Type of presentation: Poster

ID-1-P-6023 Correlative Automated Particle Analysis – A New Way to Link LM and SEM/EDX in an Automated Workflow.

Hiltl M.1, Berger C.1
1Carl Zeiss Microscopy GmbH, Oberkochen, Germany
michael.hiltl@zeiss.com

Correlative automated particle analysis (CAPA) is a new software tool in the field of automated particle analysis designed to link LM (Light Microscope) and SEM/EDX (Scanning Electron Microscope/Energy dispersive X-ray) in one workflow. It is grown from correlative microscopy with the motivation to fulfill the increasing demand to analyze particles, debris or grains, which has constantly increased in fields like steel inclusion, gunshot residue, implant monitoring, mineralogical grains or environmental/pollution control over the past years. But especially automotive production/research, automotive related industry as well as component supplier have targeted automated particle analysis as an useful tool to control the technical cleanliness and to identify critical particles helping their elimination. Particle residues can cause severe damage with the consequence of additional cost, loss of reputation, wasting resources as well as harming the environment. Consequently, the overall goal is to identify the source of contamination as quick as possible. The LM investigation results in the determination of morphological parameters and in additional information about reflective and non-reflective properties of possible dangerous residues. However, another very important question cannot be answered: What is the chemical composition of the particle and, therefore, what are the mechanical and physical properties. In this context, transferring the sample from the LM to a SEM and relocating the particles of interest manually can be very time consuming and very cost intensive. The new developed correlative automated particle analysis (CAPA) makes it very easy to correlate the particles from LM to SEM leading to a quick and easy analytical characterization of critical particles and it gives the possibility to identify the source of contamination in the production chain and for eliminating quality issues. Both microscopic technologies have strengths and limitations.In conclusion, CAPA combines the strengths of both methods generating automatically a detailed and ISO confirm report.