-13-IN-2711 Advances in FIB Nanotomography (PDF, HTML)
Cantoni M.1, Knott G. W.1, Burdet P.2
1EPFL-CIME,Lausanne, Switzerland, 2Department of Materials Science and Metallurgy, EM Group University of Cambridge, United Kingdom

IT-13-IN-5748 Development of cryogenic FIB-SEM based processes for organic and inorganic samples (PDF, HTML)
Antoniou N.1
1ReVera Inc., Santa Clara, USA

IT-13-O-2039 FIB-SEM Tomography of biological samples: Strategy of preparation to resolve high-resolution 3-D volumes (PDF, HTML)
Kizilyaprak C.1, Daraspe J.1, Longo G.2, Humbel B. M.1
1University of Lausanne, Electron Microscopy Facility, Lausanne, Switzerland. , 2EPFL, Laboratory of Physics of Living Matter, Lausanne, Switzerland.

IT-13-O-2051 Modeling of Ion Generated Secondary Electrons (PDF, HTML)
Huh U.1, Ramachandra R.2, Joy D. C.3
1University of Tennessee, Knoxville, TN USA, 2University of California,San Diego, CA, , 3Oak Ridge National Laboratory, Oak Ridge, TN, USA

IT-13-O-2227 Temperature Evolution during FIB Processing of Soft Matter: From Fundamentals towards TEM Lamella Preparation (PDF, HTML)
Schmied R.1, Froech J. E.1, Orthacker A.1, Kraxner J.1, Hobisch J.2, Trimmel G.2, Plank H.1,3
1Center for Electron Microscopy, Graz, Austria, 2Institute for Chemistry and Technology of Materials, University of Technology, Graz, Austria, 3Institute for Electron Microscopy and Fine Structure Research, University of Technology, Graz, Austria

IT-13-O-2698 A focused Xe+-ion column for fast materials sputtering at high spatial resolution to carry out time-of-flight mass spectrometry with nanoscale precision within a scanning electron microscope (PDF, HTML)
Sedláček L.1, Hrnčíř T.1, Latzel M.2,3, Hoffmann B.2, Jiruše J.1, Christiansen S.2,4
1TESCAN Brno, s.r.o., Brno, Czech Republic, 2TDSU Photonic Nanostructures, Max Planck Institute for the Science of Light, Erlangen, Germany, 3Institute of Optics, Information and Photonics, University of Erlangen-Nuremberg, Erlangen, Germany, 4Helmholtz Center for Materials and Energy, Berlin, Germany

IT-13-P-1477 Development of Cryo-FIB technique for the structural characterization of liquid samples (PDF, HTML)
Tsuchiya M.1, Iwahori T.2, Morikawa A.3, Nagakubo Y.4
1Hitachi High-Technologies Corporation

IT-13-P-1484 Finding the needle in the haystack: FIB-SEM combined with array tomography to achieve higher Z-resolution in selected areas (PDF, HTML)
Wacker I. U.1, Bartels C.1, Grabher C.2, Schertel A.3, Schröder R. R.4
1Center for Advanced Materials, Universität Heidelberg, Heidelberg, Germany, 2Institute of Toxicology and Genetics, Karlsruhe Institute of Technology, Karlsruhe, Germany, 3Carl Zeiss Microscopy, Oberkochen, Germany, 4Cryo-EM, CellNetworks, BioQuant, Universitätsklinikum Heidelberg, Heidelberg, Germany

IT-13-P-1517 Cross sectional sample preparation of nanowires for TEM analysis using FIB (PDF, HTML)
Lenrick F.1, Ek M.1, Jacobsson D.2, Wallenberg L. R.1
1nCHREM / Center for Analysis and Synthesis, Lund University, Box 124, SE-221 00 Lund, Sweden, 2Division of Solid State Physics, Lund University, Box 118, SE-22100 Lund, Sweden

IT-13-P-1667 Method For Improving FIB Prepared TEM Samples By Very Low Energy Ar+ / Xe+ Ion Mill Polishing (PDF, HTML)
Kauffmann Y.1, Cohen-Hyams T.1, Kalina M.1, Kaplan W. D.1
1Department of Materials Science & Engineering, Technion IIT, Haifa, Israel

IT-13-P-1686 Focused ion beam sample preparation for atom probe tomography (PDF, HTML)
Cherezova V.1, Chelpanov V.1, Kurushin V.1, Filatov A.1
1Systems for Microscopy and Analysis LLC, Moscow, Russia

IT-13-P-1712 Sample preparation using Xenon IC-Plasma FIB: benefits and problems. (PDF, HTML)
Audoit G1, Estivill R2, Mariolle D1, Blot X1, Grenier A1, Barnes J P1, Cooper D1
1CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France., 2STMicroelectronics, 850 rue Jean Monnet, 38926 Crolles, France.

IT-13-P-1838 FOCUSED ION BEAM LITHOGRAPHY OF SUBWAVELENGTH PHOTONIC 3D-CHIRAL STRUCTURES (PDF, HTML)
Artemov V. V.1, Rogov O. Y.1, Gorkunov M. V.1
1Institute of Crystallography RAS

IT-13-P-1861 Measurement of TEM lamella thickness and Ga implantation in the FIB (PDF, HTML)
Lang C.1, Hiscock M.1, Dawson M.2, Hartfield C.2, Statham P. J.1
1Oxford Instruments NanoAnalysis, High Wycombe, UK, 2Oxford Instruments NanoAnalysis, Dallas, USA

IT-13-P-1915 Advances in ex situ lift out (PDF, HTML)
Giannuzzi L. A.1
1EXpressLO LLC

IT-13-P-1929 Influence of FIB milling on the determination of sp2/sp3 ratio of carbon materials (PDF, HTML)
Zhang X.1, Schneider R.1, Müller E.1, Mee M.2, Meier S.2, Gumbsch P.1, 2, Gerthsen D.1
1Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, 2Fraunhofer Institute for Mechanics of Materials IWM, Freiburg, Germany

IT-13-P-2055 Optimized Detection Limits in FIB-SIMS by Using Reactive Gas Flooding and High Performance Mass Spectrometers (PDF, HTML)
Wirtz T.1, Dowsett D.1, Philipp P.1, Eswara Moorthy S.1
1Department “Science and Analysis of Materials” (SAM), Centre de Recherche Public – Gabriel Lippmann, 41 rue du Brill, L-4422 Belvaux, Luxembourg

IT-13-P-2068 Characterization of carbonaceous contamination and the cleaning capability of atomic hydrogen during focused ion beam processing (PDF, HTML)
Steiger-Thirsfeld A.1, Basnar B.2, Tomastik C.3, Pongratz P.4, Lugstein A.2
1University Service Center for Transmission Electron Microscopy, Vienna University of Technology, Vienna, Austria, 2Institute of Solid State Electronics, Vienna University of Technology, Vienna, Austria, 3AC2T Research GmbH Austria, Wr. Neustadt, Austria, 4Institute of Solid State Physics, Vienna University of Technology, Vienna, Austria

IT-13-P-2075 Nanopatterning Plasmonic Structures Using Focused Ion Beam and E-Beam Lithography (PDF, HTML)
Cohen Hyams T.1, Spektor G.2, Gal L.2, Orenstein M.2
1Department of Materials Science & Engineering, Technion, Haifa, Israel, 2Department of Electrical Engineering, Technion, Haifa, Israel

IT-13-P-2432 Optimization of the sample preparation method for semiconductor dopant contrast observation with SEM (PDF, HTML)
Druckmüllerová Z.1,2, Kolíbal M.1,2, Vystavěl T.3, Šikola T.1,2
1Institute of Physical Engineering, Brno University of Technology, Brno, Czech Republic, 2CEITEC, Brno University of Technology, Brno, Czech Republic, 3FEI Company, Brno, Czech Republic

IT-13-P-2440 Channeling contrast: a cost effective alternative to EBSD orientation mapping in scanning focused probe instruments (SEM/FIB) ? (PDF, HTML)
Langlois C. T.1, Yuan H.1, Douillard T.1, Van de Moortele B.2, Descamps-Mandine A.3, Blanchard N.4, Epicier T.1
1MATEIS Laboratory, INSA Lyon, France, 2LGL laboratory, Ecole Normale Supérieure Lyon, France, 3INL Laboratory, INSA Lyon, France, 4Light Matter Institute, Claude Bernard University of Lyon, France

IT-13-P-2481 Cryogenic FIB Lift-out as a preparation method for damage-free soft matter TEM imaging  (PDF, HTML)
Parmenter C. D.1, Fay M. W.1, Hartfield C.2, Amdor G.2, Moldovan G.2
1University of Nottingham, 2Oxford Instruments Nanoanalysis

IT-13-P-2485 Characterization of Ga+ FIB Damage in Electron Beam Induced Deposited Platinum, Tungsten and Carbon Chemistries for In-situ S/TEM Sample Preparation (PDF, HTML)
Van Leer B.1, Landin T.1, Wall D.1, Roussel L.1
1FEI

IT-13-P-2498 FIB/SEM tomography for 3D visualization of virus infected fibroblasts with TEM-like resolution. (PDF, HTML)
Villinger C.1, 2, Neusser G.3, Kranz C.3, Walther P.2, Mertens T.1
1Institute of Virology, University Medical Center Ulm, Germany, 2Central Facility for Electron Microscopy, Ulm University, Germany, 3Institute of Analytical and Bioanalytical Chemistry, Ulm University, Germany

IT-13-P-2590 Enabling future Nanotomography and Nanofabrication with Crossbeam technology (PDF, HTML)
Schulmeyer I.1, Kienle M.1
1Carl Zeiss Microscopy GmbH, Carl-Zeiss-Str. 22, 73447 Oberkochen

IT-13-P-2616 In situ FIB/SEM micro-compression tests of layered crystals (PDF, HTML)
Schweizer P.1, Niekiel F.1, Butz B.1, Spiecker E.1
1Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science and Engineering, University of Erlangen-Nürnberg, Cauerstr. 6, 91058 Erlangen, Germany

IT-13-P-2701 High performance nanomachining using the new analytical FIB-SEM system (PDF, HTML)
Jiruše J.1, Havelka M.1, Haničinec M.1, Polster J.1, Hrnčíř T.1
1TESCAN Brno, s.r.o., Brno, Czech Republic

IT-13-P-2704 Focused ion beam patterning of boron-doped diamond electrodes: Influence of patterning parameters on the heterogeneous electron transfer behavior (PDF, HTML)
Eifert A.1, Langenwalter P.1, Higl J.2, Lindén M.2, Nebel C.3, Mizaikoff B.1, Kranz C.1
1Institute of Analytical and Bioanalytical Chemistry, University of Ulm, Ulm, Germany, 2Institute of Inorganic Chemistry II, University of Ulm, Ulm, Germany, 3Fraunhofer Institute for Applied Solid State Physics, Freiburg, Germany

IT-13-P-2724 Novel strategies towards faster and smoother FIB cross-sectioning (PDF, HTML)
Hrnčíř T.1, Dluhoš J.1, Haničinec M.1, Hrachovec V.2
1TESCAN Brno, s.r.o., Libušina třída 1, Brno, Czech Republic, 2ON Semiconductor Czech Republic, 1. máje 2230, Rožnov pod Radhoštěm, Czech Republic

IT-13-P-2741 Ultra-Fast Three Dimensional Microanalysis Using the Scanning Electron Microscope Equipped with Xenon Plasma Focused Ion Beam (PDF, HTML)
Dluhoš J.1, Petrenec M.1, Peřina P.1, Reinauer F.2, Kopeček J.3, Hrnčíř T.1, Jiruše J.1
1TESCAN Brno, s.r.o., Brno, Czech Republic, 2EDAX-AMETEK GmbH, Wiesbaden, Germany, 3Institute of Physics ASCR, v. v. i., Prague, Czech Republic

IT-13-P-2874 Targeted 3D-CLEM workflow on cultured cells (PDF, HTML)
Steyer A. M.1, Schieber N. L.1, Duishoev N.1, Pepperkok R.1, Kirmse R.2, Schertel A.2, Schwab Y.1
1EMBL Heidelberg, Meyerhofstraße 1, 69117 Heidelberg Germany, 2Carl Zeiss Microscopy GmbH, Oberkochen

IT-13-P-2936 Characterisation of the FIB Induced Damage in Diamond (PDF, HTML)
Rubanov S.1, Suvorova A.2
1University of Melbourne, Melbourne, Australia, 2The University of Western Australia, Perth, Australia

IT-13-P-2986 High quality site specific TEM cross section preparation of structured materials (PDF, HTML)
Graff A.1, Hübner S.1, Simon-Najasek M.1, Altmann F.1
1Fraunhofer Institute for Mechanics of Materials / Center for Applied Microstructure Diagnostics (CAM), Halle, Germany

IT-13-P-3033 About the accuracy of post-mortem alignment methods in FIB/SEM nano-tomography (PDF, HTML)
Yuan H.1,2, Van de Moortèle B.2, Epicier T.1,3
1University of Lyon, MATEIS, umr CNRS 5510, Bât. Blaise Pascal, INSA Lyon, 69621 Villeurbanne Cedex, France, 2University of Lyon, LGLTPE, umr CNRS 5276, ENS Lyon, 69364 Lyon Cedex 07, France, 3University of Lyon, IRCELYON, umr CNRS 5256, 2, Av. A. Einstein, 69626 Villeurbanne Cedex, France

IT-13-P-3258 FIB as Fabrication Tool for Advanced Analytical Infrared Sensing Schemes (PDF, HTML)
Sieger M.1, Neusser G.1, Schaedle T.1, Kranz C.1, Mizaikoff B.1
1Institute of Analytical and Bioanalytical Chemistry, University of Ulm, 89081 Ulm, Germany

IT-13-P-3393 USING THE FOCUSED ION BEAM MICROSCOPE TO DEVELOP DIFFRACTION GRATINGS FOR QUANTUM WELL INFRARED PHOTODETECTORS (PDF, HTML)
Rodrigues W.1, Schmidt W.1
1Microscopy Center from Federal University Minas Gerais

IT-13-P-5975 LIFE CELL IMMUNOGOLD LABELLING OF RNA POLYMERASE II visualized by Focused Ion Beam Scanning Electron Microscopy (SEM-FIB) (PDF, HTML)
Orlov I.1, Schertel A.2, Zuber G.3, Drillien R.1, Weiss E.4, Schultz P.1, Spehner D.1
1Integrative Structural Biology, IGBMC, UMR 7104, 67404 Illkirch, France, 2Carl Zeiss Microscopy GmbH, ASC, D-73447, Oberkochen, Germany, 3LCAMB UMR 7199, Faculty of Pharmacy, 67401 Illkirch, France, 4Biotechnology and Cell Signaling, UMR 7242, IREPS, 67412, Illkirch, France

IT-13-P-6027 Structural characterization of hybrid-organic nanocomposites via focus ion beam preparation and electron microscopy (PDF, HTML)
Ankah G. N.1, Büchele P.2, Tedde S. F.2, Adam J.1, Torrents O.1, Pfaff M.1, Poulsen K.3, Koch M.1, Gimmler C.3, Schmidt O.2, Kraus T.1
1INM - Leibniz Institute for New Materials, Campus D2.2, 66123 Saarbruecken, Germany, 2Siemens AG Corporate Technology, Günther-Scharowsky-Str. 1, 91058 Erlangen, Germany, 3Centrum für Angewandte Nanotechnologie (CAN) GmbH, Grindelallee 117, 20146 Hamburg, Germany

IT-13-P-6033 Structural and mechanical characterization of human dental tissues across multiple scales at the Oxford Multi-Beam Laboratory for Engineering Microscopy (MBLEM) (PDF, HTML)
Sui T.1, Ying S.1, Lunt A. J.1, Baimpas N.1, Landini G.2, Korsunsky A. M.1
1MBLEM, Department of Engineering Science, University of Oxford, UK, 2The School of Dentistry, College of Medical and Dental Sciences, University of Birmingham, St Chad's Queensway, Birmingham B4 6NN, UK

IT-14-IN-2450 Advances in quantitative and three-dimensional mapping of soft matter by bimodal force microscopy (PDF, HTML)
Garcia R.1
1Instituto de Ciencia de Materials de Madrid, CSIC

IT-14-IN-3211 Theory of Near-Field SEM: lateral resolution, scaling properties and compact equations (PDF, HTML)
Xanthakis J. P.1
1National Technical University of Athens, Athens, 15700 Greece

IT-14-O-1627 Using SPM nanomanipulation to discover new materials and properties (PDF, HTML)
Barboza A. P.1, Guimaraes M. H.1, Oliveira C. K.1, Massote D. V.1, Fernandes T. F.1, Archanjo B. S.2, Lacerda R. G.1, Batista R. J.3, Oliveira A. B.3, Mazzoni M. S.1, Chacham H.1, Neves B. R.1
1Universidade Federal de Minas Gerais, Belo Horizonte, Brazil, 2Inmetro, Duque de Caxias, Brazil, 3Universidade Federal de Ouro Preto, Ouro Preto, Brazil

IT-14-O-1830 In-situ Dynamic SPM Studies of Organic Semiconductor Thin Film Growth on Silicon Oxide (PDF, HTML)
Chiodini S.1, Straub A.1, Donati S.1, Borgatti F.1, Albonetti C.1, Biscarini F.2
1Consiglio Nazionale delle Ricerche, Istituto per lo Studio dei Materiali Nanostrutturati (CNR-ISMN), Bologna, Italy, 2Life Science Dept., Università di Modena e Reggio Emilia, Modena, Italy

IT-14-O-1831 Exploring the Local Photovoltaic Mechanisms in Organic Bulk Heterojunction Nanostructures by means of Scanning Probe Microscopy (PDF, HTML)
Sebaihi N.1, Moerman D.1, Letertre L.1, Douhéret O.2, Lazzaroni R.1,2, Leclère P.1
1Laboratory for Chemistry of Novel Materials, Center for Innovation and Research in MAterials and Polymers (CIRMAP), Research Insitute for Materials Science and Engineering, University of Mons (UMONS), Mons, Belgium, 2Materia Nova R&D Center, Mons, Belgium.

IT-14-O-2891 Gaseous nanobubbles on immersed surfaces: Properties and imaging by AFM in situ and ex situ (PDF, HTML)
Janda P.1, Tarábková H.1
1J. Heyrovský Institute of Physical Chemistry ASCR v.v.i., Prague, Czech Republic

IT-14-P-1654 Investigating electrical charged samples by scanning probe microscopy: the influence to atomic force microscopy and magnetic force microscopy image artifacts. (PDF, HTML)
Costa C. A.1, Lanzoni E. M.1, Piazzetta M. H.1, Galembeck F.1, Deneke C. F.1
1Laboratório Nacional de Nanotecnologia (LNNano), Centro de Pesquisa em Energia e Materiais (CNPEM), Campinas, São Paulo, Brazil.

IT-14-P-1878 Thermal conductivity reduction measurement on Si and P3HT nanowires : diameter size effect (PDF, HTML)
Grauby S.1, Munoz Rojo M.2, Martin Gonzalez M.2, Dilahire S.1
1Univ. Bordeaux, LOMA, UMR 5798, F-33400 Talence, France, 2Instituto de Microelectrónica de Madrid, IMM-CSIC, 8 PTM 28760 Tres Cantos, Madrid, Spain

IT-14-P-1892 Conduction and Dissipation of Electrostatic Charges: Fundamental Study by Scanning Probe Microscopy (PDF, HTML)
YIN J.1, NYSTEN B.1
1IMCN-Institute of Condensed Matter and Nanosciences (BSMA - Bio and Soft Matter Division), Université Catholique de Louvain, Belgium

IT-14-P-2022 A ferrule-top optomechanical probe to collect topographic and near field information about a sample at the nanometer scale (PDF, HTML)
van Hoorn C. H.1, Chavan D. C.1, Tiribilli B.2, Margheri G.2, Mank A. J.3, Ariese F.1, Iannuzzi D.1
1Faculty of Sciences, LaserlaB, Vrije Universiteit, Amsterdam, The Netherlands, 2Institute of Complex Systems, National Research Council, Sesto Fiorentino, Italy, 3Philips Innovation Services, Eindhoven, The Netherlands

IT-14-P-2058 High-sensitivity high-resolution elemental 3D analysis by in-situ combination of SIMS and SPM (PDF, HTML)
Fleming Y.1, Eswara Moorthy S.1, Wirtz T.1, Gerard M.1, Gysin U.2, Glatzel T.2, Meyer E.2, Maier U.3
1Department “Science and Analysis of Materials” (SAM), Centre de Recherche Public – Gabriel Lippmann, 41 rue du Brill, L-4422 Belvaux, Luxembourg, 2Department of Physics, University of Basel, Klingelbergstr. 82, Basel, Switzerland, 3Ferrovac GmbH, Thurgauerstr. 72, CH-8050 Zürich, Switzerland

IT-14-P-2107 High-Sensitivity Imaging in Liquid by Torsional Resonance Mode Atomic Force Microscopy utilizing Lorentz Force Actuation (PDF, HTML)
Yang C. W.1, Ding R. F.1, 2, Lai S. H.1, Liao H. S.1, Lai W. C.1, Huang K. Y.2, Chang C. S.1, Hwang I. S.1
1Institute of Physics, Academia Sinica, Taipei, 11529, Taiwan, 2Department of Mechanical Engineering, National Taiwan University, Taipei, 10617, Taiwan

IT-14-P-2144 Imaging nanostructures of nitrogen/oxygen molecules at HOPG-water interfaces with different atomic force microscopy modes (PDF, HTML)
Hwang I.1, Yang C.1, Lu Y.1, Fung C.1, Ko H.1
1Institute of Physics, Academia Sinica, Taipei, 11529, Taiwan

IT-14-P-2422 Instrument induced artifacts in scanning probe microscopy. (PDF, HTML)
Lanzoni E. M.1, Costa C. A.1, Barboza V. A.1, Galembeck F.1, Deneke C. F.1
1Laboratório Nacional de Nanotecnologia (LNNano), Centro de Pesquisa em Energia e Materiais (CNPEM), Campinas, São Paulo, Brazil.

IT-14-P-2536 Surface potential investigation of AlGaAs/GaAs heterostructures by Kelvin Force Microscopy (PDF, HTML)
Pouch S.1, Chevalier N.1, Mariolle D.1, Triozon F.1, Niquet Y. M.2, Melin T.3, Borowik Ł.1, Delaye V.1
1CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 GRENOBLE Cedex 9, France, 2CEA, INAC, MINATEC Campus, 17 rue des Martyrs, 38054 GRENOBLE Cedex 9, France., 3Institut d’Electronique de Microélectronique et de Nanotechnologie, CNRS-UMR 8520, Avenue Poincaré, BP 60069,59652 Villeneuve d’Ascq Cedex, France.

IT-14-P-2566 DESIGN, IMPLEMENTATION AND CHARACTERIZATION OF A 3D-PRINTED AFM HEAD WITH PIEZOTUBE AND ELECTROMAGNETIC ACTUATORS FOR BIOMOLECULAR APPLICATIONS (PDF, HTML)